AKRC161749-1 Multi-standard remote radio Test Report part 2 Ericsson AB

Ericsson AB Multi-standard remote radio

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Section 8
Test name
Specification
Testing data
FCC 22.913(a) Maximum ERP
FCC Part 22
Figure 8.2-43: CCDF, 256QAM, Port A, low channel, configuration 1
Figure 8.2-44: CCDF, 256QAM, Port B, low channel, configuration 1
Figure 8.2-45: CCDF, 256QAM, Port C, low channel, configuration 1
Figure 8.2-46: CCDF, 256QAM, Port D, low channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 45 of 127
Section 8
Test name
Specification
Testing data
FCC 22.913(a) Maximum ERP
FCC Part 22
Figure 8.2-47: CCDF, QPSK, Port A, low channel, configuration 2
Figure 8.2-48: CCDF, QPSK, Port D, low channel, configuration 2
Figure 8.2-49: CCDF, QPSK, Port A, mid channel, configuration 2
Figure 8.2-50: CCDF, QPSK, Port D, mid channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 46 of 127
Section 8
Test name
Specification
Testing data
FCC 22.913(a) Maximum ERP
FCC Part 22
Figure 8.2-51: CCDF, QPSK, Port A, high channel, configuration 2
Figure 8.2-52: CCDF, QPSK, Port D, high channel, configuration 2
Figure 8.2-53: CCDF, 16QAM, Port A, low channel, configuration 2
Figure 8.2-54: CCDF, 16QAM, Port D, low channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 47 of 127
Section 8
Test name
Specification
Testing data
FCC 22.913(a) Maximum ERP
FCC Part 22
Figure 8.2-55: CCDF, 64QAM, Port A, low channel, configuration 2
Figure 8.2-56: CCDF, 64QAM, Port D, low channel, configuration 2
Figure 8.2-57: CCDF, 256QAM, Port A, low channel, configuration 2
Figure 8.2-58: CCDF, 256QAM, Port D, low channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 48 of 127
Section 8
Test name
Specification
8.3
8.3.1
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
FCC 27.53 Spurious emissions at RF antenna connector
Definitions and limits
(c) For operations in the 746–758 MHz band and the 776–788 MHz band, the power of any emission outside the licensee's frequency band(s) of operation
shall be attenuated below the transmitter power (P) within the licensed band(s) of operation, measured in watts, in accordance with the following:
(1) On any frequency outside the 746–758 MHz band, the power of any emission shall be attenuated outside the band below the transmitter power (P) by
at least 43 + 10 log (P) dB;
(2) On any frequency outside the 776–788 MHz band, the power of any emission shall be attenuated outside the band below the transmitter power (P) by
at least 43 + 10 log (P) dB;
(3) On all frequencies between 763–775 MHz and 793–805 MHz, by a factor not less than 76 + 10 log (P) dB in a 6.25 kHz band segment, for base and fixed
stations;
(4) On all frequencies between 763–775 MHz and 793–805 MHz, by a factor not less than 65 + 10 log (P) dB in a 6.25 kHz band segment, for mobile and
portable stations;
(5) Compliance with the provisions of paragraphs (c)(1) and (c)(2) of this section is based on the use of measurement instrumentation employing a
resolution bandwidth of 100 kHz or greater. However, in the 100 kHz bands immediately outside and adjacent to the frequency block, a resolution
bandwidth of at least 30 kHz may be employed;
(6) Compliance with the provisions of paragraphs (c)(3) and (c)(4) of this section is based on the use of measurement instrumentation such that the
reading taken with any resolution bandwidth setting should be adjusted to indicate spectral energy in a 6.25 kHz segment.
8.3.2
Test summary
Test date
Test engineer
Verdict
8.3.3
January 5, 2018
Andrey Adelberg
Pass
Observations, settings and special notes
The spectrum was searched from 30 MHz to the 10 th harmonic.
All measurements were performed using a RMS detector.
For compensation of MIMO 4×4 application (configuration 1) limit lines were adjusted by 6 dB (10 × Log10(4))
For compensation of MIMO 2×2 application (configuration 2) limit lines were adjusted by 3 dB (10 × Log10(2))
RBW within 30–1000 MHz was 100 kHz and 1 MHz above 1 GHz. VBW was wider than RBW.
Configuration 1: Port A with 40 W power, Port B with 40 W power, Port C with 40 W power, Port D with 40 W power.
Configuration 2: Port A with 60 W power, Port D with 60 W power.
Report reference ID: 341574-2TRFWL-R1
Page 49 of 127
Section 8
Test name
Specification
8.3.4
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Test data
Figure 8.3-1: Conducted spurious emissions, low channel, Port A, QPSK,
configuration 1
Figure 8.3-2: Conducted spurious emissions, low channel, Port B, QPSK,
configuration 1
Figure 8.3-3: Conducted spurious emissions, low channel, Port C, QPSK,
configuration 1
Figure 8.3-4: Conducted spurious emissions, low channel, Port D, QPSK,
configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 50 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-5: Conducted spurious emissions, high channel, Port A, QPSK,
configuration 1
Figure 8.3-6: Conducted spurious emissions, high channel, Port B, QPSK,
configuration 1
Figure 8.3-7: Conducted spurious emissions, high channel, Port C, QPSK,
configuration 1
Figure 8.3-8: Conducted spurious emissions, high channel, Port D, QPSK,
configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 51 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-9: Conducted band edge emission at 746 MHz, Port A, low
channel, QPSK, configuration 1
Figure 8.3-10: Conducted band edge emission at 745.9 MHz, Port A, low
channel, QPSK, configuration 1
Figure 8.3-11: Conducted band edge emission at 746 MHz, Port B, low
channel, QPSK, configuration 1
Figure 8.3-12: Conducted band edge emission at 745.9 MHz, Port B, low
channel, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 52 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-13: Conducted band edge emission at 746 MHz, Port C, low
channel, QPSK, configuration 1
Figure 8.3-14: Conducted band edge emission at 745.9 MHz, Port C, low
channel, QPSK, configuration 1
Figure 8.3-15: Conducted band edge emission at 746 MHz, Port D, low
channel, QPSK, configuration 1
Figure 8.3-16: Conducted band edge emission at 745.9 MHz, Port D, low
channel, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 53 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-17: Conducted band edge emission at 756 MHz, Port A, high
channel, QPSK, configuration 1
Figure 8.3-18: Conducted band edge emission at 756.1 MHz, Port A, high
channel, QPSK, configuration 1
Figure 8.3-19: Conducted band edge emission at 756 MHz, Port B, high
channel, QPSK, configuration 1
Figure 8.3-20: Conducted band edge emission at 756.1 MHz, Port B, high
channel, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 54 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-21: Conducted band edge emission at 756 MHz, Port C, high
channel, QPSK, configuration 1
Figure 8.3-22: Conducted band edge emission at 756.1 MHz, Port C, high
channel, QPSK, configuration 1
Figure 8.3-23: Conducted band edge emission at 756 MHz, Port D, high
channel, QPSK, configuration 1
Figure 8.3-24: Conducted band edge emission at 756.1 MHz, Port D, high
channel, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 55 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-25: Conducted spurious emissions, two-channel operation, Port A,
QPSK, configuration 1
Figure 8.3-26: Conducted spurious emissions, two-channel operation, Port B,
QPSK, configuration 1
Figure 8.3-27: Conducted spurious emissions, two-channel operation, Port C,
QPSK, configuration 1
Figure 8.3-28: Conducted spurious emissions, two-channel operation, Port D,
QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 56 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-29: Conducted band edge emission at 746 MHz, Port A, twochannel operation, QPSK, configuration 1
Figure 8.3-30: Conducted band edge emission at 745.9 MHz, Port A, twochannel operation, QPSK, configuration 1
Figure 8.3-31: Conducted band edge emission at 746 MHz, Port B, twochannel operation, QPSK, configuration 1
Figure 8.3-32: Conducted band edge emission at 745.9 MHz, Port B, twochannel operation, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 57 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-33: Conducted band edge emission at 746 MHz, Port C, twochannel operation, QPSK, configuration 1
Figure 8.3-34: Conducted band edge emission at 745.9 MHz, Port C, twochannel operation, QPSK, configuration 1
Figure 8.3-35: Conducted band edge emission at 746 MHz, Port D, twochannel operation, QPSK, configuration 1
Figure 8.3-36: Conducted band edge emission at 745.9 MHz, Port D, twochannel operation, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 58 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-37: Conducted band edge emission at 756 MHz, Port A, twochannel operation, QPSK, configuration 1
Figure 8.3-38: Conducted band edge emission at 756.1 MHz, Port A, twochannel operation, QPSK, configuration 1
Figure 8.3-39: Conducted band edge emission at 756 MHz, Port B, twochannel operation, QPSK, configuration 1
Figure 8.3-40: Conducted band edge emission at 756.1 MHz, Port B, twochannel operation, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 59 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-41: Conducted band edge emission at 756 MHz, Port C, twochannel operation, QPSK, configuration 1
Figure 8.3-42: Conducted band edge emission at 756.1 MHz, Port C, twochannel operation, QPSK, configuration 1
Figure 8.3-43: Conducted band edge emission at 756 MHz, Port D, twochannel operation, QPSK, configuration 1
Figure 8.3-44: Conducted band edge emission at 756.1 MHz, Port D, twochannel operation, QPSK, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 60 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-45: Conducted spurious emission within 763–775 MHz,
Port A, QPSK, low channel, configuration 1
Figure 8.3-46: Conducted spurious emission within 763–775 MHz,
Port B, QPSK, low channel, configuration 1
Figure 8.3-47: Conducted spurious emission within 763–775 MHz,
Port C, QPSK, low channel, configuration 1
Figure 8.3-48: Conducted spurious emission within 763–775 MHz,
Port D, QPSK, low channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 61 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-49: Conducted spurious emission within 763–775 MHz,
Port A, QPSK, high channel, configuration 1
Figure 8.3-50: Conducted spurious emission within 763–775 MHz,
Port B, QPSK, high channel, configuration 1
Figure 8.3-51: Conducted spurious emission within 763–775 MHz,
Port C, QPSK, high channel, configuration 1
Figure 8.3-52: Conducted spurious emission within 763–775 MHz,
Port D, QPSK, high channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 62 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-53: Conducted spurious emission within 763–775 MHz,
Port A, QPSK, two-channel operation, configuration 1
Figure 8.3-54: Conducted spurious emission within 763–775 MHz,
Port B, QPSK, two-channel operation, configuration 1
Figure 8.3-55: Conducted spurious emission within 763–775 MHz,
Port C, QPSK, two-channel operation, configuration 1
Figure 8.3-56: Conducted spurious emission within 763–775 MHz,
Port D, QPSK, two-channel operation, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 63 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-57: Conducted spurious emission within 793–805 MHz,
Port A, QPSK, low channel, configuration 1
Figure 8.3-58: Conducted spurious emission within 793–805 MHz,
Port B, QPSK, low channel, configuration 1
Figure 8.3-59: Conducted spurious emission within 793–805 MHz,
Port C, QPSK, low channel, configuration 1
Figure 8.3-60: Conducted spurious emission within 793–805 MHz,
Port D, QPSK, low channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 64 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-61: Conducted spurious emission within 793–805 MHz,
Port A, QPSK, high channel, configuration 1
Figure 8.3-62: Conducted spurious emission within 793–805 MHz,
Port B, QPSK, high channel, configuration 1
Figure 8.3-63: Conducted spurious emission within 793–805 MHz,
Port C, QPSK, high channel, configuration 1
Figure 8.3-64: Conducted spurious emission within 793–805 MHz,
Port D, QPSK, high channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 65 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-65: Conducted spurious emission within 793–805 MHz,
Port A, QPSK, two-channel operation, configuration 1
Figure 8.3-66: Conducted spurious emission within 793–805 MHz,
Port B, QPSK, two-channel operation, configuration 1
Figure 8.3-67: Conducted spurious emission within 793–805 MHz,
Port C, QPSK, two-channel operation, configuration 1
Figure 8.3-68: Conducted spurious emission within 793–805 MHz,
Port D, QPSK, two-channel operation, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 66 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-69: Conducted spurious emissions at Port A, QPSK, low channel,
configuration 2
Figure 8.3-70: Conducted spurious emissions at Port D, QPSK, low channel,
configuration 2
Figure 8.3-71: Conducted spurious emissions at Port A, QPSK, high channel,
configuration 2
Figure 8.3-72: Conducted spurious emissions at Port D, QPSK, high channel,
configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 67 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-73: Conducted spurious emissions at Port A, QPSK, two-channel
operation, configuration 2
Figure 8.3-74: Conducted spurious emissions at Port D, QPSK, two-channel
operation, configuration 2
Figure 8.3-75: Conducted band edge emission at 746 MHz, Port A, QPSK, low
channel, configuration 2
Figure 8.3-76: Conducted band edge emission at 745.9 MHz, Port A, QPSK,
low channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 68 of 127
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Document ID3726028
Application ID5iC1ekgaTz6ntKPU6kKiXw==
Document Descriptiontest report part 2
Short Term ConfidentialNo
Permanent ConfidentialNo
SupercedeNo
Document TypeTest Report
Display FormatAdobe Acrobat PDF - pdf
Filesize500.46kB (6255758 bits)
Date Submitted2018-01-24 00:00:00
Date Available2018-01-24 00:00:00
Creation Date2018-01-24 09:51:35
Producing SoftwareMicrosoft® Word 2016
Document Lastmod2018-01-24 09:51:36
Document Titletest report part 2
Document CreatorMicrosoft® Word 2016
Document Author: Andrey Adelberg

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