DPTRP1 Digital Paper Test Report FCC _DXX Sony Corporation

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Test report No.
Page
Issued date
FCC ID
11306371S-E-R1
1 of 34
July 27, 2016
AK8DPTRP1
RADIO TEST REPORT
Test Report No.: 11306371S-E-R1
1.
2.
3.
4.
5.
6.
7.
8.
Applicant
Sony Corporation
Type of Equipment
Digital Paper
Model No.
DPT-RP1
FCC ID
AK8DPTRP1
Test regulation
FCC Part15 Subpart C: 2016
Test result
Complied
This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.
The results in this report apply only to the sample tested.
This sample tested is in compliance with the limits of the above regulation.
The test results in this test report are traceable to the national or international standards.
This test report must not be used by the customer to claim product certification, approval, or endorsement by
any agency of the Federal Government.
The opinions and the interpretations to the result of the description in this report are outside scopes where
UL Japan has been accredited.
This test report covers Radio technical requirements.
It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable)
This report is a revised version of 11306371S-E. 11306371S-E is replaced with this report.
Date of test:
June 6 to July 2, 2016
Representative test engineer:
Hiroyuki Morikawa
Engineer
Consumer Technology Division
Approved by :
Toyokazu Imamura
Leader
Consumer Technology Division
The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan.
RTL02610
There is no testing item of "Non-accreditation".
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
13-EM-F0429
Test report No.
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FCC ID
11306371S-E-R1
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AK8DPTRP1
REVISION HISTORY
Original Test Report No.: 11306371S-E
Revision
- (Original)
Test report No.
11306371S-E
11306371S-E-R1
Date
July 25, 2016
July 27, 2016
Page revised
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Contents
Update of clock frequency
Test report No.
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AK8DPTRP1
Contents
Page
SECTION 1: Customer information ........................................................................................ 4
SECTION 2: Equipment under test (E.U.T.) .......................................................................... 4
SECTION 3: Test specification, procedures & results ........................................................... 5
SECTION 4: Operation of E.U.T. during testing.................................................................... 7
SECTION 5: Conducted emission ............................................................................................ 8
SECTION 6: Radiated emission (Fundamental and Spurious emission) ............................. 9
SECTION 7: 20dB bandwidth & Occupied bandwidth (99%) ............................................ 11
SECTION 8: Frequency tolerances ........................................................................................ 11
APPENDIX 1: Data of Radio tests .......................................................................................... 12
APPENDIX 2: Test instruments ............................................................................................. 28
APPENDIX 3: Photographs of test setup ............................................................................... 29
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Test report No.
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Issued date
FCC ID
11306371S-E-R1
4 of 34
July 27, 2016
AK8DPTRP1
SECTION 1: Customer information
Company Name
Brand Name
Address
Sony Corporation
SONY
1-7-1 Konan, Minato-ku, Tokyo 108-0075, Japan
SECTION 2: Equipment under test (E.U.T.)
2.1
Identification of E.U.T.
Type of Equipment
Model No.
Serial No.
Rating
Receipt Date of Sample
Country of Mass-production
Condition of EUT
Modification of EUT
2.2
Digital Paper
DPT-RP1
Refer to Section 4, Clause 4.2
DC 3.7 V
May 30, 2016
Japan
Production prototype
(Not for Sale: This sample is equivalent to mass-produced items.)
No Modification by the test lab.
Product description
Model: DPT-RP1 (referred to as the EUT in this report) is a Digital Paper .
Clock frequency
156 MHz (CPLD), 667 MHz (LPDDR3), 200 MHz (eMMC), 40 MHz (WLAN/BT)
208 MHz (WLAN/BT), 32.768 kHz (clock) , 26 MHz (CPU), 27 MHz (NFC)
Radio Specification
Equipment name
IEEE 802.11 22 MIMO a/b/g/n/ac Wireless LAN + Bluetooth + NFC
Bluetooth 2.4GHz band: 2402-2480 MHz (BDR (Basic Data Rate), EDR (Enhanced Data Rate), LE (Low Energy mode)
2.4GHz band: 2412-2462 MHz (b,g,n(HT20));
Frequency
W52 (U-NII-1): 5180-5240 MHz (a,n(HT20),ac(VHT20)) / 5190-5230 MHz (n(HT40),ac(VHT40)) / 5210 MHz (ac(VHT80));
of
WLAN W53 (U-NII-2A): 5260-5320 MHz (a,n(HT20),ac(VHT20)) / 5270-5310 MHz (n(HT40),ac(VHT40)) / 5290 MHz (ac(VHT80));
operation
W56 (U-NII-2C): 5500-5720 MHz (a,n(HT20),ac(VHT20)) / 5510-5710 MHz (n(HT40),ac(VHT40)) / 5530-5690 MHz (ac(VHT80))
W58 (U-NII-3): 5745-5825 MHz (a,n(HT20),ac(VHT20)) / 5755-5795 MHz (n(HT40),ac(VHT40)) / 5775 MHz (ac(VHT80))
NFC
13.56 MHz
Operation mode
Channel spacing
Bandwidth
Type of modulation
Wi-Fi
5 MHz (2.4 GHz band), 20 MHz (W52, W53, W56, W58)
20 MHz (b,g,a,n(HT20),ac(VHT20)),
40 MHz (n(HT40),ac(VTH40)), 80 MHz (ac(VHT80))
DSSS: DBPSK, DQPSK, CCK
OFDM: BPSK, QPSK, 16QAM, 64QAM, 256QAM(*1)
(*1. 256QAM is only supported by 11ac mode.)
Antenna
Antenna type
Antenna gain (Peak)
Bluetooth
1 MHz (BDR, EDR), 2 MHz (LE)
79 MHz
FHSS: GFSK
(*. EDR: GFSK+ /4-DQPSK, GFSK+ 8DPSK)
ASK
antenna #B (Wi-Fi+Bluetooth)
Loop
3.75 dBi (2.4 GHz), 2.81 dBi (5 GHz) (*.including cable loss)
1.38 dBi (2.4 GHz), 4.29 dBi (5 GHz) (*.including cable loss)
Antenna
Antenna type
Card type
antenna #A (Wi-Fi)
NFC
NFC antenna
Loop
type A, type F
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Test report No.
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AK8DPTRP1
SECTION 3: Test specification, procedures & results
3.1
Test specification
Test specification
Title
FCC Part 15 Subpart C
FCC part 15 final revised on April 6, 2016.
FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators
Section 15.207 Conducted limits
Section 15.209 Radiated emission limits, general requirements
Section 15.215 Additional provisions to the general radiated emission limitations
Section 15.225 Operation within the band 13.110-14.010 MHz
The EUT has been tested for compliance with FCC Part 15 Subpart B. Refer to the test report 11306371S-F.
3.2
Procedures & Results
Item
Test Procedure
Conducted
emission
Electric field strength
of Fundamental
emission
Electric field strength
of Spurious emission
(within the
13.110-14.010 MHz
band)
Electric field strength
of Spurious emission
(outside of the
13.110-14.010 MHz
band)
20dB bandwidth
Frequency tolerance
Specification
ANSI C63.4:2009
7. AC powerline
FCC 15.207
conducted emission
measurements
ANSI C63.4:2009
13. Measurement of FCC 15.225 (a)
intentional radiators
Remarks Deviation
Worst Margin
14.5 dB
Freq.: 0.61428 MHz
Phase: L1
Tag: Type F
Results
N/A
Radiated
N/A
59.6 dB
Polarization: Vertical
Complied
ANSI C63.4:2009
FCC 15.225
13. Measurement of
(b)(c)
intentional radiators
Radiated
N/A
40.5 dB
Freq.: 13.567 MHz
Polarization: Vertical
Complied
ANSI C63.4:2009
FCC 15.209
13. Measurement of
FCC 15.225 (d)
intentional radiators
Radiated
N/A
7.4 dB
Freq.: 585.00 MHz
Complied
Polarization: Horizontal
Radiated
N/A
Radiated
N/A
Complied
ANSI C63.4:2009
13. Measurement of FCC 15.215 (c)
intentional radiators
ANSI C63.4:2009
13. Measurement of FCC 15.225 (e)
intentional radiators
Complied
Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422
FCC Part 15.31 (e)
This EUT provides stable voltage (DC 3 V and 1.8 V) constantly to RF transmitter regardless of input voltage.
Therefore, this EUT complies with the requirement.
FCC Part 15.203 Antenna requirement
It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the
equipment complies with the requirement.
3.3
Addition to standard
Item
Test Procedure
Specification
Remarks
ANSI C63.4:2009
Occupied
13. Measurement of
Bandwidth
Radiated
intentional radiators,
(99 %)
RSS-Gen 6.6
Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422
Worst Margin
* Other than above, no addition, exclusion nor deviation has been made from the standard.
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Results
Test report No.
Page
Issued date
FCC ID
3.4
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Uncertainty
The following uncertainties have been calculated to provide a confidence level of 95% using a coverage factor k=2.
Item
Conducted emission
(AC Mains) AMN/LISN
Radiated emission
(Measurement distance: 3 m)
No.1 SAC*1/SR*2 (±)
No.2 SAC/SR (±)
No.3 SAC/SR (±)
150 kHz-30 MHz
2.1 dB
2.1 dB
2.6 dB
9 kHz-30 MHz
30 MHz-300 MHz
300 MHz-1 GHz
2.7 dB
4.4 dB
5.6 dB
2.7 dB
4.4 dB
5.5 dB
3.1 dB
4.6 dB
5.3 dB
Frequency range
*1: SAC=Semi-Anechoic Chamber
*2: SR= Shielded Room is applied besides radiated emission
Conducted emission
The data listed in this test report has enough margin, more than site margin.
Radiated emission
The data listed in this test report has enough margin, more than site margin.
Other tests
Frequency (Normal condition) Measurement uncertainty for this test was: (±) 7.9 x 10^-8.
Frequency (Extreme condition) Measurement uncertainty for this test was: (±) 7.9 x 10^-8.
Bandwidth Measurement uncertainty for this test was: (±) 0.66 %
Temperature uncertainty for this test was: (±) 0.97 deg.C
Voltage uncertainty for this test was: (±) 0.24 %
3.5
Test location
UL Japan, Inc. Shonan EMC Lab.
1-22-3, Megumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN
Telephone number
+81 463 50 6400
Facsimile number
+81 463 50 6401
JAB Accreditation No.
RTL02610
No.1 Semi-anechoic chamber
No.2 Semi-anechoic chamber
No.3 Semi-anechoic chamber
No.4 Semi-anechoic chamber
No.1 shielded room
No.2 shielded room
No.3 shielded room
No.4 shielded room
No.5 shielded room
No.6 shielded room
No.1 Measurement room
3.6
IC Registration
No.
Width x Depth x
Height (m)
2973D-1
2973D-2
2973D-3
20.6 x 11.3 x 7.65
20.6 x 11.3 x 7.65
12.7 x 7.7 x 5.35
8.1 x 5.1 x 3.55
6.8 x 4.1 x 2.7
6.8 x 4.1 x 2.7
6.3 x 4.7 x 2.7
4.4 x 4.7 x 2.7
7.8 x 6.4 x 2.7
7.8 x 6.4 x 2.7
2.55 x 4.1 x 2.5
Test setup, Data of test & Test instruments
Refer to APPENDIX 1 to 3.
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Size of reference ground
plane (m) / horizontal
conducting plane
20.6 x 11.3
20.6 x 11.3
12.7 x 7.7
8.1 x 5.1
6.8 x 4.1
6.8 x 4.1
6.3 x 4.7
4.4 x 4.7
7.8 x 6.4
7.8 x 6.4
Maximum
measurement
distance
10 m
10 m
5m
Test report No.
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SECTION 4: Operation of E.U.T. during testing
4.1
Operating mode
The EUT exercise program used during testing was designed to exercise the various system components in a manner
similar to typical use.
Test item
All items
Software: NFCPollingMonitor Ver. 1.2.4.1
Power settings: Fixed
Operating mode
Transmitting
Tested frequency
13.56 MHz
The carrier level and noise levels were confirmed with and without Tag, and the test was made with the condition that
has the maximum noise.
Combinations of the worst case
Radiated emission (Carrier)
Radiated spurious emission
Radiated spurious emission
(Below 30 MHz)
(Above 30 MHz)
With Tag (type F)
With Tag (type F)
With Tag (type A)
Justification: The system was configured in typical fashion (as customer would normally use it) for testing.
4.2
Configuration and peripherals
A: EUT
AC 120 V/60 Hz
* Test data was taken under worse case conditions.
Description of EUT and Support equipment
No. Item
Model number
Digital Paper
DPT-RP1
AC Adapter
AC-UUD12
List of cables used
No. Item
USB
Length (m)
1.5
Serial number
9002003
15091AR1000055
Shield (Cable)
Shielded
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Manufacturer
Sony Corporation
Sony Corporation
Shield (Connector)
Shielded
Remarks
EUT
Remarks
Test report No.
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SECTION 5: Conducted emission
5.1
Operating environment
Test place
Temperature :
Humidity
5.2
See test data (APPENDIX 1)
See test data (APPENDIX 1)
See test data (APPENDIX 1)
Test configuration
EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane.
The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity.
The rear of tabletop was located 40 cm to the vertical conducting plane. The rear of peripheral was aligned and was
flushed with rear of tabletop. All other surfaces of tabletop were at least 80 cm from any other grounded conducting
surface. EUT was located 80 cm from LISN. Each EUT current-carrying power lead, except the ground (safety) lead,
was individually connected through a LISN to the input power source..
Photographs of the set up are shown in APPENDIX 3.
5.3
Test conditions
Frequency range
EUT position
5.4
0.15 MHz - 30 MHz
Table top
Test procedure
The AC Mains Terminal Continuous disturbance Voltage had been measured with the EUT within a Shielded room.
The EUT was connected to a Line Impedance Stabilization Network (LISN). An overview sweep with peak detection
has been performed.
The measurements had been performed with a quasi-peak detector and if required, a CISPR average detector.
The conducted emission measurements were made with the following detection of the test receiver.
Detection Type :
Quasi-Peak/ CISPR Average
IF Bandwidth
9 kHz
5.5
Results
Summary of the test results :
Refer to APPENDIX 1
Pass
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Test report No.
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Issued date
FCC ID
11306371S-E-R1
9 of 34
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AK8DPTRP1
SECTION 6: Radiated emission (Fundamental and Spurious emission)
6.1
Operating environment
Test place
Temperature :
Humidity
6.2
See test data (APPENDIX 1)
See test data (APPENDIX 1)
See test data (APPENDIX 1)
Test configuration
EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane.
The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity.
Photographs of the set up are shown in Appendix 1.
6.3
Test conditions
Frequency range
Test distance
EUT position
6.4
9 kHz - 1 GHz
3m
Table top
Test procedure
The Radiated Electric Field Strength intensity has been measured on a semi-anechoic chamber with a ground plane at a
distance of 3 m.
Although these tests were performed other than open area test site, adequate comparison measurements were confirmed
against 30 m open are test site. Therefore sufficient tests were made to demonstrate that the alternative site produces
results that correlate with the ones of tests made in an open field based on KDB 937606. These tests were performed in
semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made
without a ground plane. However test results were confirmed to pass against standard limit.
The Radiated Electric Field Strength intensity has been measured with a ground plane and at a distance of 3 m
Frequency: From 9 kHz to 30 MHz at distance 3 m
The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity.
The measurements were performed for vertical polarization (antenna angle: 0 deg.to 360 deg.) and horizontal
polarization. Drawing of the antenna direction is shown in Figure 1.
Frequency: From 30 MHz to 1 GHz at distance 3 m (Refer to Figure 2).
The measuring antenna height was varied between 1 and 4 m and EUT was rotated a full revolution in order to
obtain the maximum value of the electric field intensity.
The measurements were performed for both vertical and horizontal antenna polarization.
Measurements were performed with QP, PK, and AV detector.
The radiated emission measurements were made with the following detector function of the test receiver.
9 kHz to 90 kHz & 90 kHz to
150 kHz
490 kHz to
30 MHz to 1 GHz
110 kHz to 150 kHz
110 kHz
to 490 kHz
30 MHz
Detector Type
PK/AV
QP
PK/AV
QP
QP
IF Bandwidth
200 Hz
200 Hz
9 kHz
9 kHz
120 kHz
Measuring
Loop antenna
Biconical (30 MHz-299.99 MHz)
antenna
Logperiodic (300 MHz-1 GHz)
* FCC 15.31 (f)(2) (9 kHz-30 MHz)
9 kHz – 490 kHz [Limit at 3 m]= [Limit at 300 m]-40 log (3 [m]/300 [m])
490 kHz – 30 MHz [Limit at 3 m]= [Limit at 30 m]-40 log (3 [m]/30 [m])
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Test report No.
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The carrier level and noise levels were confirmed at each position of X, Y and Z axes of EUT to see the position of
maximum noise, and the test was made at the position that has the maximum noise. Refer to the data.
6.5
Results
Summary of the test results :
Pass
No spurious emissions exceeded the fundamental emission level.
Refer to APPENDIX 1.
Figure 1. Direction of the Loop Antenna
Horizontal (Top View)
EUT
Antenna was not rotated.
Vertical (Side View)
(Top View)
135deg
EUT
EUT
90deg
45deg
0deg
Front side: 0 deg.
Forward direction: clockwise
Figure 2. Antenna angle
Radiated Emission
(Below 1GHz)
No.3 Semi-Anechoic Chamber (Antenna angle)
90 deg.
Biconical Antenna
Logperiodic Antenna
g.
de
3m / 3t
45
0 deg.
TurnTable
3m
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
Test report No.
Page
Issued date
FCC ID
SECTION 7: 20dB bandwidth & Occupied bandwidth (99%)
Test procedure
The test was measured with a spectrum analyzer using a test fixture.
Results
Summary of the test results:
Refer to APPENDIX 1.
Pass
SECTION 8: Frequency tolerances
Test procedure
The test was measured with a spectrum analyzer using a test fixture.
The temperature test was started after the temperature stabilization time of 30 minutes.
The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C.
Results
Summary of the test results:
Refer to APPENDIX 1.
Pass
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone :
+81 463 50 6400
Facsimile
+81 463 50 6401
11306371S-E-R1
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APPENDIX 1: Data of Radio tests
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Type-A
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
N(PK)
N(QP/AV)
50
L1(PK)
L1(QP/AV)
40
30
20
10
.15
No.
.2
Freq.
[MHz]
.3
.5
Reading


[dBuV]
[dBuV]
.7
C.Fac
[dB]
Frequency [MHz]
Results


[dBuV]
[dBuV]
Limit


[dBuV]
[dBuV]
10
Margin


[dB]
[dB]
Phase
0.15000
35.90
17.80
12.51
48.41
30.31
66.00
56.00
17.5
25.6
0.15741
32.70
14.10
12.51
45.21
26.61
65.60
55.60
20.3
28.9
0.22788
30.10
12.80
12.53
42.63
25.33
62.53
52.53
19.9
27.2
0.24228
28.70
12.00
12.53
41.23
24.53
62.02
52.02
20.7
27.4
0.26348
27.80
10.80
12.53
40.33
23.33
61.32
51.32
20.9
27.9
0.54260
25.90
10.60
12.54
38.44
23.14
56.00
46.00
17.5
22.8
0.61501
28.80
17.70
12.56
41.36
30.26
56.00
46.00
14.6
15.7
4.83725
21.00
9.10
13.01
34.01
22.11
56.00
46.00
21.9
23.8
6.97724
25.80
12.40
13.28
39.08
25.68
60.00
50.00
20.9
24.3
10
13.56000
43.40
33.00
14.04
57.44
47.04
60.00
50.00
2.5
2.9
11
0.15000
35.20
17.60
12.51
47.71
30.11
66.00
56.00
18.2
25.8
L1
12
0.15714
33.20
15.60
12.51
45.71
28.11
65.61
55.61
19.9
27.5
L1
13
0.22420
28.80
11.30
12.52
41.32
23.82
62.66
52.66
21.3
28.8
L1
14
0.24780
27.00
10.20
12.53
39.53
22.73
61.83
51.83
22.3
29.1
L1
15
0.26313
26.50
9.90
12.53
39.03
22.43
61.33
51.33
22.3
28.9
L1
16
0.54162
20.30
5.70
12.54
32.84
18.24
56.00
46.00
23.1
27.7
L1
17
0.61380
28.40
11.70
12.56
40.96
24.26
56.00
46.00
15.0
21.7
L1
18
4.88063
21.30
6.50
13.02
34.32
19.52
56.00
46.00
21.6
26.4
L1
19
6.96669
22.80
10.20
13.28
36.08
23.48
60.00
50.00
23.9
26.5
L1
20
13.56000
35.60
30.10
14.04
49.64
44.14
60.00
50.00
10.3
5.8
L1
20
30
Comment
Reference Data
Reference Data
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
12 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Type-A(Antenna Terminate)
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
N(PK)
N(QP/AV)
50
L1(PK)
L1(QP/AV)
40
30
20
10
.15
No.
.2
Freq.
[MHz]
.3
.5
Reading


[dBuV]
[dBuV]
.7
C.Fac
[dB]
Frequency [MHz]
Results


[dBuV]
[dBuV]
Limit


[dBuV]
[dBuV]
Margin


[dB]
[dB]
10
Phase
13.56000
18.00
5.60
14.04
32.04
19.64
60.00
50.00
27.9
30.3
13.56000
14.90
3.90
14.04
28.94
17.94
60.00
50.00
31.0
32.0
L1
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN: SLS-02
20
30
Comment
13 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Type-F
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
N(PK)
N(QP/AV)
50
40
30
20
10
.15
.2
.3
.5
.7
Frequency [MHz]
10
20
30
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
L1(PK)
L1(QP/AV)
50
40
30
20
10
.15
.2
.3
.5
.7
Frequency [MHz]
10
20
30
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
14 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Type-F
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
<< QP/AV DATA >>
No.
Freq.
[MHz]
Reading


[dBuV]
[dBuV]
C.Fac
[dB]
Results


[dBuV]
[dBuV]
Limit


[dBuV]
[dBuV]
Margin


[dB]
[dB]
Phase
0.15000
37.80
21.30
12.51
50.31
33.81
66.00
56.00
15.6
22.1
0.15795
37.20
10.10
12.51
49.71
22.61
65.57
55.57
15.8
32.9
0.21841
32.50
15.90
12.52
45.02
28.42
62.88
52.88
17.8
24.4
0.23281
32.70
16.20
12.53
45.23
28.73
62.35
52.35
17.1
23.6
0.25321
29.40
12.20
12.53
41.93
24.73
61.65
51.65
19.7
26.9
0.49898
26.70
10.20
12.54
39.24
22.74
56.02
46.02
16.7
23.2
0.58244
26.60
12.50
12.55
39.15
25.05
56.00
46.00
16.8
20.9
4.70220
21.90
9.40
13.00
34.90
22.40
56.00
46.00
21.1
23.6
6.93652
27.60
13.50
13.27
40.87
26.77
60.00
50.00
19.1
23.2
10
13.56000
51.60
41.30
14.04
65.64
55.34
60.00
50.00
-5.7
-5.4
11
26.58915
22.20
7.00
14.55
36.75
21.55
60.00
50.00
23.2
28.4
12
0.15000
31.00
10.30
12.51
43.51
22.81
66.00
56.00
22.4
33.1
L1
13
0.16032
30.10
10.20
12.52
42.62
22.72
65.45
55.45
22.8
32.7
L1
14
0.21326
28.60
10.60
12.52
41.12
23.12
63.08
53.08
21.9
29.9
L1
15
0.23043
28.80
11.40
12.53
41.33
23.93
62.43
52.43
21.1
28.5
L1
16
0.25061
26.10
9.00
12.53
38.63
21.53
61.74
51.74
23.1
30.2
L1
17
0.49967
18.20
2.40
12.54
30.74
14.94
56.01
46.01
25.2
31.0
L1
18
0.61428
28.90
12.80
12.56
41.46
25.36
56.00
46.00
14.5
20.6
L1
19
4.66988
22.00
6.80
12.99
34.99
19.79
56.00
46.00
21.0
26.2
L1
20
6.89403
23.30
9.90
13.27
36.57
23.17
60.00
50.00
23.4
26.8
L1
21
13.56000
44.00
39.20
14.04
58.04
53.24
60.00
50.00
1.9
-3.3
L1
22
26.51504
19.10
4.70
14.54
33.64
19.24
60.00
50.00
26.3
30.7
L1
Comment
Reference Data
Reference Data
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
15 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Type-F(Antenna Terminate)
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
N(PK)
N(QP/AV)
50
L1(PK)
L1(QP/AV)
40
30
20
10
.15
No.
.2
Freq.
[MHz]
.3
.5
Reading


[dBuV]
[dBuV]
.7
C.Fac
[dB]
Frequency [MHz]
Results


[dBuV]
[dBuV]
Limit


[dBuV]
[dBuV]
Margin


[dB]
[dB]
10
Phase
13.56000
18.10
5.80
14.04
32.14
19.84
60.00
50.00
27.8
30.1
13.56000
15.00
4.00
14.04
29.04
18.04
60.00
50.00
30.9
31.9
L1
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN: SLS-02
20
30
Comment
16 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Non Tag
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
N(PK)
N(QP/AV)
50
40
30
20
10
.15
.2
.3
.5
.7
Frequency [MHz]
10
20
30
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
L1(PK)
L1(QP/AV)
50
40
30
20
10
.15
.2
.3
.5
.7
Frequency [MHz]
10
20
30
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
17 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Non Tag
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
<< QP/AV DATA >>
No.
Freq.
[MHz]
Reading


[dBuV]
[dBuV]
C.Fac
[dB]
Results


[dBuV]
[dBuV]
Limit


[dBuV]
[dBuV]
Margin


[dB]
[dB]
Phase
0.15000
35.80
18.80
12.51
48.31
31.31
66.00
56.00
17.6
24.6
0.16063
31.90
13.10
12.52
44.42
25.62
65.43
55.43
21.0
29.8
0.23597
29.70
12.80
12.53
42.23
25.33
62.24
52.24
20.0
26.9
0.26517
27.60
10.70
12.53
40.13
23.23
61.27
51.27
21.1
28.0
0.31237
23.20
6.60
12.52
35.72
19.12
59.91
49.91
24.1
30.7
0.54540
26.00
9.90
12.54
38.54
22.44
56.00
46.00
17.4
23.5
0.61510
28.60
16.90
12.56
41.16
29.46
56.00
46.00
14.8
16.5
4.66015
19.80
6.90
12.99
32.79
19.89
56.00
46.00
23.2
26.1
7.16237
24.30
10.50
13.31
37.61
23.81
60.00
50.00
22.3
26.1
10
13.56000
54.30
43.90
14.04
68.34
57.94
60.00
50.00
-8.4
-8.0
11
17.07760
27.50
15.10
14.33
41.83
29.43
60.00
50.00
18.1
20.5
12
26.47400
23.10
6.70
14.54
37.64
21.24
60.00
50.00
22.3
28.7
13
0.15000
35.30
17.10
12.51
47.81
29.61
66.00
56.00
18.1
26.3
L1
14
0.15415
34.30
16.00
12.51
46.81
28.51
65.77
55.77
18.9
27.2
L1
15
0.23080
29.00
11.80
12.53
41.53
24.33
62.42
52.42
20.8
28.0
L1
16
0.26762
26.10
9.30
12.53
38.63
21.83
61.19
51.19
22.5
29.3
L1
17
0.31545
20.50
4.70
12.52
33.02
17.22
59.83
49.83
26.8
32.6
L1
18
0.54107
20.20
4.90
12.54
32.74
17.44
56.00
46.00
23.2
28.5
L1
19
0.61436
28.30
11.70
12.56
40.86
24.26
56.00
46.00
15.1
21.7
L1
20
4.67607
17.90
3.60
12.99
30.89
16.59
56.00
46.00
25.1
29.4
L1
21
6.95442
21.30
7.50
13.28
34.58
20.78
60.00
50.00
25.4
29.2
L1
22
13.56000
46.50
41.90
14.04
60.54
55.94
60.00
50.00
-0.6
-6.0
L1
23
17.01277
24.30
16.00
14.32
38.62
30.32
60.00
50.00
21.3
19.6
L1
24
26.17483
16.80
2.90
14.54
31.34
17.44
60.00
50.00
28.6
32.5
L1
Comment
Reference Data
Reference Data
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
18 of 34
Test Report No. : 11306371S-E-R1
DATA OF CONDUCTED EMISSION TEST
UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room
Date : 2016/06/20
Company
Kind of EUT
Model No.
Serial No.
Remarks
Sony Corporation
Digital Paper
DPT-RP1
9002003
Tag : Non Tag(Antenna Terminate)
Limit1 : FCC 15C(15.207) QP
Limit2 : FCC 15C(15.207) AV
Mode
Order No.
Power
Temp./Humi.
NFC Communication
11306371S
AC 120 V / 60 Hz
25 deg.C / 53 %RH
Engineer
: Yosuke Ishikawa
RFI Voltage [dBuV]
80
Limit1(QP)
70
Limit2(AV)
60
N(PK)
N(QP/AV)
50
L1(PK)
L1(QP/AV)
40
30
20
10
.15
No.
.2
Freq.
[MHz]
.3
.5
Reading


[dBuV]
[dBuV]
.7
C.Fac
[dB]
Frequency [MHz]
Results


[dBuV]
[dBuV]
Limit


[dBuV]
[dBuV]
Margin


[dB]
[dB]
10
Phase
13.56000
17.30
5.10
14.04
31.34
19.14
60.00
50.00
28.6
30.8
13.56000
14.70
3.50
14.04
28.74
17.54
60.00
50.00
31.2
32.4
L1
20
30
Comment
Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB]
LISN:SLS-02
19 of 34
Test Report No. : 11306371S-E-R1
Data of Electric field strength of Fundamental emission
and Spurious emission within the band: FCC15.225(a)(b)(c)
UL Japan, Inc.
Shonan EMC Lab., No.3 Semi Anechoic Chamber
Company:
Equipment:
Model:
Sample No.:
Power:
Mode:
Sony Corporation
Digital Paper
DPT-RP1
9002003
DC 3.7 V
Transmitting 13.56MHz
Remarks:
: NFC type F (Axis:Hor_X / Ver_Z) , Vertical polarization (antenna angle) of the worst case: 0deg
Fundamental emission
Test Receiver Antenna
No.
FREQ
Reading
Factor
Hor
Ver
[MHz] [dBuV] [dBuV] [dB/m]
Regulation:
Test Distance:
Date:
Temperature:
Humidity:
ENGINEER:
Loss
AMP Distance
GAIN factor
[dB]
[dB]
[dB]
FCC Part15 Subpart C 15.225
3m
June 06, 2016
25 deg.C
53 %RH
Yosuke Ishikawa
RESULT
LIMIT
(30m)
Hor
Ver
[dBuV/m] [dBuV/m] [dBuV/m]
MARGIN
Hor
[dB]
Ver
[dB]
13.560
60.4
71.6
18.4
6.5
32.2
-40.0
13.1
24.3
83.9
70.8
59.6
Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB]
Distance factor: 40 x log (3m/30m) = -40 dB
Limits (30m)
・13.553MHz to 13.567MHz : 83.9dBuV/m (FCC 15.225(a))
Spurious emission within the band
No.
FREQ
Test Receiver Antenna
Reading
Factor
Hor
Ver
[MHz] [dBuV] [dBuV] [dB/m]
Loss
AMP Distance
GAIN factor
[dB]
[dB]
[dB]
RESULT
LIMIT
(30m)
Hor
Ver
[dBuV/m] [dBuV/m] [dBuV/m]
MARGIN
Hor
[dB]
Ver
[dB]
13.110 30.1
30.2
18.4
6.5
32.2
-40.0
-17.3
-17.2
29.5
46.8
46.7
13.410 30.2
31.6
18.4
6.5
32.2
-40.0
-17.2
-15.75
40.5
57.7
56.3
13.553 45.7
56.6
18.4
6.5
32.2
-40.0
-1.6
9.3
50.4
52.0
41.1
13.567 46.3
57.2
18.4
6.5
32.2
-40.0
-1.0
9.9
50.4
51.4
40.5
13.710 30.2
31.8
18.4
6.5
32.2
-40.0
-17.1
-15.53
40.5
57.6
56.0
14.010 30.2
30.2
18.4
6.5
32.2
-40.0
-17.1
-17.13
29.5
46.6
46.6
Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB]
Outside filed strength frequencies
・Fc±7kHz:13.553MHz to 13.567MHz
・Fc±150kHz:13.410MHz to 13.710MHz
・Fc±450kHz:13.110MHz to 14.010MHz
Fc = 13.56MHz
Limits (30m)
・13.410MHz to 13.553MHz and 13.567MHz to 13.710MHz : 50.4dBuV/m (FCC 15.225(b))
・13.110MHz to 13.410MHz and 13.710MHz to 14.010MHz : 40.5dBuV/m (FCC 15.225(c))
・Below 13.110MHz and Above 14.010MHz : 29.5dBuV/m (FCC 15.225(d)and FCC 15.209)
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone
:+81 463 50 6400
Facsimile
: +81 463 50 6401
20 of 34
Test Report No. : 11306371S-E-R1
Radiated Emission
UL Japan, Inc.
Shonan EMC Lab. No.3 Semi Anechoic Chamber
Company:
Equipment:
Model:
Sample No.:
Power:
Mode:
EUT axis:
Sony Corporation
Regulation:
Digital Paper
Test Distance:
DPT-RP1
Date:
9002003
Temperature:
DC 3.7 V
Humidity:
Transmitting 13.56MHz
ENGINEER:
Below 30 MHz( Horizontal X-axis, Vertical Z-axis), NFC type F, with Tag
Above 30 MHz( Horizontal: Z-axis, Vertical: Z-axis), NFC type A, with Tag
FCC Part15 Subpart C 15.225
3m
June 06, 2016
25 deg.C
53 %RH
Yosuke Ishikawa
Remarks:
Polarity Frequency Detector Reading Ant.Fac.
[MHz]
[dBuV] [dB/m]
Hori.
Hori.
Hori.
Hori.
Hori.
Hori.
Hori.
Vert.
Vert.
Vert.
Vert.
Vert.
Vert.
27.12
273.003
429.003
506.999
585.000
663.003
834.233
27.12
40.680
194.999
429.004
507.002
585.002
QP
QP
QP
QP
QP
QP
QP
QP
QP
QP
QP
QP
QP
29.7
35.6
42.0
43.3
41.9
38.2
29.9
30.2
37.4
34.8
41.1
43.1
40.8
18.6
18.1
16.4
17.5
18.7
19.8
21.4
18.6
13.6
16.2
16.4
17.5
18.7
Loss
[dB]
6.7
8.5
9.3
9.6
9.9
10.2
10.8
6.7
6.8
8.0
9.3
9.6
9.9
Gain
[dB]
32.2
32.0
31.9
31.9
31.9
31.9
31.4
32.2
32.2
32.1
31.9
31.9
31.9
Distance Factor Result
Limit
Margin
[dB]
[dBuV/m] [dBuV/m]
[dB]
-40.0
0.0
0.0
0.0
0.0
0.0
0.0
-40.0
0.0
0.0
0.0
0.0
0.0
-17.1
30.2
35.7
38.5
38.6
36.3
30.7
-16.6
25.6
26.9
34.8
38.3
37.5
29.5
46.0
46.0
46.0
46.0
46.0
46.0
29.5
40.0
43.5
46.0
46.0
46.0
46.6
15.8
10.3
7.5
7.4
9.7
15.3
46.1
14.4
16.7
11.2
7.7
8.5
Height
[cm]
357
182
148
139
111
100
100
100
124
105
100
Angle
[deg.]
Remark
134 * Limit: 30m
93
169
179
183
161
194
294 * Limit: 30m
275
310
187
178
167
Result = Reading + Ant Factor + Loss (Cable+ATT+ΔAF(above 30MHz)) - Gain(Amprifier) + Distance factor(below 30MHz)
* Other frequency noises omitted in this report were not seen or have enough margin (more than 20dB).
* Carrier level (Result at 3m): Hor= 53.1dBuV/m, Ver= 64.3 dBuV/m
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone
:+81 463 50 6400
Facsimile
: +81 463 50 6401
21 of 34
Test Report No. : 11306371S-E-R1
Radiated Emission (Worst mode plot)
UL Japan, Inc.
Shonan EMC Lab. No.3 Semi Anechoic Chamber
Company:
Equipment:
Model:
Sample No.:
Power:
Mode:
EUT axis:
Remarks:
Sony Corporation
Regulation:
Digital Paper
Test Distance:
DPT-RP1
Date:
9002003
Temperature:
DC 3.7 V
Humidity:
Transmitting 13.56MHz
ENGINEER:
Below 30 MHz( Horizontal X-axis, Vertical Z-axis), NFC type F, with Tag
Above 30 MHz( Horizontal: Z-axis, Vertical: Z-axis), NFC type A, with Tag
These plots data contains sufficient number to show the trend of characteristic features for EUT.
FCC Part15 Subpart C 15.225
3m
June 06, 2016
25 deg.C
53 %RH
Yosuke Ishikawa
Spurious emission plot
90
80
70
60
Result [dBμV/m]
50
40
30
QP,AV Limit
20
PK Limit
10
Hori./QP,AV
Hori./PK
-10
Vert./QP,AV
-20
Vert./PK
-30
-40
-50
-60
0.001
0.01
0.1
10
100
1000
Frequency [MHz]
Within band plot
90
80
70
60
Result [dBμV/m]
50
40
30
20
QP Limit
10
Hori./QP
Vert./QP
-10
-20
-30
-40
-50
-60
13
13.2
13.4
13.6
13.8
14
Frequency [MHz]
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone
:+81 463 50 6400
Facsimile
: +81 463 50 6401
22 of 34
Test Report No. : 11306371S-E-R1
Data of Frequency Tolerance
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded room
Company
Equipment
Model
Serial No.
Power
Mode
Sony Corporation
Digital Paper
DPT-RP1
9002558
DC 3.7V
Transmitting 13.56 MHz
Regulation
Date
Temperature
Humidity
ENGINEER
FCC Part15 Subpart C 15.225 (e)
June 27, 2016
24 deg.C
40 %RH
Makoto Hosaka
Temperature Variation: -20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.560069
13.560069
13.560069
13.560068
Frequency
Error
(MHz)
0.000069
0.000069
0.000069
0.000068
Frequency
torerance
(%)
0.00051
0.00051
0.00051
0.00050
Limit
Frequency
Error
(MHz)
0.000080
0.000080
0.000081
0.000080
Frequency
torerance
(%)
0.00059
0.00059
0.00060
0.00059
Limit
Frequency
Error
(MHz)
0.000074
0.000066
0.000066
0.000066
Frequency
torerance
(%)
0.00055
0.00049
0.00049
0.00049
Limit
Frequency
Error
(MHz)
0.000034
0.000032
0.000032
0.000033
Frequency
torerance
(%)
0.00025
0.00024
0.00024
0.00024
Limit
Frequency
Error
(MHz)
0.000009
-0.000010
-0.000010
-0.000010
Frequency
torerance
(%)
0.00007
-0.00007
-0.00007
-0.00007
Limit
(%)
0.010
0.010
0.010
0.010
Temperature Variation: -10deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.560080
13.560080
13.560081
13.560080
(%)
0.010
0.010
0.010
0.010
Temperature Variation: 0deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.560074
13.560066
13.560066
13.560066
(%)
0.010
0.010
0.010
0.010
Temperature Variation: 10deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.560034
13.560032
13.560032
13.560033
(%)
0.010
0.010
0.010
0.010
Temperature Variation: 20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.560009
13.559990
13.559990
13.559990
(%)
0.010
0.010
0.010
0.010
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone
: +81 463 50 6400
Facsimile
: +81 463 50 6401
23 of 34
Test Report No. : 11306371S-E-R1
Data of Frequency Tolerance
Temperature Variation: 30deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559965
13.559952
13.559952
13.559951
Frequency
Error
(MHz)
-0.000035
-0.000048
-0.000048
-0.000049
Frequency
torerance
(%)
-0.00026
-0.00035
-0.00035
-0.00036
Limit
Frequency
Error
(MHz)
-0.000068
-0.000078
-0.000080
-0.000080
Frequency
torerance
(%)
-0.00050
-0.00058
-0.00059
-0.00059
Limit
(%)
0.010
0.010
0.010
0.010
Temperature Variation: 40deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559932
13.559922
13.559920
13.559920
(%)
0.010
0.010
0.010
0.010
Temperature Variation: 50deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Test Conditions
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559906
13.559901
13.559901
13.559901
Frequency
Error
(MHz)
-0.000094
-0.000099
-0.000099
-0.000099
Frequency
torerance
(%)
-0.00069
-0.00073
-0.00073
-0.00073
Limit
Original
Frequency
(MHz)
Measure
Frequency
(MHz)
Frequency
Error
(MHz)
#VALUE!
#VALUE!
#VALUE!
#VALUE!
Frequency
torerance
(%)
#VALUE!
#VALUE!
#VALUE!
#VALUE!
Limit
Original
Frequency
(MHz)
Measure
Frequency
(MHz)
Frequency
Error
(MHz)
#VALUE!
#VALUE!
#VALUE!
#VALUE!
Frequency
torerance
(%)
#VALUE!
#VALUE!
#VALUE!
#VALUE!
Limit
Original
Frequency
(MHz)
Measure
Frequency
(MHz)
Frequency
Error
(MHz)
#VALUE!
#VALUE!
#VALUE!
#VALUE!
Frequency
torerance
(%)
#VALUE!
#VALUE!
#VALUE!
#VALUE!
Limit
startup
after 2minutes
after 5minutes
after 10minutes
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
(%)
0.010
0.010
0.010
0.010
(%)
0.010
0.010
0.010
0.010
(%)
0.010
0.010
0.010
0.010
(%)
0.010
0.010
0.010
0.010
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone
: +81 463 50 6400
Facsimile
: +81 463 50 6401
24 of 34
Test Report No. : 11306371S-E-R1
Data of Frequency Tolerance
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded room
Company
Equipment
Model
Serial No.
Power
Mode
Sony Corporation
Digital Paper
DPT-RP1
9002558
DC 3.7V
Transmitting 13.56 MHz
Regulation
Date
Temperature
Humidity
ENGINEER
FCC Part15 Subpart C 15.225 (e)
June 27, 2016
24 deg.C
40 %RH
Makoto Hosaka
Voltage Variation: DC 3.145 V
Temperature Variation: 20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559991
13.559977
13.559975
13.559970
Frequency
Error
(MHz)
-0.000009
-0.000023
-0.000025
-0.000030
Frequency
torerance
(%)
-0.00007
-0.00017
-0.00018
-0.00022
Limit
Frequency
Error
(MHz)
-0.000025
-0.000030
-0.000032
-0.000035
Frequency
torerance
(%)
-0.00018
-0.00022
-0.00024
-0.00026
Limit
(%)
0.010
0.010
0.010
0.010
Voltage Variation: DC 4.255 V
Temperature Variation: 20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559975
13.559970
13.559968
13.559965
(%)
0.010
0.010
0.010
0.010
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone
: +81 463 50 6400
Facsimile
: +81 463 50 6401
25 of 34
Test Report No. : 11306371S-E-R1
Data of Frequency Tolerance
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded room
Company
Equipment
Model
Serial No.
Power
Mode
Sony Corporation
Digital Paper
DPT-RP1
9002558
DC 5V
Transmitting 13.56 MHz
Regulation
Date
Temperature
Humidity
ENGINEER
FCC Part15 Subpart C 15.225 (e)
July 2, 2016
25 deg.C
51 %RH
Hiroyuki Morikawa
Voltage Variation: DC 4.55 V (Minimum operating voltage)
Temperature Variation: 20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559978
13.559965
13.559963
13.559962
Frequency
Error
(MHz)
-0.000022
-0.000035
-0.000037
-0.000038
Frequency
torerance
(%)
-0.00016
-0.00026
-0.00027
-0.00028
Limit
Frequency
Error
(MHz)
-0.000017
-0.000033
-0.000034
-0.000033
Frequency
torerance
(%)
-0.00013
-0.00024
-0.00025
-0.00024
Limit
Frequency
Error
(MHz)
-0.000023
-0.000039
-0.000040
-0.000040
Frequency
torerance
(%)
-0.00017
-0.00029
-0.00029
-0.00029
Limit
(%)
0.010
0.010
0.010
0.010
Voltage Variation: DC 5 V
Temperature Variation: 20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559983
13.559967
13.559966
13.559967
(%)
0.010
0.010
0.010
0.010
Voltage Variation: DC 5.75 V
Temperature Variation: 20deg.C
Test Conditions
startup
after 2minutes
after 5minutes
after 10minutes
Original
Frequency
(MHz)
13.56
13.56
13.56
13.56
Measure
Frequency
(MHz)
13.559977
13.559961
13.559960
13.559960
(%)
0.010
0.010
0.010
0.010
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN
Telephone
: +81 463 50 6400
Facsimile
: +81 463 50 6401
26 of 34
Test Report No. : 11306371S-E-R1
20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen
UL Japan, Inc.
Shonan EMC Lab. No.5 Shielded Room
Company:
Equipment:
Model:
Sample No.:
Power:
Mode:
Sony Corporation
Regulation: FCC Part15 Subpart C 15.215
Digital Paper
DPT-RP1
Date:
July 2, 2016
9002003
Temperature: 25 deg.C
DC 3.7 V
Humidity:
51 %RH
Transmitting 13.56MHz
ENGINEER: Hiroyuki Morikawa
: NFC type F (Axis:Hor_X / Ver_Z) , Vertical polarization (antenna angle) of the worst case: 0deg
20dB Bandwidth:
Type A
449.748 kHz
Type F
431.965 kHz
99% Occupied Bandwi
Type A
634.756 kHz
Type F
468.250 kHz
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220
Telephone
:+81 463 50 6400
Facsimile
: +81 463 50 6401
27 of 34
Test Report No. : 11306371S-E-R1
Test Report No :
APPENDIX 23
Test Instruments
EMI test equipment
Control No.
Instrument
SCC-C9/C10/S Coaxial Cable&RF
RSE-03
Selector
Manufacturer
Model No
Serial No
Test Item
Suhner/Suhner/TOYO
RG223U/141PE/N -/0901-271(RF CE
S4906
Selector)
Calibration Date
* Interval(month)
2016/04/22 * 12
SLS-02
LISN
Rohde & Schwarz
ENV216
100512
CE
2016/02/08 * 12
SAT3-07
Attenuator
JFW
50HF-003N
CE
2015/09/18 * 12
SOS-06
Humidity Indicator
A&D
AD-5681
4062118
CE
2015/12/07 * 12
STM-05
Terminator
TME
CT-01 BP
CE
2015/12/18 * 12
STR-06
Test Receiver
Rohde & Schwarz
ESCI
101259
CE,RE
2016/03/28 * 12
SJM-15
Measure
ASKUL
CE,RE
TSJ
TEPTO-DV(RE,CE, RFI,MF)
3805-50
080997823
CE,RE
CE,RE
2015/11/18 * 12
SAEC-03(NSA)
RE
2015/07/16 * 12
COTS-SEMI-1 EMI Software
STS-03
Digital Hitester
Hioki
SAEC-03(NSA) Semi-Anechoic Chamber TDK
SBA-03
Biconical Antenna
Schwarzbeck
BBA9106
91032666
RE
2015/10/11 * 12
SLA-03
Logperiodic Antenna
Schwarzbeck
UHALP9108A
UHALP 9108-A RE
0901
2015/10/11 * 12
SAT6-08
Attenuator
HIROSE ELECTRIC
CO.,LTD.
Fujikura/Fujikura/Suhne
r/Suhner/Suhner/Suhn
er/TOYO
SONOMA
AT-406(40)
RE
2015/08/31 * 12
8D2W/12DSFA/14 -/0901-271(RF RE
1PE/141PE/141PE Selector)
/141PE/NS4906
310N
290213
RE
2016/04/22 * 12
SCC-C1/C2/C Coaxial Cable&RF
3/C4/C5/C10/ Selector
SRSE-03
SAF-03
Pre Amplifier
2016/02/25 * 12
SOS-05
Humidity Indicator
A&D
AD-5681
4062518
RE
2015/10/22 * 12
SLP-02
Loop Antenna
Rohde & Schwarz
HFH2-Z2
100218
RE
2015/11/14 * 12
SAT6-12
Attenuator
AT-406(40)
RE
2015/08/31 * 12
SCH-01
Temperature and
Humidity Chamber
Microwave Counter
HIROSE ELECTRIC
CO.,LTD.
Espec
PL-1KT
14020837
FT
2016/04/14 * 12
Agilent
53151A
US40511493
FT
2016/04/13 * 12
SFC-01
SSCA-01
Search coil
LANGER
RF-R 400-1
02-0634
FT, BW
Pre Check
SDPS-04
Power Supply(DC)
TEXIO
PW8-5ADPS
14086035
FT
Pre Check
SOS-09
Humidity Indicator
A&D
AD-5681
4061484
FT, BW
2015/12/07 * 12
KTS-07
Digital Tester
SANWA
PC500
7019232
FT
2015/11/18 * 12
STIM-02
Timer
RS
440 9574
FT
SSA-03
Spectrum Analyzer
Agilent
E4448A
MY48250152
BW
2015/09/16 * 12
The expiration date of the calibration is the end of the expired month .
As for some calibrations performed after the tested dates , those test equipment have been controlled by
means of an unbroken chains of calibrations .
All equipment is calibrated with valid calibrations . Each measurement data is traceable to the national or
international standards .
Test Item:
CE: Conducted emission ,
RE: Radiated emission ,
FT: Frequency Tolerance
BW: 20 dB Bandwidth
End of Report
UL Japan, Inc.
Page :
28 of 34
Download: DPTRP1 Digital Paper Test Report FCC _DXX Sony Corporation
Mirror Download [FCC.gov]DPTRP1 Digital Paper Test Report FCC _DXX Sony Corporation
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