Digital Paper Test Report Sony Corporation

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Test report No. : 11306371S-A-R1
Page : 1 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401 13-EM-F0429
RADIO TEST REPORT
Test Report No. : 11306371S-A-R1
Applicant : Sony Corporation
Type of Equipment : Digital Paper
Model No. : DPT-RP1
FCC ID : AK8DPTRP1
Test regulation : FCC Part 15 Subpart C: 2016
Test item : Antenna terminal conducted tests
Test Result : Complied
1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc.
2. The results in this report apply only to the sample tested.
3. This sample tested is in compliance with the above regulation.
4. The test results in this report are traceable to the national or international standards.
5. The opinions and the interpretations to the result of the description in this report are outside
scopes where UL Japan has been accredited.
6. This test report covers Radio technical requirements. It does not cover administrative issues
such as Manual or non-Radio test related Requirements. (if applicable)
7. This report is a revised version of 11306371S-A.
11306371S-A is replaced with this report.
Date of test: July 2, 2016
Representative test en
g
ineer:
Hiroyuki Morikawa
Engineer
Consumer Technology Division
Approved by:
Toyokazu Imamura
Leader
Consumer Technology Division
RTL02610
The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan.
There is no testing item of "Non-accreditation".
Test report No. : 11306371S-A-R1
Page : 2 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
REVISION HISTORY
Original Test Report No.: 11306371S-A
Revision Test report No. Date Page
revised
Contents
- (Original) 11306371S-A July 25, 2016 - -
1 11306371S-A-R1 July 27, 2016 4 Update of clock frequency
Test report No. : 11306371S-A-R1
Page : 3 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
CONTENTS PAGE
SECTION 1: Customer information ....................................................................................................... 4
SECTION 2: Equipment under test (E.U.T.) ......................................................................................... 4
SECTION 3: Test specification, procedures & results .......................................................................... 5
SECTION 4: Operation of E.U.T. during testing .................................................................................. 7
SECTION 5: Antenna Terminal Conducted Tests ................................................................................ 9
APPENDIX 1: Test data ........................................................................................................................ 10
20dB Bandwidth and Carrier Frequency Separation ......................................................................... 10
Number of Hopping Frequency ........................................................................................................ 13
Dwell time ......................................................................................................................................... 15
Maximum Peak Output Power .......................................................................................................... 18
Average Output Power ...................................................................................................................... 19
Conducted Spurious Emission .......................................................................................................... 21
Conducted Emission Band Edge compliance ................................................................................... 27
99%Occupied Bandwidth ................................................................................................................. 29
APPENDIX 2: Test instruments ........................................................................................................... 31
APPENDIX 3: Photographs of test setup ............................................................................................. 32
Test report No. : 11306371S-A-R1
Page : 4 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 1: Customer information
Company Name : Sony Corporation
Brand Name : SONY
Address : 1-7-1 Konan, Minato-ku, Tokyo 108-0075, Japan
SECTION 2: Equipment under test (E.U.T.)
2.1 Identification of E.U.T.
Type of Equipment : Digital Paper
Model No. : DPT-RP1
Serial No. : Refer to Section 4, Clause 4.2
Rating :
DC 3.7 V
Receipt Date of Sample : May 30, 2016
Country of Mass-production : Japan
Condition of EUT : Production prototype
(Not for Sale: This sample is equivalent to mass-produced items.)
Modification of EUT : No Modification by the test lab.
2.2 Product Description
Model: DPT-RP1 (referred to as the EUT in this report) is a Digital Paper.
Clock frequency : 156 MHz (CPLD), 667 MHz (LPDDR3), 200 MHz (eMMC), 40 MHz (WLAN/BT)
208 MHz (WLAN/BT), 32.768 kHz (clock) , 26 MHz (CPU), 27 MHz (NFC)
Radio Specification
Equipment name IEEE 802.11 22 MIMO a/b/g/n/ac Wireless LAN + Bluetooth + NFC
Frequency
of
operation
Bluetooth 2.4GHz band: 2402-2480 MHz (BDR (Basic Data Rate), EDR (Enhanced Data Rate), LE (Low Energy mode)
WLAN
2.4GHz band: 2412-2462 MHz (b,g,n(HT20));
W52 (U-NII-1): 5180-5240 MHz (a,n(HT20),ac(VHT20)) / 5190-5230 MHz (n(HT40),ac(VHT40)) / 5210 MHz (ac(VHT80));
W53 (U-NII-2A): 5260-5320 MHz (a,n(HT20),ac(VHT20)) / 5270-5310 MHz (n(HT40),ac(VHT40)) / 5290 MHz (ac(VHT80));
W56 (U-NII-2C): 5500-5720 MHz (a,n(HT20),ac(VHT20)) / 5510-5710 MHz (n(HT40),ac(VHT40)) / 5530-5690 MHz (ac(VHT80))
W58 (U-NII-3): 5745-5825 MHz (a,n(HT20),ac(VHT20)) / 5755-5795 MHz (n(HT40),ac(VHT40)) / 5775 MHz (ac(VHT80))
NFC 13.56 MHz
Operation mode Wi-Fi Bluetooth NFC
Channel spacing 5 MHz (2.4 GHz band), 20 MHz (W52, W53, W56, W58) 1 MHz (BDR, EDR), 2 MHz (LE) -
Bandwidth 20 MHz (b,g,a,n(HT20),ac(VHT20)),
40 MHz (n(HT40),ac(VTH40)), 80 MHz (ac(VHT80)) 79 MHz -
Type of modulation
DSSS: DBPSK, DQPSK, CCK
OFDM: BPSK, QPSK, 16QAM, 64QAM, 256QAM(*1)
(*1. 256QAM is only supported by 11ac mode.)
FHSS: GFSK
(*. EDR: GFSK+ /4-DQPSK, GFSK+ 8DPSK) ASK
Antenna antenna #A (Wi-Fi) antenna #B (Wi-Fi+Bluetooth)
Antenna type Loop
Antenna gain (Peak) 3.75 dBi (2.4 GHz), 2.81 dBi (5 GHz) (*.including cable loss) 1.38 dBi (2.4 GHz), 4.29 dBi (5 GHz) (*.including cable loss)
Antenna NFC antenna
Antenna type Loop
Card type type A, type F
Test report No. : 11306371S-A-R1
Page : 5 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 3: Test specification, procedures & results
3.1 Test Specification
Test Specification : FCC Part 15 Subpart C
FCC part 15 final revised on April 6, 2016.
Title :
FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators
Section 15.207 Conducted limits
Section 15.247 Operation within the bands 902-928MHz,
2400-2483.5MHz, and 5725-5850MHz
The EUT has been tested for compliance with FCC Part 15 Subpart B. Refer to the test report 11306371S-F.
3.2 Procedures and results
Item Test Procedure Specification Worst Margin Results Remarks
Conducted
Emission
FCC: ANSI C63.10-2013
6. Standard test methods
FCC: Section 15.207
- - *1)
IC: RSS-Gen 8.8 IC:
RSS-Gen 8.8
Carrier
Frequency
Separation
FCC: FCC Public Notice
DA 00-705
FCC: Section15.247(a)(1)
See data.
Complied Conducted
IC: - IC: RSS-247 5.1 (2)
20dB
Bandwidth
FCC: FCC Public Notice
DA 00-705
FCC: Section15.247(a)(1)
- Conducted
IC: - IC: RSS-247 5.1 (1)
Number of
Hopping
Frequency
FCC: FCC Public Notice
DA 00-705
FCC: Section15.247(a)(1)(iii)
Complied Conducted
IC: - IC: RSS-247 5.1 (4)
Dwell time
FCC: FCC Public Notice
DA 00-705
FCC: Section15.247(a)(1)(iii)
Complied Conducted
IC: - IC: RSS-247 5.1 (4)
Maximum
Peak
Output Power
FCC: FCC Public Notice
DA 00-705 FCC: Section15.247(a)(b)(1)
Complied Conducted
IC: RSS-Gen 6.12 IC: RSS-247 5.4 (2)
Spurious
Emission &
Band Edge
Compliance
FCC: FCC Public Notice
DA 00-705
FCC: Section15.247(d)
- Complied Conducted
*2)
IC: RSS-Gen 6.13 IC: RSS-247 5.5
RSS-Gen 8.9
RSS-Gen 8.10
Note: UL Japan, Inc.’s EMI Work Procedures No. 13-EM-W0420 and 13-EM-W0422.
*1) Refer to the test report: 11306372M-A.
*2) Refer to the test report: 11306372M-A for Radiated emission (above 30 MHz).
* In case any questions arise about test procedure, ANSI C63.10: 2013 is also referred.
FCC Part 15.31 (e)
This EUT provides stable voltage (DC 3.3 V and 1.8 V) constantly to RF transmitter regardless of input voltage.
Therefore, this EUT complies with the requirement.
FCC Part 15.203 Antenna requirement
It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the
equipment complies with the requirement.
Test report No. : 11306371S-A-R1
Page : 6 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
3.3 Addition to standard
Item Test Procedure Specification Worst margin Results Remarks
99% Occupied
Bandwidth
IC: RSS-Gen 6.6 IC: - N/A - Conducte
d
Other than above, no addition, exclusion nor deviation has been made from the standard.
3.4 Uncertainty
The following uncertainties have been calculated to provide a confidence level of 95 % using a coverage factor k = 2.
Shonan EM C Lab.
Uncertainty (+/-)
0.76 dB
0.79 dB
0.74 dB
1.08 dB
1.5 dB
1.7 dB
2.4 dB
2.5 dB
2.5 dB
0.66 %
0.012 %
Power M easurement above 1 GHz (Peak Detector)_SPM -07
Spurious emission (Conducted) 3 GHz-18 GHz
Antenna terminal test
Power Measurement above 1 GHz (Average Detector)_SPM-06
Power M easurement above 1 GHz (Peak Detector)_SPM -06
Power Measurement above 1 GHz (Average Detector)_SPM-07
Spurious emission (Conducted) 26.5 GHz-40 GHz
Bandwidth Measurement
Duty cycle and Time M easurement
Spurious emission (Conducted) below 1GHz
Spurious emission (Conducted) 1 GHz-3 GHz
Spurious emission (Conducted) 18 GHz-26.5 GHz
3.5 Test Location
UL Japan, Inc. Shonan EM C Lab.
1-22-3, Megumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN
Telephone: +81 463 50 6400, Facsimile: +81 463 50 6401
JAB Accreditation No. RTL02610
Test site IC Registration
Number
Width x Depth x
Height (m)
Size of reference ground plane (m) /
horizontal conducting plane
Maximum
measurement
distance
No.1 Semi-anechoic
chamber 2973D-1 20.6 x 11.3 x 7.65 20.6 x 11.3 10m
No.2 Semi-anechoic
chamber 2973D-2 20.6 x 11.3 x 7.65 20.6 x 11.3 10m
No.3 Semi-anechoic
chamber 2973D-3 12.7 x 7.7 x 5.35 12.7 x 7.7 5m
No.4 Semi-anechoic
chamber - 8.1 x 5.1 x 3.55 8.1 x 5.1 -
No.1 Shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 -
No.2 Shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 -
No.3 Shielded room - 6.3 x 4.7 x 2.7 6.3 x 4.7 -
No.4 Shielded room - 4.4 x 4.7 x 2.7 4.4 x 4.7 -
No.5 Shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 -
No.6 Shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 -
No.8 shielded room - 3.45 x 5.5 x 2.4 3.45 x 5.5 -
No.1 M easurement
room - 2.55 x 4.1 x 2.5 - -
3.6 Test data, Test instruments, and Test set up
Refer to APPENDIX.
Test report No. : 11306371S-A-R1
Page : 7 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 4: Operation of E.U.T. during testing
4.1 Operating Mode(s)
Bluetooth (BT): Transmitting (Tx), Payload: PRBS9
Details of Operating Mode(s)
Test Item Mode Tested frequenc
y
Spurious Emission (Conducted) Tx (Hopping Off) DH5, 3DH5 2402 MHz
2441 MHz
2480 MHz
Carrier Frequency Separation Tx (Hopping On) DH5, 3DH5 2402 MHz
2441 MHz
2480 MHz
20dB Bandwidth Tx (Hopping Off) DH5, 3DH5 2402 MHz
2441 MHz
2480 MHz
N
umber of Hopping Frequency Tx (Hopping On) DH5, 3DH5 -
Dwell time Tx (Hopping On),
-DH1, DH3, DH5
-3DH1, 3DH3, 3DH5
-
Maximum Peak Output Powe
Tx (Hopping Off) DH5, 2DH5, 3DH5 2402 MHz
2441 MHz
2480 MHz
Band Edge Compliance
(Conducted)
Tx DH5, 3DH5
-Hopping On
-Hopping Off
2402 MHz
2480 MHz
99% Occupied Bandwidth Tx DH5, 3DH5
-Hopping On
-Hopping Off
2402 MHz
2441 MHz
2480 MHz
*As a result of preliminary test, the formal test was performed with the above modes, which had the
maximum payload length (except Dwell time test)
*2DH mode (2Mb/s EDR: pi/4DQPSK) was excluded for other tests than power measurement by using
3DH mode (3 Mb/s EDR: 8DPSK) as a representative.
* It is considered that the non-tested packet type (e.g. inquiry) can be omitted as it is complied with above all
test items based on Bluetooth Core specification.
*EUT has the power settings by the software as follows;
Power settings: BDR: 2 dBm
EDR: 2 dBm
Software: DutApiMimoBtFmBridgeEth.exe Version 2.0.0.75
*This setting of software is the worst case.
Any conditions under the normal use do not exceed the condition of setting.
In addition, end users cannot change the settings of the output power of the product.
Test report No. : 11306371S-A-R1
Page : 8 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
: Standard Ferrite Core
4.2 Configuration and peripherals
Description of EUT and support equipment
No. Item Model number Serial number Manufacturer Remarks
A Digital Paper DPT-RP1 9002565 Sony Corporation EUT
B Laptop PC 7666-77J LV-B8PZ8 08/05 Lenovo -
C AC Adaptor 92P1213 11S92P1213Z1ZDDZ92C2B0 Lenovo -
List of cables used
No. Name Len
g
th (m) Shield Remarks
Cable Connector
1 USB 1.0 Shielded Shielded -
2 DC 1.8 Unshielded Unshielded -
3 AC 1.0 Unshielded Unshielded -
1
B
A: EUT
C AC 100V
50 Hz
2 3
Test report No. : 11306371S-A-R1
Page : 9 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
SECTION 5: Antenna Terminal Conducted Tests
Test Procedure
The tests were made with below setting connected to the antenna port.
Test Span RBW VBW Sweep time Detector Trace Instrument used
20dB Bandwidth 3 MHz 30 kHz 100 kHz Auto Pea
k
Max Hold Spectrum Analyze
r
99% Occupied
Bandwidth
Enough width to display
emission skirts
1 to 5 %
of OBW
Three
times
of RBW
Auto Sample Max Hold
*1)
Spectrum Analyze
r
Maximum Peak
Output Power
- - - Auto Pea
k
Average
*3)
- Power Mete
r
(Sensor: 50MHz BW)
Carrier Frequency
Separation
3 MHz 100 kHz 300 kHz Auto Pea
k
Max Hold Spectrum Analyze
r
Number of Hopping
Frequency
30 MHz 300 kHz 1 MHz Auto Pea
k
Max Hold Spectrum Analyze
r
Dwell Time Zero Span 100 kHz,
1 MHz
300 kHz,
3 MHz
As necessary
capture
the entire dwell time
per hopping channel
Pea
k
Clear
Write
Spectrum Analyze
r
Conducted Spurious
Emission *2)
9 kHz to 150 kHz 200 Hz 620 Hz Auto Pea
k
Max Hold Spectrum Analyze
r
150 kHz to 30 MHz 10 kHz 27 kHz
30 MHz to 25 GHz 100 kHz 300 kHz
Conducted Spurious
Emission Band
Edge
compliance
10 MHz 100 kHz 300 kHz Auto Pea
k
Max Hold Spectrum Analyze
r
*1) The measurement was performed with Max Hold since the duty cycle was not 100 %.
*2) In the frequency range below 30MHz, RBW was narrowed to separate the noise contents.
Then, wide-band noise near the limit was checked separately, however the noise was not detected as shown in the chart.
(9 kHz -150 kHz: RBW = 200 Hz, 150 kHz - 30 MHz: RBW = 10 kHz) *3) Reference data
The test results and limit are rounded off to two decimals place, so some differences might be observed.
Test data : APPENDIX
Test result : Pass
Test report No. : 11306371S-A-R1
Page : 10 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
APPENDIX 1: Test data
20dB Bandwidth and Carrier Frequency Separation
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, DH5
Mode Freq. 20dB Bandwidth Carrier Frequency Limit for Carrier
Separation Frequency separation
[MHz] [MHz] [MHz] [MHz]
DH5 2402.0 0.978 1.000 >= 0.652
DH5 2441.0 0.979 1.000 >= 0.653
DH5 2480.0 0.976 1.000 >= 0.651
3DH5 2402.0 1.300 1.000 >= 0.866
3DH5 2441.0 1.299 1.000 >= 0.866
3DH5 2480.0 1.299 1.000 >= 0.866
Limit: Two-thirds of 20dB Bandwidth or 25kHz (whichever is grea
t
←リミット文を選択する
No limit applies to 20dB Bandwidth. リミットがかわります。
Test report No. : 11306371S-A-R1
Page : 11 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
20dB Bandwidth and Carrier Frequency Separation
DH5
20 dB Bandwidth Carrier Frequency Separation
2402 MHz 2402 MHz
2441 MHz 2441 MHz
2480 MHz 2480 MHz
Test report No. : 11306371S-A-R1
Page : 12 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
20dB Bandwidth and Carrier Frequency Separation
3DH5
20 dB Bandwidth Carrier Frequency Separation
2402 MHz 2402 MHz
2441MHz 2441 MHz
2480MHz 2480 MHz
Test report No. : 11306371S-A-R1
Page : 13 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Number of Hopping Frequency
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping On
Mode Number of channel Limit
[channels] [channels]
DH5 79 >= 15
3DH5 79 >= 15
Test was not performed at AFH mode whose number of hopping channel is 20 channels because this Bluetooth radio
is in compliance of Bluetooth Specification.
Test report No. : 11306371S-A-R1
Page : 14 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Number of Hopping Frequency
DH5 3DH5
Hopping On (1/3) Hopping On (1/3)
Hopping On (2/3) Hopping On (2/3)
Hopping On (3/3) Hopping On (3/3)
Test report No. : 11306371S-A-R1
Page : 15 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Dwell time
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping On
Mode Length of Result Limit
transmission
[msec] [msec] [msec]
DH1 49.6 times / 5 sec. x 31.6 sec. = 314 times 0.398 125 400
DH3 26.2 times / 5 sec. x 31.6 sec. = 166 times 1.657 275 400
DH5 17.8 times / 5 sec. x 31.6 sec. = 113 times 2.908 329 400
3DH1 50.4 times / 5 sec. x 31.6 sec. = 319 times 0.406 130 400
3DH3 27.0 times / 5 sec. x 31.6 sec. = 171 times 1.663 284 400
3DH5 18.6 times / 5 sec. x 31.6 sec. = 118 times 2.927 345 400
Sample Calculation
Result = Number of transmission x Length of transmission
*Average data of 5 tests.(except Inquiry)
Mode Average
12345[times]
DH1 49 50 50 50 49 49.6
DH3 27 22 28 26 28 26.2
DH5 19 16 19 14 21 17.8
3DH1 49 51 51 51 50 50.4
3DH3 27 22 26 32 28 27
3DH5 25 18 16 13 21 18.6
Sample Calculation
Average = Summation (Sampling 1 to 5) / 5
Number of transmission
in a 31.6(79 Hopping x 0.4)
/ 12.8 (32 Hopping x 0.4) second period
Sampling [times]
This device complies with the Bluetooth protocol for FHSS operation, employing a pseudo random channel selection
and hopping rate to ensure that the occupancy time in N x 0.4s, where N is the number of channels being used in the
hopping sequence (20 N 79), is always less than 0.4s regardless of packet size. This is confirmed in the test report
for N = 79.
Test report No. : 11306371S-A-R1
Page : 16 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Dwell time
DH1 (1/2)
(Representative chart)
DH1 (2/2)
DH3 (1/2)
(Representative chart)
DH3 (2/2)
DH5 (1/2)
(Representative chart)
DH5 (2/2)
Test report No. : 11306371S-A-R1
Page : 17 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Dwell time
3DH1 (1/2)
(Representative chart)
3DH1 (2/2)
3DH3 (1/2)
(Representative chart)
3DH3 (2/2)
3DH5 (1/2)
(Representative chart)
3DH5 (2/2)
Test report No. : 11306371S-A-R1
Page : 18 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Maximum Peak Output Power
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off
Mode Freq. Reading Cable Atten. Margin
Loss Loss
[MHz] [dBm] [dB] [dB] [dBm] [mW] [dBm] [mW] [dB]
DH5 2402.0 -9.59 2.00 9.92 2.33 1.71 20.96 125 18.63
DH5 2441.0 -9.71 2.05 9.92 2.26 1.68 20.96 125 18.70
DH5 2480.0 -9.85 2.04 9.92 2.11 1.63 20.96 125 18.85
2DH5 2402.0 -6.15 2.00 9.92 5.77 3.78 20.96 125 15.19
2DH5 2441.0 -6.36 2.05 9.92 5.61 3.64 20.96 125 15.35
2DH5 2480.0 -6.56 2.04 9.92 5.40 3.47 20.96 125 15.56
3DH5 2402.0 -5.86 2.00 9.92 6.06 4.04 20.96 125 14.90
3DH5 2441.0 -6.04 2.05 9.92 5.93 3.92 20.96 125 15.03
3DH5 2480.0 -6.27 2.04 9.92 5.69 3.71 20.96 125 15.27
Sample Calculation:
Result = Reading + Cable Loss (including the cable(s) customer supplied) + Attenuator Loss
*The equipment and cables were not used for factor 0 dB of the data sheets.
Resul
t
Limit
Test was not performed at AFH mode, because the decrease of number of channel (min: 20ch) at AFH mode does not influence on the output power
and bandwidth of the EUT.
As this device had AFH mode and frequency separation could not meet the requirement of over 20dB BW without 2/3 relaxation, 125mW power
limit was applied to it.
Test report No. : 11306371S-A-R1
Page : 19 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Average Output Power
(Reference data for SAR testing)
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off
Mode Freq. Reading Cable Atten. Duty
Loss Loss factor
[MHz] [dBm] [dB] [dB] [dBm] [mW] [dB] [dBm] [mW]
DH5 2402.0 -11.11 2.00 9.92 0.81 1.21 1.11 1.92 1.56
DH5 2441.0 -11.18 2.05 9.92 0.79 1.20 1.11 1.90 1.55
DH5 2480.0 -11.29 2.04 9.92 0.67 1.17 1.11 1.78 1.51
2DH5 2402.0 -9.97 2.00 9.92 1.95 1.57 1.11 3.06 2.02
2DH5 2441.0 -10.19 2.05 9.92 1.78 1.51 1.11 2.89 1.95
2DH5 2480.0 -10.42 2.04 9.92 1.54 1.43 1.11 2.65 1.84
3DH5 2402.0 -9.98 2.00 9.92 1.94 1.56 1.11 3.05 2.02
3DH5 2441.0 -10.18 2.05 9.92 1.79 1.51 1.11 2.90 1.95
3DH5 2480.0 -10.42 2.04 9.92 1.54 1.43 1.11 2.65 1.84
Sample Calculation:
Result (Time average) = Reading + Cable Loss (including the cable(s) customer supplied) + Attenuator Loss
Result (Burst power average) = Frame power + Duty facto
r
*The equipment and cables were not used for factor 0 dB of the data sheets.
Resul
t
Result
(Time average) (Burst power average)
Test report No. : 11306371S-A-R1
Page : 20 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Burst Rate Confirmation
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off
DH5
Tx on / (Tx on + Tx off) =
0.774
Tx on / (Tx on + Tx off) * 100 =
77.4 %
Duty factor = 10 * log (3.751 / 2.902) =
1.11 dB
2DH5 3DH5
Tx on / (Tx on + Tx off) =
0.774
Tx on / (Tx on + Tx off) * 100 =
77.4 %
Duty factor = 10 * log (3.749 / 2.901) =
1.11 dB
Tx on / (Tx on + Tx off) =
0.774
Tx on / (Tx on + Tx off) * 100 =
77.4 %
Duty factor = 10 * log (3.749 / 2.901) =
1.11 dB
Test report No. : 11306371S-A-R1
Page : 21 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Spurious Emission
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, DH5
2402 MHz
9 kHz - 150 kHz 150 kHz - 30 MHz
30 MHz - 25 GHz
Test report No. : 11306371S-A-R1
Page : 22 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Spurious Emission
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, DH5
2441 MHz
9 kHz – 150 kHz 150 kHz – 30 MHz
30 MHz – 25 GHz
Test report No. : 11306371S-A-R1
Page : 23 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Spurious Emission
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, DH5
2480 MHz
9 kHz – 150 kHz 150 kHz – 30 MHz
30 MHz – 25 GHz
Test report No. : 11306371S-A-R1
Page : 24 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Spurious Emission
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, 3DH5
2402 MHz
9 kHz – 150 kHz 150 kHz – 30 MHz
30 MHz – 25 GHz
Test report No. : 11306371S-A-R1
Page : 25 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Spurious Emission
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, 3DH5
2441 MHz
9 kHz - 150 kHz 150 kHz - 30 MHz
30 MHz - 25 GHz
Test report No. : 11306371S-A-R1
Page : 26 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Spurious Emission
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx, Hopping Off, 3DH5
2480 MHz
9 kHz - 150 kHz 150 kHz - 30 MHz
30 MHz - 25 GHz
Test report No. : 11306371S-A-R1
Page : 27 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Emission Band Edge compliance
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx DH5
Hopping On
Low High
Hopping Off
Low High
Test report No. : 11306371S-A-R1
Page : 28 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
Conducted Emission Band Edge compliance
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx 3DH5
Hopping On
Low High
Hopping Off
Low High
Test report No. : 11306371S-A-R1
Page : 29 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
99%Occupied Bandwidth
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx Hopping Off
Hopping Off, DH5 Hopping Off, 3DH5
2402 MHz 2402 MHz
2441 MHz 2441 MHz
2480 MHz 2480 MHz
Test report No. : 11306371S-A-R1
Page : 30 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
99% Occupied Bandwidth
Test place Shonan EMC Lab. No.5 Shielded Room
Report No. 11306371S-A-R1
Date July 2, 2016
Temperature / Humidity 25 deg. C / 51 % RH
Engineer Hiroyuki Morikawa
Mode Tx Hopping On
Hopping On, DH5 Hopping On, 3DH5
Test report No. : 11306371S-A-R1
Page : 31 of 32
Issued date : July 27, 2016
FCC ID : AK8DPTRP1
UL Japan, Inc.
Shonan EMC Lab.
1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN
Telephone : +81 463 50 6400
Facsimile : +81 463 50 6401
APPENDIX 2: Test instruments
Test equipment
Control No. Instrument Manufacturer Model No Serial No Test Item Calibration Date *
Interval(month)
KSA-08 Spectrum Analyzer Agilent E4446A MY4618052
5
AT 2016/03/28 * 12
SAT10-10 Attenuator Weinschel Corp. 54A-10 37584 AT 2016/04/18 * 12
SCC-G31 Coaxial Cable Junkosha MWX241-0100
0KMSKMS
OCT-08-13-
046
AT 2016/04/18 * 12
SPM-07 Power Meter Agilent 8990B MY5100272 AT 2016/04/04 * 12
SPSS-04 Power sensor Agilent N1923A MY5326009 AT 2016/04/04 * 12
STM-G4 Terminator Weinschel M1459A U6592 AT 2015/07/14 * 12
SOS-09 Humidity Indicator A&D AD-5681 4061484 AT 2015/12/07 * 12
The expiration date of the calibration is the end of the expired month.
All equipment is calibrated with valid calibrations. Each measurement data is traceable to the national or
international standards.
As for some calibrations performed after the tested dates, those test equipment have been controlled by means
of an unbroken chains of calibrations.
Test Item: AT: Antenna Terminal Conducted test
Download: Digital Paper Test Report  Sony Corporation
Mirror Download [FCC.gov]Digital Paper Test Report  Sony Corporation
Document ID3306998
Application IDFYWlqjl4mcphSfAW7528KQ==
Document DescriptionFCC Test Report_DSS-b
Short Term ConfidentialNo
Permanent ConfidentialNo
SupercedeYes
Document TypeTest Report
Display FormatAdobe Acrobat PDF - pdf
Filesize836001
Date Submitted2017-03-08 00:00:00
Date Available2017-03-09 00:00:00
Creation Date2016-07-25 07:57:27
Producing SoftwareAcrobat Distiller 10.1.2 (Windows)
Document Lastmod2016-07-27 15:58:46
Document CreatorPScript5.dll Version 5.2.2

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