Test report 1 — FRDM-MCXW71; FRDM-MCXW71

217-252103_02_002.pdf · Giteki 217-252103

NXP Semiconductors N.V.

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Document details

Giteki certificate	217-252103
Document	217-252103_02_002.pdf
Document type	Test report 1
Applicant	NXP Semiconductors N.V.
Model / equipment	FRDM-MCXW71; FRDM-MCXW71
Certification date	2025-03-18
Certifying organization	IIA Lab Services, LLC

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