Digital Paper Test Report Sony Corporation

Sony Corporation Digital Paper

See More Details For FCC ID: AK8DPTRP1
Purchase on Amazon: Digital Paper
Download: Digital Paper Test Report  Sony Corporation
Document DescriptionFCC Test Report_DXX
Document TypeTest Report

Document

Trouble Loading? Try Digital Paper Test Report  Sony Corporation Downloading this document. Zoom In and Out With ⌘ / Ctrl key and plus [+] or minus [-]
Test report No. : 11306371S-E-R1
Page : 1 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
RADIO TEST REPORT
Test Report No.: 11306371S-E-R1
Applicant : Sony Corporation
Type of Equipment : Digital Paper
Model No. : DPT-RP1
FCC ID : AK8DPTRP1
Test regulation : FCC Part15 Subpart C: 2016
Test result : Complied
1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.
2. The results in this report apply only to the sample tested.
3. This sample tested is in compliance with the limits of the above regulation.
4. The test results in this test report are traceable to the national or international standards.
5. This test report must not be used by the customer to claim product certification, approval, or endorsement by
any agency of the Federal Government.
6. The opinions and the interpretations to the result of the description in this report are outside scopes where
UL Japan has been accredited.
7. This test report covers Radio technical requirements.
It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable)
8. This report is a revised version of 11306371S-E. 11306371S-E is replaced with this report.
Date of test: June 6 to July 2, 2016
Representative test engineer:
Hiroyuki Morikawa
Engineer
Consumer Technology Division
Approved by :
Toyokazu Imamura
Leader
Consumer Technology Division
RTL02610
The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan.
There is no testing item of "Non-accreditation".
13-EM-F0429
Test report No. : 11306371S-E-R1
Page : 2 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
REVISION HISTORY
Original Test Report No.: 11306371S-E
Revision Test report No. Date Page revised Contents
- (Original) 11306371S-E July 25, 2016 - -
1 11306371S-E-R1 July 27, 2016 4 Update of clock frequency
Test report No. : 11306371S-E-R1
Page : 3 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Contents
Page
SECTION 1: Customer information ........................................................................................ 4
SECTION 2: Equipment under test (E.U.T.) .......................................................................... 4
SECTION 3: Test specification, procedures & results ........................................................... 5
SECTION 4: Operation of E.U.T. during testing .................................................................... 7
SECTION 5: Conducted emission ............................................................................................ 8
SECTION 6: Radiated emission (Fundamental and Spurious emission) ............................. 9
SECTION 7: 20dB bandwidth & Occupied bandwidth (99%) ............................................ 11
SECTION 8: Frequency tolerances ........................................................................................ 11
APPENDIX 1: Data of Radio tests .......................................................................................... 12
APPENDIX 2: Test instruments ............................................................................................. 28
APPENDIX 3: Photographs of test setup ............................................................................... 29
Test report No. : 11306371S-E-R1
Page : 4 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 1: Customer information
Company Name : Sony Corporation
Brand Name : SONY
Address : 1-7-1 Konan, Minato-ku, Tokyo 108-0075, Japan
SECTION 2: Equipment under test (E.U.T.)
2.1 Identification of E.U.T.
Type of Equipment : Digital Paper
Model No. : DPT-RP1
Serial No. : Refer to Section 4, Clause 4.2
Rating : DC 3.7 V
Receipt Date of Sample : May 30, 2016
Country of Mass-production : Japan
Condition of EUT : Production prototype
(Not for Sale: This sample is equivalent to mass-produced items.)
Modification of EUT : No Modification by the test lab.
2.2 Product description
Model: DPT-RP1 (referred to as the EUT in this report) is a Digital Paper .
Clock frequency : 156 MHz (CPLD), 667 MHz (LPDDR3), 200 MHz (eMMC), 40 MHz (WLAN/BT)
208 MHz (WLAN/BT), 32.768 kHz (clock) , 26 MHz (CPU), 27 MHz (NFC)
Radio Specification
Equipment name IEEE 802.11 22 MIMO a/b/g/n/ac Wireless LAN + Bluetooth + NFC
Frequency
of
operation
Bluetooth 2.4GHz band: 2402-2480 MHz (BDR (Basic Data Rate), EDR (Enhanced Data Rate), LE (Low Energy mode)
WLAN
2.4GHz band: 2412-2462 MHz (b,g,n(HT20));
W52 (U-NII-1): 5180-5240 MHz (a,n(HT20),ac(VHT20)) / 5190-5230 MHz (n(HT40),ac(VHT40)) / 5210 MHz (ac(VHT80));
W53 (U-NII-2A): 5260-5320 MHz (a,n(HT20),ac(VHT20)) / 5270-5310 MHz (n(HT40),ac(VHT40)) / 5290 MHz (ac(VHT80));
W56 (U-NII-2C): 5500-5720 MHz (a,n(HT20),ac(VHT20)) / 5510-5710 MHz (n(HT40),ac(VHT40)) / 5530-5690 MHz (ac(VHT80))
W58 (U-NII-3): 5745-5825 MHz (a,n(HT20),ac(VHT20)) / 5755-5795 MHz (n(HT40),ac(VHT40)) / 5775 MHz (ac(VHT80))
NFC 13.56 MHz
Operation mode Wi-Fi Bluetooth NFC
Channel spacing 5 MHz (2.4 GHz band), 20 MHz (W52, W53, W56, W58) 1 MHz (BDR, EDR), 2 MHz (LE) -
Bandwidth 20 MHz (b,g,a,n(HT20),ac(VHT20)),
40 MHz (n(HT40),ac(VTH40)), 80 MHz (ac(VHT80)) 79 MHz -
Type of modulation DSSS: DBPSK, DQPSK, CCK
OFDM: BPSK, QPSK, 16QAM, 64QAM, 256QAM(*1)
(*1. 256QAM is only supported by 11ac mode.)
FHSS: GFSK
(*. EDR: GFSK+ /4-DQPSK, GFSK+ 8DPSK) ASK
Antenna antenna #A (Wi-Fi) antenna #B (Wi-Fi+Bluetooth)
Antenna type Loop
Antenna gain (Peak) 3.75 dBi (2.4 GHz), 2.81 dBi (5 GHz) (*.including cable loss) 1.38 dBi (2.4 GHz), 4.29 dBi (5 GHz) (*.including cable loss)
Antenna NFC antenna
Antenna type Loop
Card type type A, type F
Test report No. : 11306371S-E-R1
Page : 5 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 3: Test specification, procedures & results
3.1 Test specification
Test specification : FCC Part 15 Subpart C
FCC part 15 final revised on April 6, 2016.
Title : FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators
Section 15.207 Conducted limits
Section 15.209 Radiated emission limits, general requirements
Section 15.215 Additional provisions to the general radiated emission limitations
Section 15.225 Operation within the band 13.110-14.010 MHz
The EUT has been tested for compliance with FCC Part 15 Subpart B. Refer to the test report 11306371S-F.
3.2 Procedures & Results
Item Test Procedure Specification Remarks Deviation Worst Margin Results
Conducted
emission
ANSI C63.4:2009
7. AC powerline
conducted emission
measurements
FCC 15.207 - N/A
14.5 dB
Freq.: 0.61428 MHz
Phase: L1
Tag: Type F
Complied
Electric field strength
of Fundamental
emission
ANSI C63.4:2009
13. Measurement of
intentional radiators FCC 15.225 (a) Radiated N/A 59.6 dB
Polarization: Vertical Complied
Electric field strength
of Spurious emission
(within the
13.110-14.010 MHz
band)
ANSI C63.4:2009
13. Measurement of
intentional radiators
FCC 15.225
(b)(c) Radiated N/A 40.5 dB
Freq.: 13.567 MHz
Polarization: Vertical Complied
Electric field strength
of Spurious emission
(outside of the
13.110-14.010 MHz
band)
ANSI C63.4:2009
13. Measurement of
intentional radiators
FCC 15.209
FCC 15.225 (d) Radiated N/A 7.4 dB
Freq.: 585.00 MHz
Polarization: Horizontal Complied
20dB bandwidth ANSI C63.4:2009
13. Measurement of
intentional radiators FCC 15.215 (c) Radiated N/A - -
Frequency tolerance ANSI C63.4:2009
13. Measurement of
intentional radiators FCC 15.225 (e) Radiated N/A - Complied
Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422
FCC Part 15.31 (e)
This EUT provides stable voltage (DC 3 V and 1.8 V) constantly to RF transmitter regardless of input voltage.
Therefore, this EUT complies with the requirement.
FCC Part 15.203 Antenna requirement
It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the
equipment complies with the requirement.
3.3 Addition to standard
Item Test Procedure Specification Remarks Worst Margin Results
Occupied
Bandwidth
(99 %)
ANSI C63.4:2009
13. Measurement of
intentional radiators,
RSS-Gen 6.6
- Radiated - -
Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422
* Other than above, no addition, exclusion nor deviation has been made from the standard.
Test report No. : 11306371S-E-R1
Page : 6 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
3.4 Uncertainty
The following uncertainties have been calculated to provide a confidence level of 95% using a coverage factor k=2.
Item Frequency range No.1 SAC*1/SR*2 (±)No.2 SAC/SR (±) No.3 SAC/SR (±)
Conducted emission
(AC Mains) AMN/LISN 150 kHz-30 MHz 2.1 dB 2.1 dB 2.6 dB
Radiated emission
(Measurement distance: 3 m) 9 kHz-30 MHz 2.7 dB 2.7 dB 3.1 dB
30 MHz-300 MHz 4.4 dB 4.4 dB 4.6 dB
300 MHz-1 GHz 5.6 dB 5.5 dB 5.3 dB
*1: SAC=Semi-Anechoic Chamber
*2: SR= Shielded Room is applied besides radiated emission
Conducted emission
The data listed in this test report has enough margin, more than site margin.
Radiated emission
The data listed in this test report has enough margin, more than site margin.
Other tests
Frequency (Normal condition) Measurement uncertainty for this test was: (±) 7.9 x 10^-8.
Frequency (Extreme condition) Measurement uncertainty for this test was: (±) 7.9 x 10^-8.
Bandwidth Measurement uncertainty for this test was: (±) 0.66 %
Temperature uncertainty for this test was: (±) 0.97 deg.C
Voltage uncertainty for this test was: (±) 0.24 %
3.5 Test location
UL Japan, Inc. Shonan EMC Lab.
1-22-3, Megumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN
Telephone number : +81 463 50 6400
Facsimile number : +81 463 50 6401
JAB Accreditation No. : RTL02610
IC Registration
No. Width x Depth x
Height (m)
Size of reference ground
plane (m) / horizontal
conducting plane
Maximum
measurement
distance
No.1 Semi-anechoic chamber 2973D-1 20.6 x 11.3 x 7.65 20.6 x 11.3 10 m
No.2 Semi-anechoic chamber 2973D-2 20.6 x 11.3 x 7.65 20.6 x 11.3 10 m
No.3 Semi-anechoic chamber 2973D-3 12.7 x 7.7 x 5.35 12.7 x 7.7 5 m
No.4 Semi-anechoic chamber - 8.1 x 5.1 x 3.55 8.1 x 5.1 -
No.1 shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 -
No.2 shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 -
No.3 shielded room - 6.3 x 4.7 x 2.7 6.3 x 4.7 -
No.4 shielded room - 4.4 x 4.7 x 2.7 4.4 x 4.7 -
No.5 shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 -
No.6 shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 -
No.1 Measurement room - 2.55 x 4.1 x 2.5 - -
3.6 Test setup, Data of test & Test instruments
Refer to APPENDIX 1 to 3.
Test report No. : 11306371S-E-R1
Page : 7 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 4: Operation of E.U.T. during testing
4.1 Operating mode
The EUT exercise program used during testing was designed to exercise the various system components in a manner
similar to typical use.
Test item Operating mode Tested frequency
All items Transmitting 13.56 MHz
Software: NFCPollingMonitor Ver. 1.2.4.1
Power settings: Fixed
The carrier level and noise levels were confirmed with and without Tag, and the test was made with the condition that
has the maximum noise.
Combinations of the worst case
Radiated emission (Carrier) Radiated spurious emission
(Below 30 MHz) Radiated spurious emission
(Above 30 MHz)
With Tag (type F) With Tag (type F) With Tag (type A)
Justification: The system was configured in typical fashion (as customer would normally use it) for testing.
4.2 Configuration and peripherals
A: EUT
AC 120 V/60 Hz
B
1
* Test data was taken under worse case conditions.
Description of EUT and Support equipment
No. Item Model number Serial number Manufacturer Remarks
A Digital Paper DPT-RP1 9002003 Sony Corporation EUT
B AC Adapter AC-UUD12 15091AR1000055 Sony Corporation -
List of cables used
No. Item Length (m) Shield (Cable) Shield (Connector) Remarks
1 USB 1.5 Shielded Shielded -
Test report No. : 11306371S-E-R1
Page : 8 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 5: Conducted emission
5.1 Operating environment
Test place : See test data (APPENDIX 1)
Temperature : See test data (APPENDIX 1)
Humidity : See test data (APPENDIX 1)
5.2 Test configuration
EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane.
The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity.
The rear of tabletop was located 40 cm to the vertical conducting plane. The rear of peripheral was aligned and was
flushed with rear of tabletop. All other surfaces of tabletop were at least 80 cm from any other grounded conducting
surface. EUT was located 80 cm from LISN. Each EUT current-carrying power lead, except the ground (safety) lead,
was individually connected through a LISN to the input power source..
Photographs of the set up are shown in APPENDIX 3.
5.3 Test conditions
Frequency range : 0.15 MHz - 30 MHz
EUT position : Table top
5.4 Test procedure
The AC Mains Terminal Continuous disturbance Voltage had been measured with the EUT within a Shielded room.
The EUT was connected to a Line Impedance Stabilization Network (LISN). An overview sweep with peak detection
has been performed.
The measurements had been performed with a quasi-peak detector and if required, a CISPR average detector.
The conducted emission measurements were made with the following detection of the test receiver.
Detection Type : Quasi-Peak/ CISPR Average
IF Bandwidth : 9 kHz
5.5 Results
Summary of the test results : Pass
Refer to APPENDIX 1
Test report No. : 11306371S-E-R1
Page : 9 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 6: Radiated emission (Fundamental and Spurious emission)
6.1 Operating environment
Test place : See test data (APPENDIX 1)
Temperature : See test data (APPENDIX 1)
Humidity : See test data (APPENDIX 1)
6.2 Test configuration
EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane.
The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity.
Photographs of the set up are shown in Appendix 1.
6.3 Test conditions
Frequency range : 9 kHz - 1 GHz
Test distance : 3 m
EUT position : Table top
6.4 Test procedure
The Radiated Electric Field Strength intensity has been measured on a semi-anechoic chamber with a ground plane at a
distance of 3 m.
Although these tests were performed other than open area test site, adequate comparison measurements were confirmed
against 30 m open are test site. Therefore sufficient tests were made to demonstrate that the alternative site produces
results that correlate with the ones of tests made in an open field based on KDB 937606. These tests were performed in
semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made
without a ground plane. However test results were confirmed to pass against standard limit.
The Radiated Electric Field Strength intensity has been measured with a ground plane and at a distance of 3 m
Frequency: From 9 kHz to 30 MHz at distance 3 m
The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity.
The measurements were performed for vertical polarization (antenna angle: 0 deg.to 360 deg.) and horizontal
polarization. Drawing of the antenna direction is shown in Figure 1.
Frequency: From 30 MHz to 1 GHz at distance 3 m (Refer to Figure 2).
The measuring antenna height was varied between 1 and 4 m and EUT was rotated a full revolution in order to
obtain the maximum value of the electric field intensity.
The measurements were performed for both vertical and horizontal antenna polarization.
Measurements were performed with QP, PK, and AV detector.
The radiated emission measurements were made with the following detector function of the test receiver.
9 kHz to 90 kHz &
110 kHz to 150 kHz 90 kHz to
110 kHz 150 kHz
to 490 kHz 490 kHz to
30 MHz 30 MHz to 1 GHz
Detector Type PK/AV QP PK/AV QP QP
IF Bandwidth 200 Hz 200 Hz 9 kHz 9 kHz 120 kHz
Measuring
antenna Loop antenna Biconical (30 MHz-299.99 MHz)
Logperiodic (300 MHz-1 GHz)
* FCC 15.31 (f)(2) (9 kHz-30 MHz)
9 kHz – 490 kHz [Limit at 3 m]= [Limit at 300 m]-40 log (3 [m]/300 [m])
490 kHz – 30 MHz [Limit at 3 m]= [Limit at 30 m]-40 log (3 [m]/30 [m])
Test report No. : 11306371S-E-R1
Page : 10 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
The carrier level and noise levels were confirmed at each position of X, Y and Z axes of EUT to see the position of
maximum noise, and the test was made at the position that has the maximum noise. Refer to the data.
6.5 Results
Summary of the test results : Pass
No spurious emissions exceeded the fundamental emission level.
Refer to APPENDIX 1.
Figure 1. Direction of the Loop Antenna
Vertical (Side View)
Horizontal (Top View)
Antenna was not rotated.
EUT
EUT
0deg
90deg
45deg
135deg
EUT
Front side: 0 deg.
Forward direction: clockwise
(Top View)
Figure 2. Antenna angle
No.3 Semi-Anechoic Chamber
(Antenna angle)
Radiated Emission
(Below 1GHz)
3m / 3t
3m
Biconical Antenna
Logperiodic Antenna
/
0 deg.
90 deg.
45 deg.
TurnTable
Test report No. : 11306371S-E-R1
Page : 11 of 34
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 7: 20dB bandwidth & Occupied bandwidth (99%)
Test procedure
The test was measured with a spectrum analyzer using a test fixture.
Results
Summary of the test results: Pass
Refer to APPENDIX 1.
SECTION 8: Frequency tolerances
Test procedure
The test was measured with a spectrum analyzer using a test fixture.
The temperature test was started after the temperature stabilization time of 30 minutes.
The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C.
Results
Summary of the test results: Pass
Refer to APPENDIX 1.
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Type-A
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
Limit1(QP)
Limit2(AV)
N(PK)
N(QP/AV)
L1(PK)
L1(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
No.
Freq.
ReadingReading
ResultsResults
LimitLimit
MarginMargin
Phase
Comment
No.
Freq.
<QP>
<AV>
<QP>
<AV>
<QP>
<AV>
Phase
Comment
No.
[MHz]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dB]
Phase
Comment
1 0.15000 35.90 17.80 12.51 48.41 30.31 66.00 56.00 17.5 25.6
N
2 0.15741 32.70 14.10 12.51 45.21 26.61 65.60 55.60 20.3 28.9
N
3 0.22788 30.10 12.80 12.53 42.63 25.33 62.53 52.53 19.9 27.2
N
4 0.24228 28.70 12.00 12.53 41.23 24.53 62.02 52.02 20.7 27.4
N
5 0.26348 27.80 10.80 12.53 40.33 23.33 61.32 51.32 20.9 27.9
N
6 0.54260 25.90 10.60 12.54 38.44 23.14 56.00 46.00 17.5 22.8
N
7 0.61501 28.80 17.70 12.56 41.36 30.26 56.00 46.00 14.6 15.7
N
8 4.83725 21.00 9.10 13.01 34.01 22.11 56.00 46.00 21.9 23.8
N
9 6.97724 25.80 12.40 13.28 39.08 25.68 60.00 50.00 20.9 24.3
N
10 13.56000 43.40 33.00 14.04 57.44 47.04 60.00 50.00 2.5 2.9
N
Reference Data
11 0.15000 35.20 17.60 12.51 47.71 30.11 66.00 56.00 18.2 25.8
L1
12 0.15714 33.20 15.60 12.51 45.71 28.11 65.61 55.61 19.9 27.5
L1
13 0.22420 28.80 11.30 12.52 41.32 23.82 62.66 52.66 21.3 28.8
L1
14 0.24780 27.00 10.20 12.53 39.53 22.73 61.83 51.83 22.3 29.1
L1
15 0.26313 26.50 9.90 12.53 39.03 22.43 61.33 51.33 22.3 28.9
L1
16 0.54162 20.30 5.70 12.54 32.84 18.24 56.00 46.00 23.1 27.7
L1
17 0.61380 28.40 11.70 12.56 40.96 24.26 56.00 46.00 15.0 21.7
L1
18 4.88063 21.30 6.50 13.02 34.32 19.52 56.00 46.00 21.6 26.4
L1
19 6.96669 22.80 10.20 13.28 36.08 23.48 60.00 50.00 23.9 26.5
L1
20 13.56000 35.60 30.10 14.04 49.64 44.14 60.00 50.00 10.3 5.8
L1
Reference Data
Test Report No. 11306371S-E-R1
12 of 34
APPENDIX 1: Data of Radio tests
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Type-A(Antenna Terminate)
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN: SLS-02
Limit1(QP)
Limit2(AV)
N(PK)
N(QP/AV)
L1(PK)
L1(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
No.
Freq.
ReadingReading
C.Fac
ResultsResults
LimitLimit
MarginMargin
Phase
Comment
No.
Freq.
<QP>
<AV>
C.Fac
<QP>
<AV>
<QP>
<AV>
<QP>
<AV>
Phase
Comment
No.
[MHz]
[dBuV]
[dBuV]
[dB]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dB]
[dB]
Phase
Comment
1 13.56000 18.00 5.60 14.04 32.04 19.64 60.00 50.00 27.9 30.3
N
2 13.56000 14.90 3.90 14.04 28.94 17.94 60.00 50.00 31.0 32.0
L1
Test Report No. 11306371S-E-R1
13 of 34
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Type-F
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
Limit1(QP)
Limit2(AV)
N(PK)
N(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
Limit1(QP)
Limit2(AV)
L1(PK)
L1(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
Test Report No. 11306371S-E-R1
14 of 34
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Type-F
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
<< QP/AV DATA >>
No.
Freq.
ReadingReading
ResultsResults
LimitLimit
MarginMargin
Phase
Comment
No.
Freq.
<QP>
<AV>
<QP>
<AV>
<QP>
<AV>
Phase
Comment
No.
[MHz]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dB]
Phase
Comment
1 0.15000 37.80 21.30 12.51 50.31 33.81 66.00 56.00 15.6 22.1
N
2 0.15795 37.20 10.10 12.51 49.71 22.61 65.57 55.57 15.8 32.9
N
3 0.21841 32.50 15.90 12.52 45.02 28.42 62.88 52.88 17.8 24.4
N
4 0.23281 32.70 16.20 12.53 45.23 28.73 62.35 52.35 17.1 23.6
N
5 0.25321 29.40 12.20 12.53 41.93 24.73 61.65 51.65 19.7 26.9
N
6 0.49898 26.70 10.20 12.54 39.24 22.74 56.02 46.02 16.7 23.2
N
7 0.58244 26.60 12.50 12.55 39.15 25.05 56.00 46.00 16.8 20.9
N
8 4.70220 21.90 9.40 13.00 34.90 22.40 56.00 46.00 21.1 23.6
N
9 6.93652 27.60 13.50 13.27 40.87 26.77 60.00 50.00 19.1 23.2
N
10 13.56000 51.60 41.30 14.04 65.64 55.34 60.00 50.00 -5.7 -5.4
N
Reference Data
11 26.58915 22.20 7.00 14.55 36.75 21.55 60.00 50.00 23.2 28.4
N
12 0.15000 31.00 10.30 12.51 43.51 22.81 66.00 56.00 22.4 33.1
L1
13 0.16032 30.10 10.20 12.52 42.62 22.72 65.45 55.45 22.8 32.7
L1
14 0.21326 28.60 10.60 12.52 41.12 23.12 63.08 53.08 21.9 29.9
L1
15 0.23043 28.80 11.40 12.53 41.33 23.93 62.43 52.43 21.1 28.5
L1
16 0.25061 26.10 9.00 12.53 38.63 21.53 61.74 51.74 23.1 30.2
L1
17 0.49967 18.20 2.40 12.54 30.74 14.94 56.01 46.01 25.2 31.0
L1
18 0.61428 28.90 12.80 12.56 41.46 25.36 56.00 46.00 14.5 20.6
L1
19 4.66988 22.00 6.80 12.99 34.99 19.79 56.00 46.00 21.0 26.2
L1
20 6.89403 23.30 9.90 13.27 36.57 23.17 60.00 50.00 23.4 26.8
L1
21 13.56000 44.00 39.20 14.04 58.04 53.24 60.00 50.00 1.9 -3.3
L1
Reference Data
22 26.51504 19.10 4.70 14.54 33.64 19.24 60.00 50.00 26.3 30.7
L1
Test Report No. 11306371S-E-R1
15 of 34
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Type-F(Antenna Terminate)
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN: SLS-02
Limit1(QP)
Limit2(AV)
N(PK)
N(QP/AV)
L1(PK)
L1(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
No.
Freq.
ReadingReading
C.Fac
ResultsResults
LimitLimit
MarginMargin
Phase
Comment
No.
Freq.
<QP>
<AV>
C.Fac
<QP>
<AV>
<QP>
<AV>
<QP>
<AV>
Phase
Comment
No.
[MHz]
[dBuV]
[dBuV]
[dB]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dB]
[dB]
Phase
Comment
1 13.56000 18.10 5.80 14.04 32.14 19.84 60.00 50.00 27.8 30.1
N
2 13.56000 15.00 4.00 14.04 29.04 18.04 60.00 50.00 30.9 31.9
L1
Test Report No. 11306371S-E-R1
16 of 34
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Non Tag
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
Limit1(QP)
Limit2(AV)
N(PK)
N(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
Limit1(QP)
Limit2(AV)
L1(PK)
L1(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
Test Report No. 11306371S-E-R1
17 of 34
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Non Tag
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
<< QP/AV DATA >>
No.
Freq.
ReadingReading
ResultsResults
LimitLimit
MarginMargin
Phase
Comment
No.
Freq.
<QP>
<AV>
<QP>
<AV>
<QP>
<AV>
Phase
Comment
No.
[MHz]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dB]
Phase
Comment
1 0.15000 35.80 18.80 12.51 48.31 31.31 66.00 56.00 17.6 24.6
N
2 0.16063 31.90 13.10 12.52 44.42 25.62 65.43 55.43 21.0 29.8
N
3 0.23597 29.70 12.80 12.53 42.23 25.33 62.24 52.24 20.0 26.9
N
4 0.26517 27.60 10.70 12.53 40.13 23.23 61.27 51.27 21.1 28.0
N
5 0.31237 23.20 6.60 12.52 35.72 19.12 59.91 49.91 24.1 30.7
N
6 0.54540 26.00 9.90 12.54 38.54 22.44 56.00 46.00 17.4 23.5
N
7 0.61510 28.60 16.90 12.56 41.16 29.46 56.00 46.00 14.8 16.5
N
8 4.66015 19.80 6.90 12.99 32.79 19.89 56.00 46.00 23.2 26.1
N
9 7.16237 24.30 10.50 13.31 37.61 23.81 60.00 50.00 22.3 26.1
N
10 13.56000 54.30 43.90 14.04 68.34 57.94 60.00 50.00 -8.4 -8.0
N
Reference Data
11 17.07760 27.50 15.10 14.33 41.83 29.43 60.00 50.00 18.1 20.5
N
12 26.47400 23.10 6.70 14.54 37.64 21.24 60.00 50.00 22.3 28.7
N
13 0.15000 35.30 17.10 12.51 47.81 29.61 66.00 56.00 18.1 26.3
L1
14 0.15415 34.30 16.00 12.51 46.81 28.51 65.77 55.77 18.9 27.2
L1
15 0.23080 29.00 11.80 12.53 41.53 24.33 62.42 52.42 20.8 28.0
L1
16 0.26762 26.10 9.30 12.53 38.63 21.83 61.19 51.19 22.5 29.3
L1
17 0.31545 20.50 4.70 12.52 33.02 17.22 59.83 49.83 26.8 32.6
L1
18 0.54107 20.20 4.90 12.54 32.74 17.44 56.00 46.00 23.2 28.5
L1
19 0.61436 28.30 11.70 12.56 40.86 24.26 56.00 46.00 15.1 21.7
L1
20 4.67607 17.90 3.60 12.99 30.89 16.59 56.00 46.00 25.1 29.4
L1
21 6.95442 21.30 7.50 13.28 34.58 20.78 60.00 50.00 25.4 29.2
L1
22 13.56000 46.50 41.90 14.04 60.54 55.94 60.00 50.00 -0.6 -6.0
L1
Reference Data
23 17.01277 24.30 16.00 14.32 38.62 30.32 60.00 50.00 21.3 19.6
L1
24 26.17483 16.80 2.90 14.54 31.34 17.44 60.00 50.00 28.6 32.5
L1
Test Report No. 11306371S-E-R1
18 of 34
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company : Sony Corporation Mode : NFC Communication
Kind of EUT : Digital Paper Order No. : 11306371S
Model No. : DPT-RP1 Power : AC 120 V / 60 Hz
Serial No. : 9002003 Temp./Humi. : 25 deg.C / 53 %RH
Remarks : Tag : Non Tag(Antenna Terminate)
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV Engineer :: Yosuke Ishikawa
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
Limit1(QP)
Limit2(AV)
N(PK)
N(QP/AV)
L1(PK)
L1(QP/AV)
Frequency [MHz]
RFI Voltage [dBuV]
.15 30
.2 .3 .5 .7 1 2 3 5 7 10 20
0
10
20
30
40
50
60
70
80
No.
Freq.
ReadingReading
ResultsResults
LimitLimit
MarginMargin
Phase
Comment
No.
Freq.
<QP>
<AV>
<QP>
<AV>
<QP>
<AV>
Phase
Comment
No.
[MHz]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dBuV]
[dB]
Phase
Comment
1 13.56000 17.30 5.10 14.04 31.34 19.14 60.00 50.00 28.6 30.8
N
2 13.56000 14.70 3.50 14.04 28.74 17.54 60.00 50.00 31.2 32.4
L1
Test Report No. 11306371S-E-R1
19 of 34
UL Japan, Inc.
Shonan EMC Lab., No.3 Semi Anechoic Chamber
Company: Sony Corporation Regulation: FCC Part15 Subpart C 15.225
Equipment: Digital Paper Test Distance: 3m
Model: DPT-RP1 Date: June 06, 2016
Sample No.: 9002003 Temperature: 25 deg.C
Power: DC 3.7 V Humidity: 53 %RH
Mode: Transmitting 13.56MHz ENGINEER: Yosuke Ishikawa
Remarks: : NFC type F (Axis:Hor_X / Ver_Z) , Vertical polarization (antenna angle) of the worst case: 0deg
Fundamental emission
No. FREQ Antenna Loss AMP Distance LIMIT
Factor GAIN factor (30m)
Hor Ver Hor Ver Hor Ver
[MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB]
1 13.560 60.4 71.6 18.4 6.5 32.2 -40.0 13.1 24.3 83.9 70.8 59.6
Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB]
Distance factor: 40 x log (3m/30m) = -40 dB
Limits (30m)
13.553MHz to 13.567MHz : 83.9dBuV/m (FCC 15.225(a))
Spurious emission within the band
No. FREQ Antenna Loss AMP Distance LIMIT
Factor GAIN factor (30m)
Hor Ver Hor Ver Hor Ver
[MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB]
1 13.110 30.1 30.2 18.4 6.5 32.2 -40.0 -17.3 -17.2 29.5 46.8 46.7
2 13.410 30.2 31.6 18.4 6.5 32.2 -40.0 -17.2 -15.75 40.5 57.7 56.3
3 13.553 45.7 56.6 18.4 6.5 32.2 -40.0 -1.6 9.3 50.4 52.0 41.1
413.567 46.3 57.2 18.4 6.5 32.2 -40.0 -1.0 9.9 50.4 51.4 40.5
5 13.710 30.2 31.8 18.4 6.5 32.2 -40.0 -17.1 -15.53 40.5 57.6 56.0
6 14.010 30.2 30.2 18.4 6.5 32.2 -40.0 -17.1 -17.13 29.5 46.6 46.6
Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB]
Outside filed strength frequencies
Fc±7kHz:13.553MHz to 13.567MHz
Fc±150kHz:13.410MHz to 13.710MHz
Fc±450kHz:13.110MHz to 14.010MHz
Fc = 13.56MHz
Limits (30m)
13.410MHz to 13.553MHz and 13.567MHz to 13.710MHz : 50.4dBuV/m (FCC 15.225(b))
13.110MHz to 13.410MHz and 13.710MHz to 14.010MHz : 40.5dBuV/m (FCC 15.225(c))
Below 13.110MHz and Above 14.010MHz : 29.5dBuV/m (FCC 15.225(d)and FCC 15.209)
Data of Electric field strength of Fundamental emission
and Spurious emission within the band: FCC15.225(a)(b)(c)
Reading
Test Receiver RESULT MARGIN
Test Receiver RESULT MARGIN
Reading
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone :+81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
20 of 34
UL Japan, Inc.
Shonan EMC Lab. No.3 Semi Anechoic Chamber
Company
:
Sony Corporation Regulation
:
FCC Part15 Subpart C 15.22
5
Equipment
:
Digital Paper Test Distance: 3
m
Model: DPT-RP1 Date: June 06, 2016
Sample No.
:
9002003 Temperature
:
25 deg.C
Power: DC 3.7 V Humidity
:
53 %RH
Mode: Transmitting 13.56MHz ENGINEER: Yosuke Ishikawa
EUT axis
:
Below 30 MHz( Horizontal X-axis, Vertical Z-axis), NFC type F, with Tag
Above 30 MHz( Horizontal: Z-axis, Vertical: Z-axis), NFC type A, with Tag
Remarks:
Polarity Frequency Detector Reading Ant.Fac. Loss Gain Distance Factor Result Limit Margin Height Angle Remark
[MHz] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dB] [cm] [deg.]
Hori. 27.12 QP 29.7 18.6 6.7 32.2 -40.0 -17.1 29.5 46.6 - 134 * Limit: 30
m
Hori. 273.003 QP 35.6 18.1 8.5 32.0 0.0 30.2 46.0 15.8 357 93
Hori. 429.003 QP 42.0 16.4 9.3 31.9 0.0 35.7 46.0 10.3 182 169
Hori. 506.999 QP 43.3 17.5 9.6 31.9 0.0 38.5 46.0 7.5 148 179
Hori. 585.000 QP 41.9 18.7 9.9 31.9 0.0 38.6 46.0 7.4 139 183
Hori. 663.003 QP 38.2 19.8 10.2 31.9 0.0 36.3 46.0 9.7 111 161
Hori. 834.233 QP 29.9 21.4 10.8 31.4 0.0 30.7 46.0 15.3 100 194
Vert. 27.12 QP 30.2 18.6 6.7 32.2 -40.0 -16.6 29.5 46.1 - 294 * Limit: 30
m
Vert. 40.680 QP 37.4 13.6 6.8 32.2 0.0 25.6 40.0 14.4 100 275
Vert. 194.999 QP 34.8 16.2 8.0 32.1 0.0 26.9 43.5 16.7 100 310
Vert. 429.004 QP 41.1 16.4 9.3 31.9 0.0 34.8 46.0 11.2 124 187
Vert. 507.002 QP 43.1 17.5 9.6 31.9 0.0 38.3 46.0 7.7 105 178
Vert. 585.002 QP 40.8 18.7 9.9 31.9 0.0 37.5 46.0 8.5 100 167
Result = Reading + Ant Factor + Loss (Cable+ATT+ΔAF(above 30MHz)) - Gain(Amprifier) + Distance factor(below 30MHz)
* Other frequency noises omitted in this report were not seen or have enough margin (more than 20dB).
* Carrier level (Result at 3m): Hor= 53.1dBuV/m, Ver= 64.3 dBuV/m
Radiated Emission
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone :+81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
21 of 34
UL Japan, Inc.
Shonan EMC Lab. No.3 Semi Anechoic Chamber
Company
:
Sony Corporatio
n
Regulation
:
FCC Part15 Subpart C 15.22
5
Equipment
:
Digital Pape
r
Test Distance
:
3
m
Model: DPT-RP1 Date: June 06, 201
6
Sample No.
:
9002003 Temperature
:
25 deg.C
Power: DC 3.7 V Humidity
:
53 %RH
Mode: Transmitting 13.56MHz ENGINEER: Yosuke Ishikaw
a
EUT axis
:
Below 30 MHz( Horizontal X-axis, Vertical Z-axis), NFC type F, with Tag
Above 30 MHz( Horizontal: Z-axis, Vertical: Z-axis), NFC type A, with Tag
Remarks: These plots data contains sufficient number to show the trend of characteristic features for EUT.
Radiated Emission (Worst mode plot)
Spurious emission plot
Within band plot
-60
-50
-40
-30
-20
-10
0
10
20
30
40
50
60
70
80
90
0.001 0.01 0.1 1 10 100 1000
Result [dBμV/m]
Frequency [MHz]
QP,AV Limit
PK Limit
Hori./QP,AV
Hori./PK
Vert./QP,AV
Vert./PK
-60
-50
-40
-30
-20
-10
0
10
20
30
40
50
60
70
80
90
13 13.2 13.4 13.6 13.8 14
Result [dBμV/m]
Frequency [MHz]
QP Limit
Hori./QP
Vert./QP
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone :+81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
22 of 34
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded room
Company Sony Corporation
Equipment Digital Paper Regulation FCC Part15 Subpart C 15.225 (e)
Model DPT-RP1 Date June 27, 2016
Serial No. 9002558 Temperature 24 deg.C
Power DC 3.7V Humidity 40 %RH
Mode Transmitting 13.56 MHz ENGINEER Makoto Hosaka
Tem
p
erature Variation: -20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.560069 0.000069 0.00051 0.010
after 2minutes 13.56 13.560069 0.000069 0.00051 0.010
after 5minutes 13.56 13.560069 0.000069 0.00051 0.010
after 10minutes 13.56 13.560068 0.000068 0.00050 0.010
Tem
p
erature Variation: -10de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.560080 0.000080 0.00059 0.010
after 2minutes 13.56 13.560080 0.000080 0.00059 0.010
after 5minutes 13.56 13.560081 0.000081 0.00060 0.010
after 10minutes 13.56 13.560080 0.000080 0.00059 0.010
Tem
p
erature Variation: 0de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.560074 0.000074 0.00055 0.010
after 2minutes 13.56 13.560066 0.000066 0.00049 0.010
after 5minutes 13.56 13.560066 0.000066 0.00049 0.010
after 10minutes 13.56 13.560066 0.000066 0.00049 0.010
Tem
p
erature Variation: 10de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.560034 0.000034 0.00025 0.010
after 2minutes 13.56 13.560032 0.000032 0.00024 0.010
after 5minutes 13.56 13.560032 0.000032 0.00024 0.010
after 10minutes 13.56 13.560033 0.000033 0.00024 0.010
Tem
p
erature Variation: 20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.560009 0.000009 0.00007 0.010
after 2minutes 13.56 13.559990 -0.000010 -0.00007 0.010
after 5minutes 13.56 13.559990 -0.000010 -0.00007 0.010
after 10minutes 13.56 13.559990 -0.000010 -0.00007 0.010
Data of Frequency Tolerance
Test Conditions
Test Conditions
Test Conditions
Test Conditions
Test Conditions
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
23 of 34
Tem
p
erature Variation: 30de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559965 -0.000035 -0.00026 0.010
after 2minutes 13.56 13.559952 -0.000048 -0.00035 0.010
after 5minutes 13.56 13.559952 -0.000048 -0.00035 0.010
after 10minutes 13.56 13.559951 -0.000049 -0.00036 0.010
Tem
p
erature Variation: 40de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559932 -0.000068 -0.00050 0.010
after 2minutes 13.56 13.559922 -0.000078 -0.00058 0.010
after 5minutes 13.56 13.559920 -0.000080 -0.00059 0.010
after 10minutes 13.56 13.559920 -0.000080 -0.00059 0.010
Tem
p
erature Variation: 50de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559906 -0.000094 -0.00069 0.010
after 2minutes 13.56 13.559901 -0.000099 -0.00073 0.010
after 5minutes 13.56 13.559901 -0.000099 -0.00073 0.010
after 10minutes 13.56 13.559901 -0.000099 -0.00073 0.010
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup #VALUE! #VALUE! 0.010
after 2minutes #VALUE! #VALUE! 0.010
after 5minutes #VALUE! #VALUE! 0.010
after 10minutes #VALUE! #VALUE! 0.010
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup #VALUE! #VALUE! 0.010
after 2minutes #VALUE! #VALUE! 0.010
after 5minutes #VALUE! #VALUE! 0.010
after 10minutes #VALUE! #VALUE! 0.010
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup #VALUE! #VALUE! 0.010
after 2minutes #VALUE! #VALUE! 0.010
after 5minutes #VALUE! #VALUE! 0.010
after 10minutes #VALUE! #VALUE! 0.010
Test Conditions
Data of Frequency Tolerance
Test Conditions
Test Conditions
Test Conditions
Test Conditions
Test Conditions
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
24 of 34
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded room
Company Sony Corporation
Equipment Digital Paper Regulation FCC Part15 Subpart C 15.225 (e)
Model DPT-RP1 Date June 27, 2016
Serial No. 9002558 Temperature 24 deg.C
Power DC 3.7V Humidity 40 %RH
Mode Transmitting 13.56 MHz ENGINEER Makoto Hosaka
Volta
g
e Variation: DC 3.145 V
Tem
p
erature Variation: 20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559991 -0.000009 -0.00007 0.010
after 2minutes 13.56 13.559977 -0.000023 -0.00017 0.010
after 5minutes 13.56 13.559975 -0.000025 -0.00018 0.010
after 10minutes 13.56 13.559970 -0.000030 -0.00022 0.010
Volta
g
e Variation: DC 4.255 V
Tem
p
erature Variation: 20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559975 -0.000025 -0.00018 0.010
after 2minutes 13.56 13.559970 -0.000030 -0.00022 0.010
after 5minutes 13.56 13.559968 -0.000032 -0.00024 0.010
after 10minutes 13.56 13.559965 -0.000035 -0.00026 0.010
Data of Frequency Tolerance
Test Conditions
Test Conditions
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
25 of 34
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded room
Company Sony Corporation
Equipment Digital Paper Regulation FCC Part15 Subpart C 15.225 (e)
Model DPT-RP1 Date July 2, 2016
Serial No. 9002558 Temperature 25 deg.C
Power DC 5V Humidity 51 %RH
Mode Transmitting 13.56 MHz ENGINEER Hiroyuki Morikawa
Volta
g
e Variation: DC 4.55
V
(Minimum o
p
eratin
g
volta
g
e)
Tem
p
erature Variation: 20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559978 -0.000022 -0.00016 0.010
after 2minutes 13.56 13.559965 -0.000035 -0.00026 0.010
after 5minutes 13.56 13.559963 -0.000037 -0.00027 0.010
after 10minutes 13.56 13.559962 -0.000038 -0.00028 0.010
Volta
g
e Variation: DC 5 V
Tem
p
erature Variation: 20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559983 -0.000017 -0.00013 0.010
after 2minutes 13.56 13.559967 -0.000033 -0.00024 0.010
after 5minutes 13.56 13.559966 -0.000034 -0.00025 0.010
after 10minutes 13.56 13.559967 -0.000033 -0.00024 0.010
Volta
g
e Variation: DC 5.75 V
Tem
p
erature Variation: 20de
g
.C
Original Measure Frequency Frequency Limit
Frequency Frequency Error torerance
(MHz) (MHz) (MHz) (%) (%)
startup 13.56 13.559977 -0.000023 -0.00017 0.010
after 2minutes 13.56 13.559961 -0.000039 -0.00029 0.010
after 5minutes 13.56 13.559960 -0.000040 -0.00029 0.010
after 10minutes 13.56 13.559960 -0.000040 -0.00029 0.010
Data of Frequency Tolerance
Test Conditions
Test Conditions
Test Conditions
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
26 of 34
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded Room
Company: Sony Corporation Regulation: FCC Part15 Subpart C 15.215
Equipment: Digital Paper
Model: DPT-RP1 Date: July 2, 2016
Sample No.: 9002003 Temperature: 25 deg.C
Power: DC 3.7 V Humidity: 51 %RH
Mode: Transmitting 13.56MHz ENGINEER: Hiroyuki Morikawa
: NFC type F (Axis:Hor_X / Ver_Z) , Vertical polarization (antenna angle) of the worst case: 0deg
20dB Bandwidth: Type A 449.748 kHz Type F 431.965 kHz
99% Occu
p
ied Bandw
i
Type A 634.756 kHz Type F 468.250 kHz
20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone :+81 463 50 6400
Facsimile : +81 463 50 6401
Test Report No. 11306371S-E-R1
27 of 34
UL Japan, Inc. Page :
Test Report No
APPENDIX 3
Test Instruments
EMI test equipment
Control No. Instrument Manufacturer Model No Serial No Test Item Calibration Date
* Interval(month)
SCC-C9/C10/S
RSE-03
Coaxial Cable&RF
Selector
Suhner/Suhner/TOYO RG223U/141PE/N
S4906
-/0901-271(RF
Selector)
CE 2016/04/22 * 12
SLS-02 LISN Rohde & Schwarz ENV216 100512 CE 2016/02/08 * 12
SAT3-07 Attenuator JFW 50HF-003N - CE 2015/09/18 * 12
SOS-06 Humidity Indicator A&D AD-5681 4062118 CE 2015/12/07 * 12
STM-05 Terminator TME CT-01 BP - CE 2015/12/18 * 12
STR-06 Test Receiver Rohde & Schwarz ESCI 101259 CE,RE 2016/03/28 * 12
SJM-15 Measure ASKUL - - CE,RE -
COTS-SEMI-1 EMI Software TSJ TEPTO-DV(RE,CE,
RFI,MF)
-CE,RE -
STS-03 Digital Hitester Hioki 3805-50 080997823 CE,RE 2015/11/18 * 12
SAEC-03(NSA) Semi-Anechoic Chamber TDK SAEC-03(NSA) 3 RE 2015/07/16 * 12
SBA-03 Biconical Antenna Schwarzbeck BBA9106 91032666 RE 2015/10/11 * 12
SLA-03 Logperiodic Antenna Schwarzbeck UHALP9108A UHALP 9108-A
0901
RE 2015/10/11 * 12
SAT6-08 Attenuator HIROSE ELECTRIC
CO.,LTD.
AT-406(40) - RE 2015/08/31 * 12
SCC-C1/C2/C
3/C4/C5/C10/
SRSE-03
Coaxial Cable&RF
Selector
Fujikura/Fujikura/Suhne
r/Suhner/Suhner/Suhn
er/TOYO
8D2W/12DSFA/14
1PE/141PE/141PE
/141PE/NS4906
-/0901-271(RF
Selector)
RE 2016/04/22 * 12
SAF-03 Pre Amplifier SONOMA 310N 290213 RE 2016/02/25 * 12
SOS-05 Humidity Indicator A&D AD-5681 4062518 RE 2015/10/22 * 12
SLP-02 Loop Antenna Rohde & Schwarz HFH2-Z2 100218 RE 2015/11/14 * 12
SAT6-12 Attenuator HIROSE ELECTRIC
CO.,LTD.
AT-406(40) - RE 2015/08/31 * 12
SCH-01 Temperature and
Humidity Chamber
Espec PL-1KT 14020837 FT 2016/04/14 * 12
SFC-01 Microwave Counter Agilent 53151A US40511493 FT 2016/04/13 * 12
SSCA-01 Search coil LANGER RF-R 400-1 02-0634 FT, BW Pre Check
SDPS-04 Power Supply(DC) TEXIO PW8-5ADPS 14086035 FT Pre Check
SOS-09 Humidity Indicator A&D AD-5681 4061484 FT, BW 2015/12/07 * 12
KTS-07 Digital Tester SANWA PC500 7019232 FT 2015/11/18 * 12
STIM-02 Timer RS 440 9574 - FT -
SSA-03 Spectrum Analyzer Agilent E4448A MY48250152 BW 2015/09/16 * 12
The expiration date of the calibration is the end of the expired month .
As for some calibrations performed after the tested dates , those test equipment have been controlled by
means of an unbroken chains of calibrations .
All equipment is calibrated with valid calibrations . Each measurement data is traceable to the national or
international standards .
Test Item
CE: Conducted emission ,
RE: Radiated emission ,
FT: Frequency Tolerance
BW: 20 dB Bandwidth
End of Report
Test Report No. 11306371S-E-R1
28 of 34
2
Download: Digital Paper Test Report  Sony Corporation
Mirror Download [FCC.gov]Digital Paper Test Report  Sony Corporation
Document ID3306691
Application IDGZsgI9sc16LEmN0mxZ0oVw==
Document DescriptionFCC Test Report_DXX
Short Term ConfidentialNo
Permanent ConfidentialNo
SupercedeYes
Document TypeTest Report
Display FormatAdobe Acrobat PDF - pdf
Filesize1332902
Date Submitted2017-03-08 00:00:00
Date Available2017-03-09 00:00:00
Creation Date2016-07-25 08:04:06
Producing SoftwareAcrobat Distiller 10.1.2 (Windows)
Document Lastmod2016-07-27 16:13:57
Document CreatorPScript5.dll Version 5.2.2

Facebook Twitter Google+ RSS © FCCID.io 2017