AKRC161749-1 Multi-standard remote radio Test Report part 3 Ericsson AB

Ericsson AB Multi-standard remote radio

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Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-77: Conducted band edge emission at 746 MHz, Port D, QPSK, low
channel, configuration 2
Figure 8.3-78: Conducted band edge emission at 745.9 MHz, Port D, QPSK,
low channel, configuration 2
Figure 8.3-79: Conducted band edge emission at 746 MHz, Port A, QPSK,
two-channel operation, configuration 2
Figure 8.3-80: Conducted band edge emission at 745.9 MHz, Port A, QPSK,
two-channel operation, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 69 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-81: Conducted band edge emission at 746 MHz, Port D, QPSK,
two-channel operation, configuration 2
Figure 8.3-82: Conducted band edge emission at 745.9 MHz, Port D, QPSK,
two-channel operation, configuration 2
Figure 8.3-83: Conducted band edge emission at 756 MHz, Port A, QPSK,
high channel, configuration 2
Figure 8.3-84: Conducted band edge emission at 756.1 MHz, Port A, QPSK,
high channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 70 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-85: Conducted band edge emission at 756 MHz, Port D, QPSK,
high channel, configuration 2
Figure 8.3-86: Conducted band edge emission at 756.1 MHz, Port D, QPSK,
high channel, configuration 2
Figure 8.3-87: Conducted band edge emission at 756 MHz, Port A, QPSK,
two-channel operation, configuration 2
Figure 8.3-88: Conducted band edge emission at 756.1 MHz, Port A, QPSK,
two-channel operation, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 71 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-89: Conducted band edge emission at 756 MHz, Port D, QPSK,
two-channel operation, configuration 2
Figure 8.3-90: Conducted band edge emission at 756.1 MHz, Port D, QPSK,
two-channel operation, configuration 2
Figure 8.3-91: Conducted spurious emission within 763–775 MHz,
Port A, QPSK, low channel, configuration 2
Figure 8.3-92: Conducted spurious emission within 763–775 MHz,
Port D, QPSK, low channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 72 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-93: Conducted spurious emission within 763–775 MHz,
Port A, QPSK, high channel, configuration 2
Figure 8.3-94: Conducted spurious emission within 763–775 MHz,
Port D, QPSK, high channel, configuration 2
Figure 8.3-95: Conducted spurious emission within 763–775 MHz,
Port A, QPSK, two-channel operation, configuration 2
Figure 8.3-96: Conducted spurious emission within 763–775 MHz,
Port D, QPSK, two-channel operation, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 73 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-97: Conducted spurious emission within 793–805 MHz,
Port A, QPSK, low channel, configuration 2
Figure 8.3-98: Conducted spurious emission within 793–805 MHz,
Port D, QPSK, low channel, configuration 2
Figure 8.3-99: Conducted spurious emission within 793–805 MHz,
Port A, QPSK, high channel, configuration 2
Figure 8.3-100: Conducted spurious emission within 793–805 MHz,
Port D, QPSK, high channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 74 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-101: Conducted spurious emission within 793–805 MHz,
Port A, QPSK, two-channel operation, configuration 2
Report reference ID: 341574-2TRFWL-R1
Figure 8.3-102: Conducted spurious emission within 793–805 MHz,
Port D, QPSK, two-channel operation, configuration 2
Page 75 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-103: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 10 MHz low channel + B13 5 MHz low channel, configuration 1
Figure 8.3-104: Conducted spurious emissions, Port B, QPSK, multi-band
operation, B5 10 MHz low channel + B13 5 MHz low channel, configuration 1
Figure 8.3-105: Conducted spurious emissions, Port C, QPSK, multi-band
operation, B5 10 MHz low channel + B13 5 MHz low channel, configuration 1
Figure 8.3-106: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 10 MHz low channel + B13 5 MHz low channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 76 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-107: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 10 MHz high channel + B13 5 MHz high channel,
configuration 1
Figure 8.3-108: Conducted spurious emissions, Port B, QPSK, multi-band
operation, B5 10 MHz high channel + B13 5 MHz high channel,
configuration 1
Figure 8.3-109: Conducted spurious emissions, Port C, QPSK, multi-band
operation, B5 10 MHz high channel + B13 5 MHz high channel,
configuration 1
Figure 8.3-110: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 10 MHz high channel + B13 5 MHz high channel,
configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 77 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-111: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 2× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Figure 8.3-112: Conducted spurious emissions, Port B, QPSK, multi-band
operation, B5 2× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Figure 8.3-113: Conducted spurious emissions, Port C, QPSK, multi-band
operation, B5 2× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Figure 8.3-114: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 2× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 78 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-115: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 3× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Figure 8.3-116: Conducted spurious emissions, Port B, QPSK, multi-band
operation, B5 3× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Figure 8.3-117: Conducted spurious emissions, Port C, QPSK, multi-band
operation, B5 3× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Figure 8.3-118: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 3× 5 MHz channels + B13 2× 5 MHz channels,
configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 79 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-119: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 10 MHz low channel + B13 5 MHz low channel, configuration 2
Figure 8.3-120: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 10 MHz low channel + B13 5 MHz low channel, configuration 2
Figure 8.3-121: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 10 MHz high channel + B13 5 MHz high channel,
configuration 2
Figure 8.3-122: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 10 MHz high channel + B13 5 MHz high channel,
configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 80 of 127
Section 8
Test name
Specification
Testing data
Clause 27.53 Spurious emissions at RF antenna connector
FCC Part 27
Figure 8.3-123: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 2× 5 MHz channels + B13 2× 5 MHz channels,
configuration 2
Figure 8.3-124: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 2× 5 MHz channels + B13 2× 5 MHz channels,
configuration 2
Figure 8.3-125: Conducted spurious emissions, Port A, QPSK, multi-band
operation, B5 3× 5 MHz channels + B13 2× 5 MHz channels,
configuration 2
Figure 8.3-126: Conducted spurious emissions, Port D, QPSK, multi-band
operation, B5 3× 5 MHz channels + B13 2× 5 MHz channels,
configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 81 of 127
Section 8
Test name
Specification
8.4
8.4.1
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
FCC 22.917(a) Spurious emissions at RF antenna connector
Definitions and limits
(a) Out of band emissions. The power of any emission outside of the authorized operating frequency ranges must be attenuated below the transmitting
power (P) by a factor of at least 43 + 10 log(P) dB.
(b) Measurement procedure. Compliance with these rules is based on the use of measurement instrumentation employing a reference bandwidth as
follows:
(1) In the spectrum below 1 GHz, instrumentation should employ a reference bandwidth of 100 kHz or greater. In the 1 MHz bands immediately outside
and adjacent to the frequency block, a resolution bandwidth of at least one percent of the emission bandwidth of the fundamental emission of the
transmitter may be employed. A narrower resolution bandwidth is permitted in all cases to improve measurement accuracy, provided that the measured
power is integrated over the full required reference bandwidth (i.e., 100 kHz or 1 percent of emission bandwidth, as specified). The emission bandwidth is
defined as the width of the signal between two points, one below the carrier center frequency and one above the carrier center frequency, outside of
which all emissions are attenuated at least 26 dB below the transmitter power.
(2) In the spectrum above 1 GHz, instrumentation should employ a reference bandwidth of 1 MHz.
(c) Alternative out of band emission limit. Licensees in this service may establish an alternative out of band emission limit to be used at specified band
edge(s) in specified geographical areas, in lieu of that set forth in this section, pursuant to a private contractual arrangement of all affected licensees and
applicants. In this event, each party to such contract shall maintain a copy of the contract in their station files and disclose it to prospective assignees or
transferees and, upon request, to the FCC.
8.4.2
Test summary
Test date
Test engineer
Verdict
8.4.3
January 5, 2018
Andrey Adelberg
Pass
Observations, settings and special notes
The spectrum was searched from 30 MHz to the 10 th harmonic.
All measurements were performed using a RMS detector.
For compensation of MIMO 4×4 application (configuration 1) limit lines were adjusted by 6 dB (10 × Log 10(4))
For compensation of MIMO 2×2 application (configuration 2) limit lines were adjusted by 3 dB (10 × Log 10(2))
RBW within 30–1000 MHz was 100 kHz and 1 MHz above 1 GHz. VBW was wider than RBW.
Configuration 1: Port A with 40 W power, Port B with 40 W power, Port C with 40 W power, Port D with 40 W power.
Configuration 2: Port A with 60 W power, Port D with 60 W power.
Report reference ID: 341574-2TRFWL-R1
Page 82 of 127
Section 8
Test name
Specification
8.4.4
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Test data
Figure 8.4-1: Conducted spurious emissions within at Port A, QPSK, low
channel, configuration 1
Figure 8.4-2: Conducted spurious emissions within at Port B, QPSK, low
channel, configuration 1
Figure 8.4-3: Conducted spurious emissions within at Port C, QPSK, low
channel, configuration 1
Figure 8.4-4: Conducted spurious emissions within at Port D, QPSK, low
channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 83 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-5: Conducted spurious emissions within at Port A, QPSK, mid
channel, configuration 1
Figure 8.4-6: Conducted spurious emissions within at Port B, QPSK, mid
channel, configuration 1
Figure 8.4-7: Conducted spurious emissions within at Port C, QPSK, mid
channel, configuration 1
Figure 8.4-8: Conducted spurious emissions within at Port D, QPSK, mid
channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 84 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-9: Conducted spurious emissions within at Port A, QPSK, high
channel, configuration 1
Figure 8.4-10: Conducted spurious emissions within at Port B, QPSK, high
channel, configuration 1
Figure 8.4-11: Conducted spurious emissions within at Port C, QPSK, high
channel, configuration 1
Figure 8.4-12: Conducted spurious emissions within at Port D, QPSK, high
channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 85 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-13: Conducted spurious emissions within at Port A, QPSK, twochannel operation, configuration 1
Figure 8.4-14: Conducted spurious emissions within at Port B, QPSK, twochannel operation, configuration 1
Figure 8.4-15: Conducted spurious emissions within at Port C, QPSK, twochannel operation, configuration 1
Figure 8.4-16: Conducted spurious emissions within at Port D, QPSK, twochannel operation, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 86 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-17: Conducted spurious emissions within at Port A, QPSK, threechannel operation, configuration 1
Figure 8.4-18: Conducted spurious emissions within at Port B, QPSK, threechannel operation, configuration 1
Figure 8.4-19: Conducted spurious emissions within at Port C, QPSK, threechannel operation, configuration 1
Figure 8.4-20: Conducted spurious emissions within at Port D, QPSK, threechannel operation, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 87 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-21: Conducted band edge emission at 869 MHz, Port A, QPSK, low
channel, configuration 1
Figure 8.4-22: Conducted band edge emission at 869 MHz, Port B, QPSK, low
channel, configuration 1
Figure 8.4-23: Conducted band edge emission at 869 MHz, Port C, QPSK, low
channel, configuration 1
Figure 8.4-24: Conducted band edge emission at 869 MHz, Port D, QPSK, low
channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 88 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-25: Conducted band edge emission at 869 MHz, Port A, QPSK,
two-channel operation, configuration 1
Figure 8.4-26: Conducted band edge emission at 869 MHz, Port B, QPSK,
two-channel operation, configuration 1
Figure 8.4-27: Conducted band edge emission at 869 MHz, Port C, QPSK,
two-channel operation, configuration 1
Figure 8.4-28: Conducted band edge emission at 869 MHz, Port D, QPSK,
two-channel operation configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 89 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-29: Conducted band edge emission at 894 MHz, Port A, QPSK,
high channel, configuration 1
Figure 8.4-30: Conducted band edge emission at 894 MHz, Port B, QPSK,
high channel, configuration 1
Figure 8.4-31: Conducted band edge emission at 894 MHz, Port C, QPSK,
high channel, configuration 1
Figure 8.4-32: Conducted band edge emission at 894 MHz, Port D, QPSK,
high channel, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 90 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-33: Conducted band edge emission at 894 MHz, Port A, QPSK,
two-channel operation, configuration 1
Figure 8.4-34: Conducted band edge emission at 894 MHz, Port B, QPSK,
two-channel operation, configuration 1
Figure 8.4-35: Conducted band edge emission at 894 MHz, Port C, QPSK,
two-channel operation, configuration 1
Figure 8.4-36: Conducted band edge emission at 894 MHz, Port D, QPSK,
two-channel operation, configuration 1
Report reference ID: 341574-2TRFWL-R1
Page 91 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-37: Conducted spurious emissions within at Port A, QPSK, low
channel, configuration 2
Figure 8.4-38: Conducted spurious emissions within at Port D, QPSK, low
channel, configuration 2
Figure 8.4-39: Conducted spurious emissions within at Port A, QPSK, mid
channel, configuration 2
Figure 8.4-40: Conducted spurious emissions within at Port D, QPSK, mid
channel, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 92 of 127
Section 8
Test name
Specification
Testing data
Clause 22.917(a) Spurious emissions at RF antenna connector
FCC Part 22
Figure 8.4-41: Conducted spurious emissions within at Port A, QPSK, high
channel, configuration 2
Figure 8.4-42: Conducted spurious emissions within at Port D, QPSK, high
channel, configuration 2
Figure 8.4-43: Conducted spurious emissions within at Port A, QPSK, twochannel operation, configuration 2
Figure 8.4-44: Conducted spurious emissions within at Port D, QPSK, twochannel operation, configuration 2
Report reference ID: 341574-2TRFWL-R1
Page 93 of 127
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Date Submitted2018-01-24 00:00:00
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Creation Date2018-01-24 09:51:37
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Document Titletest report part 3
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Document Author: Andrey Adelberg

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