IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.

Hangzhou Great Star Industrial Co., Ltd. Security Keypad

FCC ID Filing: 2AMI2IL02
Purchase on Amazon: Security Keypad

Trouble Viewing? See the or view the HTML Version or PDF in frame
Page 1 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 2 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 3 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 4 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 5 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 6 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 7 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 8 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 9 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 10 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 11 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 12 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 13 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 14 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 15 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 16 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 17 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 18 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 19 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 20 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 21 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 22 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 23 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 24 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 25 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 26 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 27 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 28 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 29 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 30 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 31 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 32 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 33 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 34 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 35 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 36 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 37 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 38 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 39 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 40 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 41 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 42 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 43 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 44 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Page 45 of IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.

Shenzhen Huaxia Testing Technology Co., Ltd
1F., Block A of Tongsheng Technology Building, Huahui Road, Dalang Street, Longhua District,
Shenzhen, China
Telephone:
Fax:
Website:
+86-755-26648640
+86-755-26648637
www.cqa-cert.com
Report Template Version: V03
Report Template Revision Date: Mar.1st, 2017
FCC/IC Test Report
Cover page
Report No. :
CQSZ20180500204EW-01
Applicant:
Hangzhou Great Star Industrial Co., Ltd.
Address of Applicant:
No.35, Jiuhuan Road, Jiubao Town, Jianggan District, Hangzhou 310019, China
Manufacturer:
Hangzhou Great Star Industrial Co., Ltd.
Address of
Manufacturer:
No.35, Jiuhuan Road, Jiubao Town, Jianggan District, Hangzhou 310019, China
Equipment Under Test (EUT):
Product:
Security Keypad
Model No.:
iL02_1
Brand Name:
FCC ID:
IC:
2AMI2IL02
22853-IL02
Standards:
47 CFR Part 15, Subpart C
RSS-247 Issue 2 February 2017
RSS-Gen Issue 5 Nov 2018
Date of Test:
2018-06-01 to 2018-06-19
Date of Issue:
2018-06-19
Test Result :
PASS*
Tested By:
(Aaron Ma)
Reviewed By:
( Owen Zhou)
Approved By:
( Jack Ai)
* In the configuration tested, the EUT complied with the standards specified above.
The test report is effective only with both signature and specialized stamp, The result(s) shown in this report refer only to the sample(s)
tested. Without written approval of CQA, this report can’t be reproduced except in full.
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
2 Version
Revision History Of Report
Report No.
Version
Description
Issue Date
CQSZ20180500204EW-01
Rev.01
Initial report
2018-06-19
Page:2 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
3 Test Summary
Test Item
Test Requirement
Test method
Result
ANSI C63.10 2013
PASS
ANSI C63.10 2013
N/A
KDB558074 D01 v04
PASS
KDB558074 D01 v04
PASS
RSS-Gen Issue 5
RSS-Gen Issue 5
PASS
47 CFR Part 15, Subpart C Section
15.247 (e),
KDB558074 D01 v04
PASS
KDB558074 D01 v04
PASS
KDB558074 D01 v04
PASS
ANSI C63.10 2013
PASS
ANSI C63.10 2013
PASS
47 CFR Part 15, Subpart C Section
Antenna Requirement
15.203/15.247 (c),
RSS-Gen Issue 5
AC Power Line
Conducted
Emission
Conducted Peak &
Average Output
Power
6dB Occupied
Bandwidth
99% Occupied
Bandwidth
Power Spectral Density
47 CFR Part 15, Subpart C Section
15.207,
RSS-Gen Issue 5
47 CFR Part 15, Subpart C Section
15.247 (b)(3),
RSS 247 5.4(4)
47 CFR Part 15, Subpart C Section
15.247 (a)(2),
RSS 247 5.2(1)
RSS 247 5.2(2)
Band-edge for RF
Conducted Emissions
RF Conducted Spurious
Emissions
Radiated Spurious
Emissions
Restricted bands around
fundamental frequency
(Radiated Emission)
47 CFR Part 15, Subpart C Section
15.247(d),
RSS 247 5.5
47 CFR Part 15, Subpart C Section
15.247(d),
RSS 247 5.5
47 CFR Part 15, Subpart C Section
15.205/15.209,
RSS-Gen Issue 5
47 CFR Part 15, Subpart C Section
15.205/15.209,
RSS-Gen Issue 5
N/A: Not Applicable
Page:3 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Contents
Page
COVER PAGE ...................................................................................................................................................... 1
VERSION .............................................................................................................................................................. 2
TEST SUMMARY ................................................................................................................................................ 3
CONTENTS .......................................................................................................................................................... 4
GENERAL INFORMATION ................................................................................................................................ 5
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
CLIENT INFORMATION ................................................................................................................................... 5
GENERAL DESCRIPTION OF EUT ................................................................................................................. 5
TEST ENVIRONMENT AND MODE .................................................................................................................. 7
DESCRIPTION OF SUPPORT UNITS ............................................................................................................... 7
TEST LOCATION ............................................................................................................................................ 7
TEST FACILITY .............................................................................................................................................. 7
STATEMENT OF THE MEASUREMENT UNCERTAINTY ..................................................................................... 8
DEVIATION FROM STANDARDS ..................................................................................................................... 8
ABNORMALITIES FROM STANDARD CONDITIONS ......................................................................................... 8
OTHER INFORMATION REQUESTED BY THE CUSTOMER .............................................................................. 8
EQUIPMENT LIST ........................................................................................................................................... 9
TEST RESULTS AND MEASUREMENT DATA........................................................................................... 10
6.1
ANTENNA REQUIREMENT ............................................................................................................................ 10
6.2
CONDUCTED PEAK & AVERAGE OUTPUT POWER ..................................................................................... 11
6.3
6DB OCCUPY BANDWIDTH ......................................................................................................................... 12
6.4
99% OCCUPY BANDWIDTH......................................................................................................................... 15
6.5
POWER SPECTRAL DENSITY ...................................................................................................................... 18
6.6
BAND-EDGE FOR RF CONDUCTED EMISSIONS .......................................................................................... 21
6.7
RF CONDUCTED SPURIOUS EMISSIONS .................................................................................................... 23
6.8
RADIATED SPURIOUS EMISSIONS............................................................................................................... 29
6.8.1 Radiated emission below 1GHz ......................................................................................................... 32
6.8.2 Transmitter emission above 1GHz .................................................................................................... 34
6.9
RESTRICTED BANDS AROUND FUNDAMENTAL FREQUENCY ....................................................................... 40
Page:4 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
General Information
5.1 Client Information
Applicant:
Hangzhou Great Star Industrial Co., Ltd.
Address of Applicant:
No.35, Jiuhuan Road, Jiubao Town, Jianggan District, Hangzhou
310019, China
Manufacturer:
Hangzhou Great Star Industrial Co., Ltd.
Address of Manufacturer:
No.35, Jiuhuan Road, Jiubao Town, Jianggan District, Hangzhou
310019, China
5.2 General Description of EUT
Product Name:
Security Keypad
Model No.:
iL02_1
Trade Mark:
Hardware version:
100
Software version:
268460592(hex:0x10006230)
Operation Frequency:
2405~2480MHz
Channel Numbers:
16
Channel Separation:
5MHz
Type of Modulation:
O-QPSK
Sample Type:
Mobile production
Test Software of EUT:
Secure CRT (manufacturer declare )
Antenna Type:
PCB antenna
Antenna Gain:
0.3dBi
Power Supply:
4*AA battery, DC6V
Page:5 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Operation Frequency each of channel
Channel
Frequency
Channel
Frequency
Channel
Frequency
Channel
Frequency
11
2405MHz
15
2425MHz
19
2445MHz
23
2465MHz
12
2410MHz
16
2430MHz
20
2450MHz
24
2470MHz
13
2415MHz
17
2435MHz
21
2455MHz
25
2475MHz
14
Note:
2420MHz
18
2440MHz
22
2460MHz
26
2480MHz
In section 15.31(m), regards to the operating frequency range over 10 MHz, the Lowest frequency, the
middle frequency, and the highest frequency of channel were selected to perform the test, and the selected
channel see below:
Channel
Frequency
The Lowest channel
2405MHz
The Middle channel
2440MHz
The Highest channel
2480MHz
Note:
Software (Secure CRT) provided by client enabled the EUT to transmit and receive data at lowest, middle
and highest channel individually.
Page:6 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
5.3 Test Environment and Mode
Operating Environment:
Temperature:
24.0 C
Humidity:
52 % RH
Atmospheric
Pressure:
1008 mbar
Test mode:
Transmitting
mode:
Continuous traffic was generated using test commands. The device was
programmed to transmit at 100% duty cycle at low, middle, and high channels
5.4 Description of Support Units
The EUT has been tested with associated equipment below.
Description
Manufacturer
Model No.
Remark
FCC certification
PC
Lenovo
ThinkPad E450c
Provide by lab
ID
AC/DC Adapter
Lenovo
PA-1450-55LN
Provide by lab
DOC
5.5 Test Location
All tests were performed at:
Shenzhen Huaxia Testing Technology Co., Ltd.,
1F., Block A of Tongsheng Technology Building, Huahui Road, Dalang Street, Longhua New District,
Shenzhen, Guangdong, China
5.6 Test Facility
The test facility is recognized, certified, or accredited by the following organizations:
• CNAS (No. CNAS L5785)
CNAS has accredited Shenzhen Huaxia Testing Technology Co., Ltd. Shenzhen Branch EMC
Lab to ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration
Laboratories (CNAS-CL01 Accreditation Criteria for the Competence of Testing and Calibration
Laboratories) for the competence in the field of testing.
• ISED Registration No.: 22984-1
The 3m Semi-anechoic chamber of Shenzhen Huaxia Testing Technology Co., Ltd. has been
registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing
• A2LA (Certificate No. 4742.01)
Shenzhen Huaxia Testing Technology Co., Ltd., Shenzhen EMC Laboratory is accredited by the
American Association for Laboratory Accreditation(A2LA). Certificate No. 4742.01.
• FCC Registration No.: 522263
Shenzhen Huaxia Testing Technology Co., Ltd., Shenzhen EMC Laboratory has been registered and
fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance
letter from the FCC is maintained in our files. Registration No.:522263
Page:7 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
5.7 Statement of the measurement uncertainty
The data and results referenced in this document are true and accurate.
The reader is cautioned that there may be errors within the calibration limits of the equipment and
facilities.
The measurement uncertainty was calculated for all measurements listed in this test report acc. to
CISPR 16 - 4 „Specification for radio disturbance and immunity measuring apparatus and methods –
Part 4: Uncertainty in EMC Measurements“ and is documented in the Shenzhen Huaxia Testing
Technology Co., Ltd. quality system acc. to DIN EN ISO/IEC 17025.
Furthermore, component and process variability of devices similar to that tested may result in
additional deviation. The manufacturer has the sole responsibility of continued compliance of the
device.
Hereafter the best measurement capability for CQA laboratory is reported:
Test
Range
Uncertainty
Notes
Radiated Emission
Below 1GHz
±5.12dB
(1)
Radiated Emission
Above 1GHz
±4.60dB
(1)
Conducted
Disturbance
0.15~30MHz
±3.34dB
(1)
(1)This uncertainty represents an expanded uncertainty expressed at approximately the 95%
confidence level using a coverage factor of k=2.
5.8 Deviation from Standards
None.
5.9 Abnormalities from Standard Conditions
None.
5.10
Other Information Requested by the Customer
None.
Page:8 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
5.11
Equipment List
Item
Test Equipment
Manufacturer
Model No.
Instrument
No.
Calibration
Due Date
EMI Test Receiver
R&S
ESR7
CQA-005
2018/9/24
Spectrum analyzer
R&S
FSU26
CQA-038
2018/9/24
Preamplifier
MITEQ
CQA-035
2018/9/24
Preamplifier
MITEQ
CQA-036
2018/9/24
Loop antenna
ZHINAN
ZN30900A
CQA-087
2019/3/21
Bilog Antenna
R&S
HL562
CQA-011
2018/9/24
Horn Antenna
R&S
HF906
CQA-012
2018/9/24
Horn Antenna
R&S
BBHA 9170
CQA-088
2018/9/24
CQA
RE-low-01
CQA-077
2018/9/24
CQA
RE-high-02
CQA-078
2018/9/24
10
Coax cable
(9KHz~40GHz)
Coax cable
(9KHz~40GHz)
AFS4-0001030018-10P-4
AMF-6D-0200180029-20P
11
Antenna Connector
CQA
RFC-01
CQA-080
2018/9/24
12
RF cable(9KHz~40GHz)
CQA
RF-01
CQA-079
2018/9/24
13
Power Sensor
Anritsu
MA2411B
CQA-089
2018/9/24
Meter
Anritsu
CQA-090
Power divider
CQA
ML2495A
PWD-2533-02SMA-79
Wideband Peak Power
14
15
CQA-067
2018/9/24
2018/9/29
Note:
The temporary antenna connector is soldered on the PCB board in order to perform conducted tests and
this temporary antenna connector is listed in the equipment list.
Page:9 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6 Test results and Measurement Data
6.1 Antenna Requirement
Standard requirement:
47 CFR Part 15C Section 15.203 /247(c),
RSS-Gen Issue 5
15.203 requirement:
An intentional radiator shall be designed to ensure that no antenna other than that furnished by the
responsible party shall be used with the device. The use of a permanently attached antenna or of an
antenna that uses a unique coupling to the intentional radiator, the manufacturer may design the unit
so that a broken antenna can be replaced by the user, but the use of a standard antenna jack or
electrical connector is prohibited.
15.247(b) (4) requirement:
The conducted output power limit specified in paragraph (b) of this section is based on the use of
antennas with directional gains that do not exceed 6 dBi. Except as shown in paragraph (c) of this
section, if transmitting antennas of directional gain greater than 6 dBi are used, the conducted output
power from the intentional radiator shall be reduced below the stated values in paragraphs (b)(1),
(b)(2), and (b)(3) of this section, as appropriate, by the amount in dB that the directional gain of the
antenna exceeds 6 dBi.
EUT Antenna:
The antenna is PCB antenna. The best case gain of the antenna is 0.3dBi.
Page:10 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.2 Conducted Peak & Average Output Power
Test Requirement:
47 CFR Part 15C Section 15.247 (b)(3),
RSS 247 5.4(4)
Test Method:
KDB558074 D01 v04
Test Setup:
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Limit:
30dBm
Test Results:
Pass
Measurement Data
O-QPSK mode
Test channel
Peak Output Power
Average Output
Limit (dBm)
Result
(dBm)
Power (dBm)
Lowest
16.93
16.67
30.00
Pass
Middle
17.01
16.76
30.00
Pass
Highest
16.97
16.73
30.00
Pass
Page:11 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.3 6dB Occupy Bandwidth
Test Requirement:
47 CFR Part 15C Section 15.247 (a)(2),
RSS 247 5.2(1)
Test Method:
KDB558074 D01 v04
Test Setup:
Remark: Offset = cable loss + attenuation factor
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Limit:
≥ 500 kHz
Test Results:
Pass
Measurement Data
O-QPSK mode
Test channel
6dB Occupy Bandwidth (MHz)
Limit (kHz)
Result
Lowest
1.660
≥500
Pass
Middle
1.650
≥500
Pass
Highest
1.625
≥500
Pass
Page:12 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test plot as follows:
Graphs
Ref
25 dBm
Offset
* Att
20 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
Delta 3 [T1 ]
-0.24 dB
5 ms
1.660000000 MHz
Marker 1 [T1 ]
10.4 dB
20
3.72 dBm
2.404300000 GHz
1 PK
10
VIEW
Marker 2 [T1 ]
D1 3.833 dBm
9.83 dBm
2.405625000 GHz
LVL
-10
-20
LCH
-30
3DB
-40
-50
-60
-70
Center
2.405 GHz
Date: 15.JUN.2018
Ref
17:23:19
25 dBm
Offset
500 kHz/
* Att
20 dB
Span
* RBW
100 kHz
* VBW
300 kHz
SWT
5 MHz
Delta 3 [T1 ]
-0.51 dB
5 ms
1.650000000 MHz
Marker 1 [T1 ]
10.3 dB
20
3.33 dBm
2.439305000 GHz
1 PK
Marker 2 [T1 ]
10
9.67 dBm
VIEW
D1 3.667 dBm
2.439875000 GHz
LVL
-10
-20
MCH
-30
3DB
-40
-50
-60
-70
Center
2.44 GHz
Date: 15.JUN.2018
500 kHz/
17:27:11
Page:13 of 45
Span
5 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Ref
25 dBm
Offset
* Att
20 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
Delta 3 [T1 ]
0.28 dB
5 ms
1.625000000 MHz
Marker 1 [T1 ]
10.3 dB
20
3.23 dBm
2.479325000 GHz
1 PK
10
VIEW
D1 3.994 dBm
Marker 2 [T1 ]
9.99 dBm
2.479875000 GHz
LVL
-10
-20
HCH
-30
3DB
-40
-50
-60
-70
Center
2.48 GHz
Date: 15.JUN.2018
500 kHz/
17:33:30
Page:14 of 45
Span
5 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.4 99% Occupy Bandwidth
Test Requirement:
Test Method:
RSS-Gen Issue 5
RSS-Gen Issue 5
Test Setup:
Remark: Offset = cable loss + attenuation factor
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Limit:
N/A
Test Results:
Pass
Measurement Data
O-QPSK mode
Test channel
99% Occupy Bandwidth (MHz)
Limit (kHz)
Result
Lowest
2.275
---
Pass
Middle
2.275
---
Pass
Highest
2.280
---
Pass
Page:15 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test plot as follows:
Graphs
Ref
25 dBm
Offset
* Att
20 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
Marker 1 [T1 ]
9.81 dBm
5 ms
2.405365000 GHz
OBW
10.4 dB
20
2.275000000 MHz
Temp 1 [T1 OBW]
-3.44 dBm
1 PK
2.403985000 GHz
10
Temp 2 [T1 OBW]
VIEW
-3.22 dBm
T2
T1
2.406260000 GHz
LVL
-10
-20
LCH
-30
3DB
-40
-50
-60
-70
Center
2.405 GHz
Date: 15.JUN.2018
Ref
17:23:36
25 dBm
Offset
500 kHz/
* Att
20 dB
Span
* RBW
100 kHz
* VBW
300 kHz
SWT
Marker 1 [T1 ]
9.43 dBm
5 ms
2.439885000 GHz
OBW
10.3 dB
20
5 MHz
2.275000000 MHz
Temp 1 [T1 OBW]
-4.02 dBm
1 PK
10
2.438990000 GHz
Temp 2 [T1 OBW]
VIEW
-3.88 dBm
2.441265000 GHz
LVL
T2
T1
-10
-20
MCH
-30
3DB
-40
-50
-60
-70
Center
2.44 GHz
Date: 15.JUN.2018
500 kHz/
17:27:29
Page:16 of 45
Span
5 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Ref
25 dBm
Offset
* Att
20 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
Marker 1 [T1 ]
9.58 dBm
5 ms
2.480635000 GHz
OBW
10.3 dB
20
2.280000000 MHz
Temp 1 [T1 OBW]
-4.01 dBm
1 PK
10
2.478990000 GHz
Temp 2 [T1 OBW]
VIEW
-3.92 dBm
2.481270000 GHz
LVL
T2
T1
-10
-20
HCH
-30
3DB
-40
-50
-60
-70
Center
2.48 GHz
Date: 15.JUN.2018
500 kHz/
17:33:47
Page:17 of 45
Span
5 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.5 Power Spectral Density
Test Requirement:
47 CFR Part 15C Section 15.247 (e),
RSS 247 5.2(2)
Test Method:
KDB558074 D01 v04
Test Setup:
Remark: Offset = cable loss + attenuation factor
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Limit:
≤8.00dBm/3kHz
Test Results:
Pass
Measurement Data
O-QPSK mode
Test channel
Power Spectral Density (dBm/3kHz)
Limit (dBm/3kHz)
Result
Lowest
-1.45
≤8.00
Pass
Middle
-2.27
≤8.00
Pass
Highest
-2.89
≤8.00
Pass
Page:18 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test plot as follows:
Graphs
Ref
25 dBm
Offset
* Att
20 dB
* RBW
3 kHz
* VBW
10 kHz
-1.45 dBm
SWT
280 ms
2.405560250 GHz
Marker 1 [T1 ]
10.4 dB
20
1 PK
10
VIEW
LVL
-10
-20
LCH
-30
3DB
-40
-50
-60
-70
Center
2.405 GHz
Date: 15.JUN.2018
Ref
17:24:28
25 dBm
Offset
249 kHz/
* Att
20 dB
Span
2.49 MHz
* RBW
3 kHz
* VBW
10 kHz
-2.27 dBm
SWT
280 ms
2.440559350 GHz
Marker 1 [T1 ]
10.3 dB
20
1 PK
10
VIEW
LVL
-10
-20
MCH
-30
3DB
-40
-50
-60
-70
Center
2.44 GHz
Date: 15.JUN.2018
247.5 kHz/
17:28:21
Page:19 of 45
Span
2.475 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Ref
25 dBm
Offset
* Att
20 dB
* RBW
3 kHz
* VBW
10 kHz
-2.89 dBm
SWT
280 ms
2.480558187 GHz
Marker 1 [T1 ]
10.3 dB
20
1 PK
10
VIEW
LVL
-10
-20
HCH
-30
3DB
-40
-50
-60
-70
Center
2.48 GHz
Date: 15.JUN.2018
243.75 kHz/
17:34:39
Page:20 of 45
Span
2.4375 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.6 Band-edge for RF Conducted Emissions
Test Requirement:
47 CFR Part 15C Section 15.247 (d),
RSS 247 5.5
Test Method:
KDB558074 D01 v04
Test Setup:
Remark: Offset = cable loss + attenuation factor
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Limit:
In any 100 kHz bandwidth outside the frequency band in which the spread
spectrum intentional radiator is operating, the radio frequency power that is
produced by the intentional radiator shall be at least 20 dB below that in the
100 kHz bandwidth within the band that contains the highest level of the
desired power, based on either an RF conducted or a radiated
measurement.
Test Results:
Pass
Test Data:
O-QPSK Test mode
Test
channel
Frequency(MHz)
Emission Level(dBm)
Limit(dBm)
Result
Lowest
2400
-40.047
-10.58
Pass
Highest
2483.5
-36.211
-11.34
Pass
Page:21 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test plot as follows:
Graphs
Ref
25 dBm
Offset
* Att
20 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
Marker 4 [T1 ]
-51.23 dBm
15 ms
2.310000000 GHz
Marker 1 [T1 ]
10.4 dB
20
9.42 dBm
2.404640000 GHz
Marker 2 [T1 ]
10
1 PK
-41.28 dBm
VIEW
2.400000000 GHz
LVL
Marker 3 [T1 ]
-52.03 dBm
2.390000000 GHz
-10
D1 -10.58 dBm
-20
LCH
-30
3DB
-40
-50
-60
-70
Start
2.31 GHz
Date: 15.JUN.2018
Ref
14 MHz/
17:24:47
25 dBm
Offset
* Att
20 dB
Stop
* RBW
100 kHz
* VBW
300 kHz
SWT
2.45 GHz
Marker 4 [T1 ]
-36.21 dBm
10 ms
2.483690000 GHz
Marker 1 [T1 ]
10.3 dB
20
8.66 dBm
2.480470000 GHz
1 PK
1 Marker 2 [T1 ]
-37.23 dBm
10
VIEW
2.483500000 GHz
LVL
Marker 3 [T1 ]
-52.62 dBm
2.500000000 GHz
-10
D1 -11.34 dBm
-20
HCH
-30
3DB
24
-40
-50
-60
-70
Start
2.43 GHz
Date: 15.JUN.2018
7 MHz/
17:34:53
Page:22 of 45
Stop
2.5 GHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.7 RF Conducted Spurious Emissions
Test Requirement:
47 CFR Part 15C Section 15.247 (d),
RSS 247 5.5
Test Method:
KDB558074 D01 v04
Test Setup:
Test Mode:
Remark: Offset = cable loss + attenuation factor
Transmitting with O-QPSK at lowest, middle and highest channel.
Limit:
In any 100 kHz bandwidth outside the frequency band in which the spread
spectrum intentional radiator is operating, the radio frequency power that is
produced by the intentional radiator shall be at least 20 dB below that in the
100 kHz bandwidth within the band that contains the highest level of the
desired power, based on either an RF conducted or a radiated
measurement.
Test Results:
Pass
Page:23 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test plot as follows:
LCH_Graphs
Ref
25 dBm
Offset
* Att
20 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
15 ms
Marker 1 [T1 ]
9.69 dBm
2.404640000 GHz
10.4 dB
20
1 PK
10
VIEW
LVL
D1 -10.31 dBm
-10
-20
Pref/LCH
-30
3DB
-40
-50
-60
-70
Center
2.405 GHz
Date: 15.JUN.2018
Ref
30
4 MHz/
17:25:01
30 dBm
Offset
* Att
30 dB
Span
* RBW
100 kHz
* VBW
300 kHz
SWT
1.1 s
40 MHz
Marker 2 [T1 ]
-42.82 dBm
3.163306250 GHz
Marker 1 [T1 ]
10.4 dB
7.68 dBm
2.405005000 GHz
20
1 PK
VIEW
10
LVL
-10
D1 -10.31 dBm
-20
Puw/LCH
3DB
-30
-40
-50
-60
-70
Start
30 MHz
Date: 15.JUN.2018
1.097 GHz/
17:25:13
Page:24 of 45
Stop
11 GHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Ref
30
30 dBm
Offset
* Att
* RBW
100 kHz
* VBW
300 kHz
30 dB
SWT
1.5 s
Marker 1 [T1 ]
-41.22 dBm
25.619375000 GHz
10.4 dB
20
1 PK
VIEW
10
LVL
D1 -10.31 dBm
-10
-20
3DB
-30
-40
-50
-60
-70
Start
11 GHz
Date: 15.JUN.2018
1.5 GHz/
Stop
26 GHz
17:25:24
MCH_Graphs
Ref
25 dBm
Offset
* Att
* RBW
100 kHz
* VBW
300 kHz
20 dB
SWT
15 ms
Marker 1 [T1 ]
8.97 dBm
2.440640000 GHz
10.3 dB
20
1 PK
10
VIEW
LVL
-10
D1 -11.03 dBm
-20
Pref/MCH
-30
3DB
-40
-50
-60
-70
Center
2.44 GHz
Date: 15.JUN.2018
4 MHz/
17:28:35
Page:25 of 45
Span
40 MHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Ref
30
30 dBm
Offset
* Att
30 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
1.1 s
Marker 2 [T1 ]
-42.82 dBm
8.930783750 GHz
Marker 1 [T1 ]
10.3 dB
6.08 dBm
2.440657500 GHz
20
1 PK
VIEW
10
LVL
-10
D1 -11.03 dBm
-20
3DB
-30
-40
-50
-60
-70
Start
Puw/MCH
30 MHz
Date: 15.JUN.2018
Ref
30
1.097 GHz/
17:28:47
30 dBm
Offset
* Att
30 dB
Stop
* RBW
100 kHz
* VBW
300 kHz
SWT
1.5 s
11 GHz
Marker 1 [T1 ]
-41.51 dBm
25.881875000 GHz
10.3 dB
20
1 PK
VIEW
10
LVL
-10
D1 -11.03 dBm
-20
3DB
-30
-40
-50
-60
-70
Start
11 GHz
Date: 15.JUN.2018
1.5 GHz/
17:28:58
Page:26 of 45
Stop
26 GHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
HCH_Graphs
Ref
25 dBm
Offset
* Att
* RBW
100 kHz
* VBW
300 kHz
20 dB
SWT
15 ms
Marker 1 [T1 ]
8.97 dBm
2.480600000 GHz
10.3 dB
20
1 PK
10
VIEW
LVL
-10
D1 -11.03 dBm
-20
Pref/11B/HCH
-30
3DB
-40
-50
-60
-70
Center
2.48 GHz
Date: 15.JUN.2018
Ref
30
4 MHz/
17:35:08
30 dBm
Offset
* Att
30 dB
Span
* RBW
100 kHz
* VBW
300 kHz
SWT
1.1 s
40 MHz
Marker 2 [T1 ]
-42.58 dBm
10.138855000 GHz
Marker 1 [T1 ]
10.3 dB
6.79 dBm
2.479052500 GHz
20
1 PK
VIEW
10
LVL
-10
D1 -11.03 dBm
-20
Puw/11B/HCH
3DB
-30
-40
-50
-60
-70
Start
30 MHz
Date: 15.JUN.2018
1.097 GHz/
17:35:20
Page:27 of 45
Stop
11 GHz
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Ref
30
30 dBm
Offset
* Att
30 dB
* RBW
100 kHz
* VBW
300 kHz
SWT
1.5 s
Marker 1 [T1 ]
-41.42 dBm
25.407500000 GHz
10.3 dB
20
1 PK
VIEW
10
LVL
-10
D1 -11.03 dBm
-20
3DB
-30
-40
-50
-60
-70
Start
Remark:
11 GHz
Date: 15.JUN.2018
1.5 GHz/
Stop
26 GHz
17:35:30
Pretest 9kHz to 25GHz, find the highest point when testing, so only the worst data were shown in the test
report. Per FCC Part 15.33 (a) and 15.31 (o) ,The amplitude of spurious emissions from intentional radiators
which are attenuated more than 20 dB below the permissible value need not be reported unless specifically
required elsewhere in this part.
Page:28 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.8 Radiated Spurious Emissions
Test Requirement:
47 CFR Part 15C Section 15.209 and 15.205,
RSS-Gen Issue 5
Test Method:
ANSI C63.10 2013
Test Site:
Measurement Distance: 3m (Semi-Anechoic Chamber)
Receiver Setup:
Frequency
Detector
RBW
VBW
Remark
0.009MHz-0.090MHz
Peak
10kHz
30kHz
Peak
0.009MHz-0.090MHz
Average
10kHz
30kHz
Average
0.090MHz-0.110MHz
Quasi-peak
10kHz
30kHz
Quasi-peak
0.110MHz-0.490MHz
Peak
10kHz
30kHz
Peak
0.110MHz-0.490MHz
Average
10kHz
30kHz
Average
0.490MHz -30MHz
Quasi-peak
10kHz
30kHz
Quasi-peak
30MHz-1GHz
Quasi-peak
100 kHz
300kHz
Quasi-peak
Peak
1MHz
3MHz
Peak
Peak
1MHz
10Hz
Average
Above 1GHz
Limit:
Frequency
Field strength
Limit
(microvolt/meter) (dBuV/m)
Remark
Measurement
distance (m)
0.009MHz-0.490MHz
2400/F(kHz)
300
0.490MHz-1.705MHz
24000/F(kHz)
30
1.705MHz-30MHz
30
30
30MHz-88MHz
100
40.0
Quasi-peak
88MHz-216MHz
150
43.5
Quasi-peak
216MHz-960MHz
200
46.0
Quasi-peak
960MHz-1GHz
500
54.0
Quasi-peak
Above 1GHz
500
54.0
Average
Note: 15.35(b), Unless otherwise specified, the limit on peak radio frequency
emissions is 20dB above the maximum permitted average emission limit
applicable to the equipment under test. This peak limit applies to the total peak
emission level radiated by the device.
Page:29 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test Setup:
150cm
Figure 1. Below 30MHz
Figure 2. 30MHz to 1GHz
Figure 3. Above 1 GHz
a. 1) Below 1G: The EUT was placed on the top of a rotating table 0.8
Test Procedure:
meters above the ground at a 3 meter semi-anechoic camber. The table
was rotated 360 degrees to determine the position of the highest radiation.
2) Above 1G: The EUT was placed on the top of a rotating table 1.5
meters above the ground at a 3 meter semi-anechoic camber. The table
was rotated 360 degrees to determine the position of the highest radiation.
Note: For the radiated emission test above 1GHz:
Place the measurement antenna away from each area of the EUT
determined to be a source of emissions at the specified measurement
distance, while keeping the measurement antenna aimed at the source of
emissions at each frequency of significant emissions, with polarization
oriented for maximum response. The measurement antenna may have to
be higher or lower than the EUT, depending on the radiation pattern of the
emission and staying aimed at the emission source for receiving the
maximum signal. The final measurement antenna elevation shall be that
which maximizes the emissions. The measurement antenna elevation for
maximum emissions shall be restricted to a range of heights of from 1 m
to 4 m above the ground or reference ground plane.
b. The EUT was set 3 meters away from the interference-receiving antenna,
which was mounted on the top of a variable-height antenna tower.
c.
The antenna height is varied from one meter to four meters above the
ground to determine the maximum value of the field strength. Both
horizontal and vertical polarizations of the antenna are set to make the
measurement.
d. For each suspected emission, the EUT was arranged to its worst case
and then the antenna was tuned to heights from 1 meter to 4 meters(for
Page:30 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
the test frequency of below 30MHz, the antenna was tuned to heights 1
meter) and the rotatable table was turned from 0 degrees to 360 degrees
to find the maximum reading.
e. The test-receiver system was set to Peak Detect Function and Specified
Bandwidth with Maximum Hold Mode.
f.
If the emission level of the EUT in peak mode was 10dB lower than the
limit specified, then testing could be stopped and the peak values of the
EUT would be reported. Otherwise the emissions that did not have 10dB
margin would be re-tested one by one using peak, quasi-peak or average
method as specified and then reported in a data sheet.
g. Test the EUT in the lowest channel ,the middle channel ,the Highest
channel
h. Repeat above procedures until all frequencies measured was complete.
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Final Test Mode:
For below 1GHz, through Pre-scan, find at middle channel is the worst case.
Only the worst case is recorded in the report.
Test Results:
Pass
Page:31 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.8.1 Radiated emission below 1GHz
30MHz~1GHz_the worst case(Middle)
Test mode:
Transmitting
Vertical
Page:32 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Horizontal
Page:33 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.8.2 Transmitter emission above 1GHz
Test mode:
Transmitting
Test channel:
Page:34 of 45
Lowest
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Page:35 of 45
Lowest
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Page:36 of 45
Middle
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Page:37 of 45
Middle
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Page:38 of 45
Highest
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Highest
Remark:
2) The field strength is calculated by adding the Antenna Factor, Cable Factor & Preamplifier. The basic
equation with a sample calculation is as follows:
Final Test Level =Receiver Reading + Antenna Factor + Cable Factor – Preamplifier Factor
3) Scan from 9kHz to 25GHz,The disturbance above 13GHz and below 30MHz was very low, and the above
harmonics were the highest point could be found when testing, so only the above harmonics had been
displayed. The amplitude of spurious emissions from the radiator which are attenuated more than 20dB
below the limit need not be reported.
Page:39 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
6.9 Restricted bands around fundamental frequency
Test Requirement:
47 CFR Part 15C Section 15.209 and 15.205,
RSS-Gen Issue 5
Test Method:
ANSI C63.10 2013
Test Site:
Measurement Distance: 3m (Semi-Anechoic Chamber)
Limit:
Frequency
Limit (dBuV/m @3m)
Remark
30MHz-88MHz
40.0
Quasi-peak Value
88MHz-216MHz
43.5
Quasi-peak Value
216MHz-960MHz
46.0
Quasi-peak Value
960MHz-1GHz
54.0
Quasi-peak Value
54.0
Average Value
74.0
Peak Value
Above 1GHz
150cm
Test Setup:
Figure 1. 30MHz to 1GHz
Figure 2. Above 1 GHz
a.
1)
Below
1G:
The
EUT
was
placed
on the top of a rotating table 0.8 meters
Test Procedure:
above the ground at a 3 meter semi-anechoic camber. The table was
rotated 360 degrees to determine the position of the highest radiation.
2) Above 1G: The EUT was placed on the top of a rotating table 1.5
meters above the ground at a 3 meter semi-anechoic camber. The table
was rotated 360 degrees to determine the position of the highest radiation.
Note: For the radiated emission test above 1GHz:
Place the measurement antenna away from each area of the EUT
determined to be a source of emissions at the specified measurement
distance, while keeping the measurement antenna aimed at the source of
emissions at each frequency of significant emissions, with polarization
oriented for maximum response. The measurement antenna may have to
be higher or lower than the EUT, depending on the radiation pattern of the
emission and staying aimed at the emission source for receiving the
maximum signal. The final measurement antenna elevation shall be that
which maximizes the emissions. The measurement antenna elevation for
maximum emissions shall be restricted to a range of heights of from 1 m
to 4 m above the ground or reference ground plane.
b. The EUT was set 3 meters away from the interference-receiving antenna,
which was mounted on the top of a variable-height antenna tower.
c.
The antenna height is varied from one meter to four meters above the
ground to determine the maximum value of the field strength. Both
horizontal and vertical polarizations of the antenna are set to make the
Page:40 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
measurement.
d. For each suspected emission, the EUT was arranged to its worst case and
then the antenna was tuned to heights from 1 meter to 4 meters and the
rotatable table was turned from 0 degrees to 360 degrees to find the
maximum reading.
e. The test-receiver system was set to Peak Detect Function and Specified
Bandwidth with Maximum Hold Mode.
f.
Place a marker at the end of the restricted band closest to the transmit
frequency to show compliance. Also measure any emissions in the
restricted bands. Save the spectrum analyzer plot. Repeat for each power
and modulation for lowest and highest channel
g. Test the EUT in the lowest channel , the Highest channel
h. Repeat above procedures until all frequencies measured was complete.
Test Mode:
Transmitting with O-QPSK at lowest, middle and highest channel.
Test Results:
Pass
Page:41 of 45
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test data:
Test mode:
Transmitting
Test channel:
Page:42 of 45
Lowest
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Page:43 of 45
Lowest
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Page:44 of 45
Highest
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQSZ20180500204EW-01
Test mode:
Transmitting
Test channel:
Highest
Note:
The field strength is calculated by adding the Antenna Factor, Cable Factor & Preamplifier. The basic
equation with a sample calculation is as follows:
Final Test Level =Receiver Reading + Antenna Factor + Cable Factor – Preamplifier Factor
THE END
Page:45 of 45
Download: IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Mirror Download [FCC.gov]IL02 Security Keypad Test Report HD 271 S1 Hangzhou Great Star Industrial Co., Ltd.
Document ID3919834
Application IDmqdBPru2s471ADIGNRLxuQ==
Document DescriptionTest Report_DTS
Short Term ConfidentialNo
Permanent ConfidentialNo
SupercedeNo
Document TypeTest Report
Display FormatAdobe Acrobat PDF - pdf
Filesize138.65kB (1733169 bits)
Date Submitted2018-07-11 00:00:00
Date Available2018-07-12 00:00:00
Creation Date2018-07-04 15:30:07
Producing SoftwareMicrosoft® Office Word 2007
Document Lastmod2018-07-04 15:38:14
Document TitleHD 271 S1
Document CreatorMicrosoft® Office Word 2007
Document Author: LAB02

Source Exif Data:
File Type                       : PDF
File Type Extension             : pdf
MIME Type                       : application/pdf
PDF Version                     : 1.6
Linearized                      : No
Author                          : LAB02
Create Date                     : 2018:07:04 15:30:07+08:00
Modify Date                     : 2018:07:04 15:38:14+08:00
Language                        : zh-CN
Tagged PDF                      : Yes
XMP Toolkit                     : Adobe XMP Core 5.6-c015 81.157285, 2014/12/12-00:43:15
Format                          : application/pdf
Creator                         : LAB02
Title                           : HD 271 S1
Creator Tool                    : Microsoft® Office Word 2007
Metadata Date                   : 2018:07:04 15:38:14+08:00
Producer                        : Microsoft® Office Word 2007
Document ID                     : uuid:d5a17459-d658-4bd6-a94c-52eaa79769c9
Instance ID                     : uuid:534f0950-3ad8-46c3-a427-075eabffefcf
Page Count                      : 45
EXIF Metadata provided by EXIF.tools

Facebook Twitter Google+ RSS © FCCID.io 2018