DPTRP1 Digital Paper Test Report FCC _DXX Sony Corporation
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Test report No. Page Issued date FCC ID 11306371S-E-R1 1 of 34 July 27, 2016 AK8DPTRP1 RADIO TEST REPORT Test Report No.: 11306371S-E-R1 1. 2. 3. 4. 5. 6. 7. 8. Applicant Sony Corporation Type of Equipment Digital Paper Model No. DPT-RP1 FCC ID AK8DPTRP1 Test regulation FCC Part15 Subpart C: 2016 Test result Complied This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. The results in this report apply only to the sample tested. This sample tested is in compliance with the limits of the above regulation. The test results in this test report are traceable to the national or international standards. This test report must not be used by the customer to claim product certification, approval, or endorsement by any agency of the Federal Government. The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan has been accredited. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) This report is a revised version of 11306371S-E. 11306371S-E is replaced with this report. Date of test: June 6 to July 2, 2016 Representative test engineer: Hiroyuki Morikawa Engineer Consumer Technology Division Approved by : Toyokazu Imamura Leader Consumer Technology Division The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan. RTL02610 There is no testing item of "Non-accreditation". UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 13-EM-F0429 Test report No. Page Issued date FCC ID 11306371S-E-R1 2 of 34 July 27, 2016 AK8DPTRP1 REVISION HISTORY Original Test Report No.: 11306371S-E Revision - (Original) Test report No. 11306371S-E 11306371S-E-R1 Date July 25, 2016 July 27, 2016 Page revised UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Contents Update of clock frequency Test report No. Page Issued date FCC ID 11306371S-E-R1 3 of 34 July 27, 2016 AK8DPTRP1 Contents Page SECTION 1: Customer information ........................................................................................ 4 SECTION 2: Equipment under test (E.U.T.) .......................................................................... 4 SECTION 3: Test specification, procedures & results ........................................................... 5 SECTION 4: Operation of E.U.T. during testing.................................................................... 7 SECTION 5: Conducted emission ............................................................................................ 8 SECTION 6: Radiated emission (Fundamental and Spurious emission) ............................. 9 SECTION 7: 20dB bandwidth & Occupied bandwidth (99%) ............................................ 11 SECTION 8: Frequency tolerances ........................................................................................ 11 APPENDIX 1: Data of Radio tests .......................................................................................... 12 APPENDIX 2: Test instruments ............................................................................................. 28 APPENDIX 3: Photographs of test setup ............................................................................... 29 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Test report No. Page Issued date FCC ID 11306371S-E-R1 4 of 34 July 27, 2016 AK8DPTRP1 SECTION 1: Customer information Company Name Brand Name Address Sony Corporation SONY 1-7-1 Konan, Minato-ku, Tokyo 108-0075, Japan SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment Model No. Serial No. Rating Receipt Date of Sample Country of Mass-production Condition of EUT Modification of EUT 2.2 Digital Paper DPT-RP1 Refer to Section 4, Clause 4.2 DC 3.7 V May 30, 2016 Japan Production prototype (Not for Sale: This sample is equivalent to mass-produced items.) No Modification by the test lab. Product description Model: DPT-RP1 (referred to as the EUT in this report) is a Digital Paper . Clock frequency 156 MHz (CPLD), 667 MHz (LPDDR3), 200 MHz (eMMC), 40 MHz (WLAN/BT) 208 MHz (WLAN/BT), 32.768 kHz (clock) , 26 MHz (CPU), 27 MHz (NFC) Radio Specification Equipment name IEEE 802.11 22 MIMO a/b/g/n/ac Wireless LAN + Bluetooth + NFC Bluetooth 2.4GHz band: 2402-2480 MHz (BDR (Basic Data Rate), EDR (Enhanced Data Rate), LE (Low Energy mode) 2.4GHz band: 2412-2462 MHz (b,g,n(HT20)); Frequency W52 (U-NII-1): 5180-5240 MHz (a,n(HT20),ac(VHT20)) / 5190-5230 MHz (n(HT40),ac(VHT40)) / 5210 MHz (ac(VHT80)); of WLAN W53 (U-NII-2A): 5260-5320 MHz (a,n(HT20),ac(VHT20)) / 5270-5310 MHz (n(HT40),ac(VHT40)) / 5290 MHz (ac(VHT80)); operation W56 (U-NII-2C): 5500-5720 MHz (a,n(HT20),ac(VHT20)) / 5510-5710 MHz (n(HT40),ac(VHT40)) / 5530-5690 MHz (ac(VHT80)) W58 (U-NII-3): 5745-5825 MHz (a,n(HT20),ac(VHT20)) / 5755-5795 MHz (n(HT40),ac(VHT40)) / 5775 MHz (ac(VHT80)) NFC 13.56 MHz Operation mode Channel spacing Bandwidth Type of modulation Wi-Fi 5 MHz (2.4 GHz band), 20 MHz (W52, W53, W56, W58) 20 MHz (b,g,a,n(HT20),ac(VHT20)), 40 MHz (n(HT40),ac(VTH40)), 80 MHz (ac(VHT80)) DSSS: DBPSK, DQPSK, CCK OFDM: BPSK, QPSK, 16QAM, 64QAM, 256QAM(*1) (*1. 256QAM is only supported by 11ac mode.) Antenna Antenna type Antenna gain (Peak) Bluetooth 1 MHz (BDR, EDR), 2 MHz (LE) 79 MHz FHSS: GFSK (*. EDR: GFSK+ /4-DQPSK, GFSK+ 8DPSK) ASK antenna #B (Wi-Fi+Bluetooth) Loop 3.75 dBi (2.4 GHz), 2.81 dBi (5 GHz) (*.including cable loss) 1.38 dBi (2.4 GHz), 4.29 dBi (5 GHz) (*.including cable loss) Antenna Antenna type Card type antenna #A (Wi-Fi) NFC NFC antenna Loop type A, type F UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Test report No. Page Issued date FCC ID 11306371S-E-R1 5 of 34 July 27, 2016 AK8DPTRP1 SECTION 3: Test specification, procedures & results 3.1 Test specification Test specification Title FCC Part 15 Subpart C FCC part 15 final revised on April 6, 2016. FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators Section 15.207 Conducted limits Section 15.209 Radiated emission limits, general requirements Section 15.215 Additional provisions to the general radiated emission limitations Section 15.225 Operation within the band 13.110-14.010 MHz The EUT has been tested for compliance with FCC Part 15 Subpart B. Refer to the test report 11306371S-F. 3.2 Procedures & Results Item Test Procedure Conducted emission Electric field strength of Fundamental emission Electric field strength of Spurious emission (within the 13.110-14.010 MHz band) Electric field strength of Spurious emission (outside of the 13.110-14.010 MHz band) 20dB bandwidth Frequency tolerance Specification ANSI C63.4:2009 7. AC powerline FCC 15.207 conducted emission measurements ANSI C63.4:2009 13. Measurement of FCC 15.225 (a) intentional radiators Remarks Deviation Worst Margin 14.5 dB Freq.: 0.61428 MHz Phase: L1 Tag: Type F Results N/A Radiated N/A 59.6 dB Polarization: Vertical Complied ANSI C63.4:2009 FCC 15.225 13. Measurement of (b)(c) intentional radiators Radiated N/A 40.5 dB Freq.: 13.567 MHz Polarization: Vertical Complied ANSI C63.4:2009 FCC 15.209 13. Measurement of FCC 15.225 (d) intentional radiators Radiated N/A 7.4 dB Freq.: 585.00 MHz Complied Polarization: Horizontal Radiated N/A Radiated N/A Complied ANSI C63.4:2009 13. Measurement of FCC 15.215 (c) intentional radiators ANSI C63.4:2009 13. Measurement of FCC 15.225 (e) intentional radiators Complied Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422 FCC Part 15.31 (e) This EUT provides stable voltage (DC 3 V and 1.8 V) constantly to RF transmitter regardless of input voltage. Therefore, this EUT complies with the requirement. FCC Part 15.203 Antenna requirement It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the equipment complies with the requirement. 3.3 Addition to standard Item Test Procedure Specification Remarks ANSI C63.4:2009 Occupied 13. Measurement of Bandwidth Radiated intentional radiators, (99 %) RSS-Gen 6.6 Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422 Worst Margin * Other than above, no addition, exclusion nor deviation has been made from the standard. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Results Test report No. Page Issued date FCC ID 3.4 11306371S-E-R1 6 of 34 July 27, 2016 AK8DPTRP1 Uncertainty The following uncertainties have been calculated to provide a confidence level of 95% using a coverage factor k=2. Item Conducted emission (AC Mains) AMN/LISN Radiated emission (Measurement distance: 3 m) No.1 SAC*1/SR*2 (±) No.2 SAC/SR (±) No.3 SAC/SR (±) 150 kHz-30 MHz 2.1 dB 2.1 dB 2.6 dB 9 kHz-30 MHz 30 MHz-300 MHz 300 MHz-1 GHz 2.7 dB 4.4 dB 5.6 dB 2.7 dB 4.4 dB 5.5 dB 3.1 dB 4.6 dB 5.3 dB Frequency range *1: SAC=Semi-Anechoic Chamber *2: SR= Shielded Room is applied besides radiated emission Conducted emission The data listed in this test report has enough margin, more than site margin. Radiated emission The data listed in this test report has enough margin, more than site margin. Other tests Frequency (Normal condition) Measurement uncertainty for this test was: (±) 7.9 x 10^-8. Frequency (Extreme condition) Measurement uncertainty for this test was: (±) 7.9 x 10^-8. Bandwidth Measurement uncertainty for this test was: (±) 0.66 % Temperature uncertainty for this test was: (±) 0.97 deg.C Voltage uncertainty for this test was: (±) 0.24 % 3.5 Test location UL Japan, Inc. Shonan EMC Lab. 1-22-3, Megumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN Telephone number +81 463 50 6400 Facsimile number +81 463 50 6401 JAB Accreditation No. RTL02610 No.1 Semi-anechoic chamber No.2 Semi-anechoic chamber No.3 Semi-anechoic chamber No.4 Semi-anechoic chamber No.1 shielded room No.2 shielded room No.3 shielded room No.4 shielded room No.5 shielded room No.6 shielded room No.1 Measurement room 3.6 IC Registration No. Width x Depth x Height (m) 2973D-1 2973D-2 2973D-3 20.6 x 11.3 x 7.65 20.6 x 11.3 x 7.65 12.7 x 7.7 x 5.35 8.1 x 5.1 x 3.55 6.8 x 4.1 x 2.7 6.8 x 4.1 x 2.7 6.3 x 4.7 x 2.7 4.4 x 4.7 x 2.7 7.8 x 6.4 x 2.7 7.8 x 6.4 x 2.7 2.55 x 4.1 x 2.5 Test setup, Data of test & Test instruments Refer to APPENDIX 1 to 3. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Size of reference ground plane (m) / horizontal conducting plane 20.6 x 11.3 20.6 x 11.3 12.7 x 7.7 8.1 x 5.1 6.8 x 4.1 6.8 x 4.1 6.3 x 4.7 4.4 x 4.7 7.8 x 6.4 7.8 x 6.4 Maximum measurement distance 10 m 10 m 5m Test report No. Page Issued date FCC ID 11306371S-E-R1 7 of 34 July 27, 2016 AK8DPTRP1 SECTION 4: Operation of E.U.T. during testing 4.1 Operating mode The EUT exercise program used during testing was designed to exercise the various system components in a manner similar to typical use. Test item All items Software: NFCPollingMonitor Ver. 1.2.4.1 Power settings: Fixed Operating mode Transmitting Tested frequency 13.56 MHz The carrier level and noise levels were confirmed with and without Tag, and the test was made with the condition that has the maximum noise. Combinations of the worst case Radiated emission (Carrier) Radiated spurious emission Radiated spurious emission (Below 30 MHz) (Above 30 MHz) With Tag (type F) With Tag (type F) With Tag (type A) Justification: The system was configured in typical fashion (as customer would normally use it) for testing. 4.2 Configuration and peripherals A: EUT AC 120 V/60 Hz * Test data was taken under worse case conditions. Description of EUT and Support equipment No. Item Model number Digital Paper DPT-RP1 AC Adapter AC-UUD12 List of cables used No. Item USB Length (m) 1.5 Serial number 9002003 15091AR1000055 Shield (Cable) Shielded UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Manufacturer Sony Corporation Sony Corporation Shield (Connector) Shielded Remarks EUT Remarks Test report No. Page Issued date FCC ID 11306371S-E-R1 8 of 34 July 27, 2016 AK8DPTRP1 SECTION 5: Conducted emission 5.1 Operating environment Test place Temperature : Humidity 5.2 See test data (APPENDIX 1) See test data (APPENDIX 1) See test data (APPENDIX 1) Test configuration EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity. The rear of tabletop was located 40 cm to the vertical conducting plane. The rear of peripheral was aligned and was flushed with rear of tabletop. All other surfaces of tabletop were at least 80 cm from any other grounded conducting surface. EUT was located 80 cm from LISN. Each EUT current-carrying power lead, except the ground (safety) lead, was individually connected through a LISN to the input power source.. Photographs of the set up are shown in APPENDIX 3. 5.3 Test conditions Frequency range EUT position 5.4 0.15 MHz - 30 MHz Table top Test procedure The AC Mains Terminal Continuous disturbance Voltage had been measured with the EUT within a Shielded room. The EUT was connected to a Line Impedance Stabilization Network (LISN). An overview sweep with peak detection has been performed. The measurements had been performed with a quasi-peak detector and if required, a CISPR average detector. The conducted emission measurements were made with the following detection of the test receiver. Detection Type : Quasi-Peak/ CISPR Average IF Bandwidth 9 kHz 5.5 Results Summary of the test results : Refer to APPENDIX 1 Pass UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Test report No. Page Issued date FCC ID 11306371S-E-R1 9 of 34 July 27, 2016 AK8DPTRP1 SECTION 6: Radiated emission (Fundamental and Spurious emission) 6.1 Operating environment Test place Temperature : Humidity 6.2 See test data (APPENDIX 1) See test data (APPENDIX 1) See test data (APPENDIX 1) Test configuration EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity. Photographs of the set up are shown in Appendix 1. 6.3 Test conditions Frequency range Test distance EUT position 6.4 9 kHz - 1 GHz 3m Table top Test procedure The Radiated Electric Field Strength intensity has been measured on a semi-anechoic chamber with a ground plane at a distance of 3 m. Although these tests were performed other than open area test site, adequate comparison measurements were confirmed against 30 m open are test site. Therefore sufficient tests were made to demonstrate that the alternative site produces results that correlate with the ones of tests made in an open field based on KDB 937606. These tests were performed in semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made without a ground plane. However test results were confirmed to pass against standard limit. The Radiated Electric Field Strength intensity has been measured with a ground plane and at a distance of 3 m Frequency: From 9 kHz to 30 MHz at distance 3 m The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for vertical polarization (antenna angle: 0 deg.to 360 deg.) and horizontal polarization. Drawing of the antenna direction is shown in Figure 1. Frequency: From 30 MHz to 1 GHz at distance 3 m (Refer to Figure 2). The measuring antenna height was varied between 1 and 4 m and EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for both vertical and horizontal antenna polarization. Measurements were performed with QP, PK, and AV detector. The radiated emission measurements were made with the following detector function of the test receiver. 9 kHz to 90 kHz & 90 kHz to 150 kHz 490 kHz to 30 MHz to 1 GHz 110 kHz to 150 kHz 110 kHz to 490 kHz 30 MHz Detector Type PK/AV QP PK/AV QP QP IF Bandwidth 200 Hz 200 Hz 9 kHz 9 kHz 120 kHz Measuring Loop antenna Biconical (30 MHz-299.99 MHz) antenna Logperiodic (300 MHz-1 GHz) * FCC 15.31 (f)(2) (9 kHz-30 MHz) 9 kHz – 490 kHz [Limit at 3 m]= [Limit at 300 m]-40 log (3 [m]/300 [m]) 490 kHz – 30 MHz [Limit at 3 m]= [Limit at 30 m]-40 log (3 [m]/30 [m]) UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Test report No. Page Issued date FCC ID 11306371S-E-R1 10 of 34 July 27, 2016 AK8DPTRP1 The carrier level and noise levels were confirmed at each position of X, Y and Z axes of EUT to see the position of maximum noise, and the test was made at the position that has the maximum noise. Refer to the data. 6.5 Results Summary of the test results : Pass No spurious emissions exceeded the fundamental emission level. Refer to APPENDIX 1. Figure 1. Direction of the Loop Antenna Horizontal (Top View) EUT Antenna was not rotated. Vertical (Side View) (Top View) 135deg EUT EUT 90deg 45deg 0deg Front side: 0 deg. Forward direction: clockwise Figure 2. Antenna angle Radiated Emission (Below 1GHz) No.3 Semi-Anechoic Chamber (Antenna angle) 90 deg. Biconical Antenna Logperiodic Antenna g. de 3m / 3t 45 0 deg. TurnTable 3m UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 Test report No. Page Issued date FCC ID SECTION 7: 20dB bandwidth & Occupied bandwidth (99%) Test procedure The test was measured with a spectrum analyzer using a test fixture. Results Summary of the test results: Refer to APPENDIX 1. Pass SECTION 8: Frequency tolerances Test procedure The test was measured with a spectrum analyzer using a test fixture. The temperature test was started after the temperature stabilization time of 30 minutes. The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C. Results Summary of the test results: Refer to APPENDIX 1. Pass UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile +81 463 50 6401 11306371S-E-R1 11 of 34 July 27, 2016 AK8DPTRP1 APPENDIX 1: Data of Radio tests Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Type-A Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) 50 L1(PK) L1(QP/AV) 40 30 20 10 .15 No. .2 Freq. [MHz] .3 .5 Reading[dBuV] [dBuV] .7 C.Fac [dB] Frequency [MHz] Results [dBuV] [dBuV] Limit [dBuV] [dBuV] 10 Margin [dB] [dB] Phase 0.15000 35.90 17.80 12.51 48.41 30.31 66.00 56.00 17.5 25.6 0.15741 32.70 14.10 12.51 45.21 26.61 65.60 55.60 20.3 28.9 0.22788 30.10 12.80 12.53 42.63 25.33 62.53 52.53 19.9 27.2 0.24228 28.70 12.00 12.53 41.23 24.53 62.02 52.02 20.7 27.4 0.26348 27.80 10.80 12.53 40.33 23.33 61.32 51.32 20.9 27.9 0.54260 25.90 10.60 12.54 38.44 23.14 56.00 46.00 17.5 22.8 0.61501 28.80 17.70 12.56 41.36 30.26 56.00 46.00 14.6 15.7 4.83725 21.00 9.10 13.01 34.01 22.11 56.00 46.00 21.9 23.8 6.97724 25.80 12.40 13.28 39.08 25.68 60.00 50.00 20.9 24.3 10 13.56000 43.40 33.00 14.04 57.44 47.04 60.00 50.00 2.5 2.9 11 0.15000 35.20 17.60 12.51 47.71 30.11 66.00 56.00 18.2 25.8 L1 12 0.15714 33.20 15.60 12.51 45.71 28.11 65.61 55.61 19.9 27.5 L1 13 0.22420 28.80 11.30 12.52 41.32 23.82 62.66 52.66 21.3 28.8 L1 14 0.24780 27.00 10.20 12.53 39.53 22.73 61.83 51.83 22.3 29.1 L1 15 0.26313 26.50 9.90 12.53 39.03 22.43 61.33 51.33 22.3 28.9 L1 16 0.54162 20.30 5.70 12.54 32.84 18.24 56.00 46.00 23.1 27.7 L1 17 0.61380 28.40 11.70 12.56 40.96 24.26 56.00 46.00 15.0 21.7 L1 18 4.88063 21.30 6.50 13.02 34.32 19.52 56.00 46.00 21.6 26.4 L1 19 6.96669 22.80 10.20 13.28 36.08 23.48 60.00 50.00 23.9 26.5 L1 20 13.56000 35.60 30.10 14.04 49.64 44.14 60.00 50.00 10.3 5.8 L1 20 30 Comment Reference Data Reference Data Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN:SLS-02 12 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Type-A(Antenna Terminate) Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) 50 L1(PK) L1(QP/AV) 40 30 20 10 .15 No. .2 Freq. [MHz] .3 .5 Reading [dBuV] [dBuV] .7 C.Fac [dB] Frequency [MHz] Results [dBuV] [dBuV] Limit [dBuV] [dBuV] Margin [dB] [dB] 10 Phase 13.56000 18.00 5.60 14.04 32.04 19.64 60.00 50.00 27.9 30.3 13.56000 14.90 3.90 14.04 28.94 17.94 60.00 50.00 31.0 32.0 L1 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN: SLS-02 20 30 Comment 13 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Type-F Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) 50 40 30 20 10 .15 .2 .3 .5 .7 Frequency [MHz] 10 20 30 RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 L1(PK) L1(QP/AV) 50 40 30 20 10 .15 .2 .3 .5 .7 Frequency [MHz] 10 20 30 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN:SLS-02 14 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Type-F Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa << QP/AV DATA >> No. Freq. [MHz] Reading [dBuV] [dBuV] C.Fac [dB] Results [dBuV] [dBuV] Limit [dBuV] [dBuV] Margin [dB] [dB] Phase 0.15000 37.80 21.30 12.51 50.31 33.81 66.00 56.00 15.6 22.1 0.15795 37.20 10.10 12.51 49.71 22.61 65.57 55.57 15.8 32.9 0.21841 32.50 15.90 12.52 45.02 28.42 62.88 52.88 17.8 24.4 0.23281 32.70 16.20 12.53 45.23 28.73 62.35 52.35 17.1 23.6 0.25321 29.40 12.20 12.53 41.93 24.73 61.65 51.65 19.7 26.9 0.49898 26.70 10.20 12.54 39.24 22.74 56.02 46.02 16.7 23.2 0.58244 26.60 12.50 12.55 39.15 25.05 56.00 46.00 16.8 20.9 4.70220 21.90 9.40 13.00 34.90 22.40 56.00 46.00 21.1 23.6 6.93652 27.60 13.50 13.27 40.87 26.77 60.00 50.00 19.1 23.2 10 13.56000 51.60 41.30 14.04 65.64 55.34 60.00 50.00 -5.7 -5.4 11 26.58915 22.20 7.00 14.55 36.75 21.55 60.00 50.00 23.2 28.4 12 0.15000 31.00 10.30 12.51 43.51 22.81 66.00 56.00 22.4 33.1 L1 13 0.16032 30.10 10.20 12.52 42.62 22.72 65.45 55.45 22.8 32.7 L1 14 0.21326 28.60 10.60 12.52 41.12 23.12 63.08 53.08 21.9 29.9 L1 15 0.23043 28.80 11.40 12.53 41.33 23.93 62.43 52.43 21.1 28.5 L1 16 0.25061 26.10 9.00 12.53 38.63 21.53 61.74 51.74 23.1 30.2 L1 17 0.49967 18.20 2.40 12.54 30.74 14.94 56.01 46.01 25.2 31.0 L1 18 0.61428 28.90 12.80 12.56 41.46 25.36 56.00 46.00 14.5 20.6 L1 19 4.66988 22.00 6.80 12.99 34.99 19.79 56.00 46.00 21.0 26.2 L1 20 6.89403 23.30 9.90 13.27 36.57 23.17 60.00 50.00 23.4 26.8 L1 21 13.56000 44.00 39.20 14.04 58.04 53.24 60.00 50.00 1.9 -3.3 L1 22 26.51504 19.10 4.70 14.54 33.64 19.24 60.00 50.00 26.3 30.7 L1 Comment Reference Data Reference Data Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN:SLS-02 15 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Type-F(Antenna Terminate) Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) 50 L1(PK) L1(QP/AV) 40 30 20 10 .15 No. .2 Freq. [MHz] .3 .5 Reading [dBuV] [dBuV] .7 C.Fac [dB] Frequency [MHz] Results [dBuV] [dBuV] Limit [dBuV] [dBuV] Margin [dB] [dB] 10 Phase 13.56000 18.10 5.80 14.04 32.14 19.84 60.00 50.00 27.8 30.1 13.56000 15.00 4.00 14.04 29.04 18.04 60.00 50.00 30.9 31.9 L1 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN: SLS-02 20 30 Comment 16 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Non Tag Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) 50 40 30 20 10 .15 .2 .3 .5 .7 Frequency [MHz] 10 20 30 RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 L1(PK) L1(QP/AV) 50 40 30 20 10 .15 .2 .3 .5 .7 Frequency [MHz] 10 20 30 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN:SLS-02 17 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Non Tag Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa << QP/AV DATA >> No. Freq. [MHz] Reading [dBuV] [dBuV] C.Fac [dB] Results [dBuV] [dBuV] Limit [dBuV] [dBuV] Margin [dB] [dB] Phase 0.15000 35.80 18.80 12.51 48.31 31.31 66.00 56.00 17.6 24.6 0.16063 31.90 13.10 12.52 44.42 25.62 65.43 55.43 21.0 29.8 0.23597 29.70 12.80 12.53 42.23 25.33 62.24 52.24 20.0 26.9 0.26517 27.60 10.70 12.53 40.13 23.23 61.27 51.27 21.1 28.0 0.31237 23.20 6.60 12.52 35.72 19.12 59.91 49.91 24.1 30.7 0.54540 26.00 9.90 12.54 38.54 22.44 56.00 46.00 17.4 23.5 0.61510 28.60 16.90 12.56 41.16 29.46 56.00 46.00 14.8 16.5 4.66015 19.80 6.90 12.99 32.79 19.89 56.00 46.00 23.2 26.1 7.16237 24.30 10.50 13.31 37.61 23.81 60.00 50.00 22.3 26.1 10 13.56000 54.30 43.90 14.04 68.34 57.94 60.00 50.00 -8.4 -8.0 11 17.07760 27.50 15.10 14.33 41.83 29.43 60.00 50.00 18.1 20.5 12 26.47400 23.10 6.70 14.54 37.64 21.24 60.00 50.00 22.3 28.7 13 0.15000 35.30 17.10 12.51 47.81 29.61 66.00 56.00 18.1 26.3 L1 14 0.15415 34.30 16.00 12.51 46.81 28.51 65.77 55.77 18.9 27.2 L1 15 0.23080 29.00 11.80 12.53 41.53 24.33 62.42 52.42 20.8 28.0 L1 16 0.26762 26.10 9.30 12.53 38.63 21.83 61.19 51.19 22.5 29.3 L1 17 0.31545 20.50 4.70 12.52 33.02 17.22 59.83 49.83 26.8 32.6 L1 18 0.54107 20.20 4.90 12.54 32.74 17.44 56.00 46.00 23.2 28.5 L1 19 0.61436 28.30 11.70 12.56 40.86 24.26 56.00 46.00 15.1 21.7 L1 20 4.67607 17.90 3.60 12.99 30.89 16.59 56.00 46.00 25.1 29.4 L1 21 6.95442 21.30 7.50 13.28 34.58 20.78 60.00 50.00 25.4 29.2 L1 22 13.56000 46.50 41.90 14.04 60.54 55.94 60.00 50.00 -0.6 -6.0 L1 23 17.01277 24.30 16.00 14.32 38.62 30.32 60.00 50.00 21.3 19.6 L1 24 26.17483 16.80 2.90 14.54 31.34 17.44 60.00 50.00 28.6 32.5 L1 Comment Reference Data Reference Data Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN:SLS-02 18 of 34 Test Report No. : 11306371S-E-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2016/06/20 Company Kind of EUT Model No. Serial No. Remarks Sony Corporation Digital Paper DPT-RP1 9002003 Tag : Non Tag(Antenna Terminate) Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Mode Order No. Power Temp./Humi. NFC Communication 11306371S AC 120 V / 60 Hz 25 deg.C / 53 %RH Engineer : Yosuke Ishikawa RFI Voltage [dBuV] 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) 50 L1(PK) L1(QP/AV) 40 30 20 10 .15 No. .2 Freq. [MHz] .3 .5 Reading [dBuV] [dBuV] .7 C.Fac [dB] Frequency [MHz] Results [dBuV] [dBuV] Limit [dBuV] [dBuV] Margin [dB] [dB] 10 Phase 13.56000 17.30 5.10 14.04 31.34 19.14 60.00 50.00 28.6 30.8 13.56000 14.70 3.50 14.04 28.74 17.54 60.00 50.00 31.2 32.4 L1 20 30 Comment Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN:SLS-02 19 of 34 Test Report No. : 11306371S-E-R1 Data of Electric field strength of Fundamental emission and Spurious emission within the band: FCC15.225(a)(b)(c) UL Japan, Inc. Shonan EMC Lab., No.3 Semi Anechoic Chamber Company: Equipment: Model: Sample No.: Power: Mode: Sony Corporation Digital Paper DPT-RP1 9002003 DC 3.7 V Transmitting 13.56MHz Remarks: : NFC type F (Axis:Hor_X / Ver_Z) , Vertical polarization (antenna angle) of the worst case: 0deg Fundamental emission Test Receiver Antenna No. FREQ Reading Factor Hor Ver [MHz] [dBuV] [dBuV] [dB/m] Regulation: Test Distance: Date: Temperature: Humidity: ENGINEER: Loss AMP Distance GAIN factor [dB] [dB] [dB] FCC Part15 Subpart C 15.225 3m June 06, 2016 25 deg.C 53 %RH Yosuke Ishikawa RESULT LIMIT (30m) Hor Ver [dBuV/m] [dBuV/m] [dBuV/m] MARGIN Hor [dB] Ver [dB] 13.560 60.4 71.6 18.4 6.5 32.2 -40.0 13.1 24.3 83.9 70.8 59.6 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Distance factor: 40 x log (3m/30m) = -40 dB Limits (30m) ・13.553MHz to 13.567MHz : 83.9dBuV/m (FCC 15.225(a)) Spurious emission within the band No. FREQ Test Receiver Antenna Reading Factor Hor Ver [MHz] [dBuV] [dBuV] [dB/m] Loss AMP Distance GAIN factor [dB] [dB] [dB] RESULT LIMIT (30m) Hor Ver [dBuV/m] [dBuV/m] [dBuV/m] MARGIN Hor [dB] Ver [dB] 13.110 30.1 30.2 18.4 6.5 32.2 -40.0 -17.3 -17.2 29.5 46.8 46.7 13.410 30.2 31.6 18.4 6.5 32.2 -40.0 -17.2 -15.75 40.5 57.7 56.3 13.553 45.7 56.6 18.4 6.5 32.2 -40.0 -1.6 9.3 50.4 52.0 41.1 13.567 46.3 57.2 18.4 6.5 32.2 -40.0 -1.0 9.9 50.4 51.4 40.5 13.710 30.2 31.8 18.4 6.5 32.2 -40.0 -17.1 -15.53 40.5 57.6 56.0 14.010 30.2 30.2 18.4 6.5 32.2 -40.0 -17.1 -17.13 29.5 46.6 46.6 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Outside filed strength frequencies ・Fc±7kHz:13.553MHz to 13.567MHz ・Fc±150kHz:13.410MHz to 13.710MHz ・Fc±450kHz:13.110MHz to 14.010MHz Fc = 13.56MHz Limits (30m) ・13.410MHz to 13.553MHz and 13.567MHz to 13.710MHz : 50.4dBuV/m (FCC 15.225(b)) ・13.110MHz to 13.410MHz and 13.710MHz to 14.010MHz : 40.5dBuV/m (FCC 15.225(c)) ・Below 13.110MHz and Above 14.010MHz : 29.5dBuV/m (FCC 15.225(d)and FCC 15.209) UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 20 of 34 Test Report No. : 11306371S-E-R1 Radiated Emission UL Japan, Inc. Shonan EMC Lab. No.3 Semi Anechoic Chamber Company: Equipment: Model: Sample No.: Power: Mode: EUT axis: Sony Corporation Regulation: Digital Paper Test Distance: DPT-RP1 Date: 9002003 Temperature: DC 3.7 V Humidity: Transmitting 13.56MHz ENGINEER: Below 30 MHz( Horizontal X-axis, Vertical Z-axis), NFC type F, with Tag Above 30 MHz( Horizontal: Z-axis, Vertical: Z-axis), NFC type A, with Tag FCC Part15 Subpart C 15.225 3m June 06, 2016 25 deg.C 53 %RH Yosuke Ishikawa Remarks: Polarity Frequency Detector Reading Ant.Fac. [MHz] [dBuV] [dB/m] Hori. Hori. Hori. Hori. Hori. Hori. Hori. Vert. Vert. Vert. Vert. Vert. Vert. 27.12 273.003 429.003 506.999 585.000 663.003 834.233 27.12 40.680 194.999 429.004 507.002 585.002 QP QP QP QP QP QP QP QP QP QP QP QP QP 29.7 35.6 42.0 43.3 41.9 38.2 29.9 30.2 37.4 34.8 41.1 43.1 40.8 18.6 18.1 16.4 17.5 18.7 19.8 21.4 18.6 13.6 16.2 16.4 17.5 18.7 Loss [dB] 6.7 8.5 9.3 9.6 9.9 10.2 10.8 6.7 6.8 8.0 9.3 9.6 9.9 Gain [dB] 32.2 32.0 31.9 31.9 31.9 31.9 31.4 32.2 32.2 32.1 31.9 31.9 31.9 Distance Factor Result Limit Margin [dB] [dBuV/m] [dBuV/m] [dB] -40.0 0.0 0.0 0.0 0.0 0.0 0.0 -40.0 0.0 0.0 0.0 0.0 0.0 -17.1 30.2 35.7 38.5 38.6 36.3 30.7 -16.6 25.6 26.9 34.8 38.3 37.5 29.5 46.0 46.0 46.0 46.0 46.0 46.0 29.5 40.0 43.5 46.0 46.0 46.0 46.6 15.8 10.3 7.5 7.4 9.7 15.3 46.1 14.4 16.7 11.2 7.7 8.5 Height [cm] 357 182 148 139 111 100 100 100 124 105 100 Angle [deg.] Remark 134 * Limit: 30m 93 169 179 183 161 194 294 * Limit: 30m 275 310 187 178 167 Result = Reading + Ant Factor + Loss (Cable+ATT+ΔAF(above 30MHz)) - Gain(Amprifier) + Distance factor(below 30MHz) * Other frequency noises omitted in this report were not seen or have enough margin (more than 20dB). * Carrier level (Result at 3m): Hor= 53.1dBuV/m, Ver= 64.3 dBuV/m UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 21 of 34 Test Report No. : 11306371S-E-R1 Radiated Emission (Worst mode plot) UL Japan, Inc. Shonan EMC Lab. No.3 Semi Anechoic Chamber Company: Equipment: Model: Sample No.: Power: Mode: EUT axis: Remarks: Sony Corporation Regulation: Digital Paper Test Distance: DPT-RP1 Date: 9002003 Temperature: DC 3.7 V Humidity: Transmitting 13.56MHz ENGINEER: Below 30 MHz( Horizontal X-axis, Vertical Z-axis), NFC type F, with Tag Above 30 MHz( Horizontal: Z-axis, Vertical: Z-axis), NFC type A, with Tag These plots data contains sufficient number to show the trend of characteristic features for EUT. FCC Part15 Subpart C 15.225 3m June 06, 2016 25 deg.C 53 %RH Yosuke Ishikawa Spurious emission plot 90 80 70 60 Result [dBμV/m] 50 40 30 QP,AV Limit 20 PK Limit 10 Hori./QP,AV Hori./PK -10 Vert./QP,AV -20 Vert./PK -30 -40 -50 -60 0.001 0.01 0.1 10 100 1000 Frequency [MHz] Within band plot 90 80 70 60 Result [dBμV/m] 50 40 30 20 QP Limit 10 Hori./QP Vert./QP -10 -20 -30 -40 -50 -60 13 13.2 13.4 13.6 13.8 14 Frequency [MHz] UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 22 of 34 Test Report No. : 11306371S-E-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company Equipment Model Serial No. Power Mode Sony Corporation Digital Paper DPT-RP1 9002558 DC 3.7V Transmitting 13.56 MHz Regulation Date Temperature Humidity ENGINEER FCC Part15 Subpart C 15.225 (e) June 27, 2016 24 deg.C 40 %RH Makoto Hosaka Temperature Variation: -20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.560069 13.560069 13.560069 13.560068 Frequency Error (MHz) 0.000069 0.000069 0.000069 0.000068 Frequency torerance (%) 0.00051 0.00051 0.00051 0.00050 Limit Frequency Error (MHz) 0.000080 0.000080 0.000081 0.000080 Frequency torerance (%) 0.00059 0.00059 0.00060 0.00059 Limit Frequency Error (MHz) 0.000074 0.000066 0.000066 0.000066 Frequency torerance (%) 0.00055 0.00049 0.00049 0.00049 Limit Frequency Error (MHz) 0.000034 0.000032 0.000032 0.000033 Frequency torerance (%) 0.00025 0.00024 0.00024 0.00024 Limit Frequency Error (MHz) 0.000009 -0.000010 -0.000010 -0.000010 Frequency torerance (%) 0.00007 -0.00007 -0.00007 -0.00007 Limit (%) 0.010 0.010 0.010 0.010 Temperature Variation: -10deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.560080 13.560080 13.560081 13.560080 (%) 0.010 0.010 0.010 0.010 Temperature Variation: 0deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.560074 13.560066 13.560066 13.560066 (%) 0.010 0.010 0.010 0.010 Temperature Variation: 10deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.560034 13.560032 13.560032 13.560033 (%) 0.010 0.010 0.010 0.010 Temperature Variation: 20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.560009 13.559990 13.559990 13.559990 (%) 0.010 0.010 0.010 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 23 of 34 Test Report No. : 11306371S-E-R1 Data of Frequency Tolerance Temperature Variation: 30deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559965 13.559952 13.559952 13.559951 Frequency Error (MHz) -0.000035 -0.000048 -0.000048 -0.000049 Frequency torerance (%) -0.00026 -0.00035 -0.00035 -0.00036 Limit Frequency Error (MHz) -0.000068 -0.000078 -0.000080 -0.000080 Frequency torerance (%) -0.00050 -0.00058 -0.00059 -0.00059 Limit (%) 0.010 0.010 0.010 0.010 Temperature Variation: 40deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559932 13.559922 13.559920 13.559920 (%) 0.010 0.010 0.010 0.010 Temperature Variation: 50deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Test Conditions Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559906 13.559901 13.559901 13.559901 Frequency Error (MHz) -0.000094 -0.000099 -0.000099 -0.000099 Frequency torerance (%) -0.00069 -0.00073 -0.00073 -0.00073 Limit Original Frequency (MHz) Measure Frequency (MHz) Frequency Error (MHz) #VALUE! #VALUE! #VALUE! #VALUE! Frequency torerance (%) #VALUE! #VALUE! #VALUE! #VALUE! Limit Original Frequency (MHz) Measure Frequency (MHz) Frequency Error (MHz) #VALUE! #VALUE! #VALUE! #VALUE! Frequency torerance (%) #VALUE! #VALUE! #VALUE! #VALUE! Limit Original Frequency (MHz) Measure Frequency (MHz) Frequency Error (MHz) #VALUE! #VALUE! #VALUE! #VALUE! Frequency torerance (%) #VALUE! #VALUE! #VALUE! #VALUE! Limit startup after 2minutes after 5minutes after 10minutes Test Conditions startup after 2minutes after 5minutes after 10minutes Test Conditions startup after 2minutes after 5minutes after 10minutes (%) 0.010 0.010 0.010 0.010 (%) 0.010 0.010 0.010 0.010 (%) 0.010 0.010 0.010 0.010 (%) 0.010 0.010 0.010 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 24 of 34 Test Report No. : 11306371S-E-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company Equipment Model Serial No. Power Mode Sony Corporation Digital Paper DPT-RP1 9002558 DC 3.7V Transmitting 13.56 MHz Regulation Date Temperature Humidity ENGINEER FCC Part15 Subpart C 15.225 (e) June 27, 2016 24 deg.C 40 %RH Makoto Hosaka Voltage Variation: DC 3.145 V Temperature Variation: 20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559991 13.559977 13.559975 13.559970 Frequency Error (MHz) -0.000009 -0.000023 -0.000025 -0.000030 Frequency torerance (%) -0.00007 -0.00017 -0.00018 -0.00022 Limit Frequency Error (MHz) -0.000025 -0.000030 -0.000032 -0.000035 Frequency torerance (%) -0.00018 -0.00022 -0.00024 -0.00026 Limit (%) 0.010 0.010 0.010 0.010 Voltage Variation: DC 4.255 V Temperature Variation: 20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559975 13.559970 13.559968 13.559965 (%) 0.010 0.010 0.010 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 25 of 34 Test Report No. : 11306371S-E-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company Equipment Model Serial No. Power Mode Sony Corporation Digital Paper DPT-RP1 9002558 DC 5V Transmitting 13.56 MHz Regulation Date Temperature Humidity ENGINEER FCC Part15 Subpart C 15.225 (e) July 2, 2016 25 deg.C 51 %RH Hiroyuki Morikawa Voltage Variation: DC 4.55 V (Minimum operating voltage) Temperature Variation: 20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559978 13.559965 13.559963 13.559962 Frequency Error (MHz) -0.000022 -0.000035 -0.000037 -0.000038 Frequency torerance (%) -0.00016 -0.00026 -0.00027 -0.00028 Limit Frequency Error (MHz) -0.000017 -0.000033 -0.000034 -0.000033 Frequency torerance (%) -0.00013 -0.00024 -0.00025 -0.00024 Limit Frequency Error (MHz) -0.000023 -0.000039 -0.000040 -0.000040 Frequency torerance (%) -0.00017 -0.00029 -0.00029 -0.00029 Limit (%) 0.010 0.010 0.010 0.010 Voltage Variation: DC 5 V Temperature Variation: 20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559983 13.559967 13.559966 13.559967 (%) 0.010 0.010 0.010 0.010 Voltage Variation: DC 5.75 V Temperature Variation: 20deg.C Test Conditions startup after 2minutes after 5minutes after 10minutes Original Frequency (MHz) 13.56 13.56 13.56 13.56 Measure Frequency (MHz) 13.559977 13.559961 13.559960 13.559960 (%) 0.010 0.010 0.010 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 26 of 34 Test Report No. : 11306371S-E-R1 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: Equipment: Model: Sample No.: Power: Mode: Sony Corporation Regulation: FCC Part15 Subpart C 15.215 Digital Paper DPT-RP1 Date: July 2, 2016 9002003 Temperature: 25 deg.C DC 3.7 V Humidity: 51 %RH Transmitting 13.56MHz ENGINEER: Hiroyuki Morikawa : NFC type F (Axis:Hor_X / Ver_Z) , Vertical polarization (antenna angle) of the worst case: 0deg 20dB Bandwidth: Type A 449.748 kHz Type F 431.965 kHz 99% Occupied Bandwi Type A 634.756 kHz Type F 468.250 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 27 of 34 Test Report No. : 11306371S-E-R1 Test Report No : APPENDIX 23 Test Instruments EMI test equipment Control No. Instrument SCC-C9/C10/S Coaxial Cable&RF RSE-03 Selector Manufacturer Model No Serial No Test Item Suhner/Suhner/TOYO RG223U/141PE/N -/0901-271(RF CE S4906 Selector) Calibration Date * Interval(month) 2016/04/22 * 12 SLS-02 LISN Rohde & Schwarz ENV216 100512 CE 2016/02/08 * 12 SAT3-07 Attenuator JFW 50HF-003N CE 2015/09/18 * 12 SOS-06 Humidity Indicator A&D AD-5681 4062118 CE 2015/12/07 * 12 STM-05 Terminator TME CT-01 BP CE 2015/12/18 * 12 STR-06 Test Receiver Rohde & Schwarz ESCI 101259 CE,RE 2016/03/28 * 12 SJM-15 Measure ASKUL CE,RE TSJ TEPTO-DV(RE,CE, RFI,MF) 3805-50 080997823 CE,RE CE,RE 2015/11/18 * 12 SAEC-03(NSA) RE 2015/07/16 * 12 COTS-SEMI-1 EMI Software STS-03 Digital Hitester Hioki SAEC-03(NSA) Semi-Anechoic Chamber TDK SBA-03 Biconical Antenna Schwarzbeck BBA9106 91032666 RE 2015/10/11 * 12 SLA-03 Logperiodic Antenna Schwarzbeck UHALP9108A UHALP 9108-A RE 0901 2015/10/11 * 12 SAT6-08 Attenuator HIROSE ELECTRIC CO.,LTD. Fujikura/Fujikura/Suhne r/Suhner/Suhner/Suhn er/TOYO SONOMA AT-406(40) RE 2015/08/31 * 12 8D2W/12DSFA/14 -/0901-271(RF RE 1PE/141PE/141PE Selector) /141PE/NS4906 310N 290213 RE 2016/04/22 * 12 SCC-C1/C2/C Coaxial Cable&RF 3/C4/C5/C10/ Selector SRSE-03 SAF-03 Pre Amplifier 2016/02/25 * 12 SOS-05 Humidity Indicator A&D AD-5681 4062518 RE 2015/10/22 * 12 SLP-02 Loop Antenna Rohde & Schwarz HFH2-Z2 100218 RE 2015/11/14 * 12 SAT6-12 Attenuator AT-406(40) RE 2015/08/31 * 12 SCH-01 Temperature and Humidity Chamber Microwave Counter HIROSE ELECTRIC CO.,LTD. Espec PL-1KT 14020837 FT 2016/04/14 * 12 Agilent 53151A US40511493 FT 2016/04/13 * 12 SFC-01 SSCA-01 Search coil LANGER RF-R 400-1 02-0634 FT, BW Pre Check SDPS-04 Power Supply(DC) TEXIO PW8-5ADPS 14086035 FT Pre Check SOS-09 Humidity Indicator A&D AD-5681 4061484 FT, BW 2015/12/07 * 12 KTS-07 Digital Tester SANWA PC500 7019232 FT 2015/11/18 * 12 STIM-02 Timer RS 440 9574 FT SSA-03 Spectrum Analyzer Agilent E4448A MY48250152 BW 2015/09/16 * 12 The expiration date of the calibration is the end of the expired month . As for some calibrations performed after the tested dates , those test equipment have been controlled by means of an unbroken chains of calibrations . All equipment is calibrated with valid calibrations . Each measurement data is traceable to the national or international standards . Test Item: CE: Conducted emission , RE: Radiated emission , FT: Frequency Tolerance BW: 20 dB Bandwidth End of Report UL Japan, Inc. Page : 28 of 34
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