Test report 1 — FRDM-MCXW72

217-263129_02_003.pdf · Giteki 217-263129

NXP Semiconductors N.V.

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Giteki certificate217-263129
Document217-263129_02_003.pdf
Document typeTest report 1
ApplicantNXP Semiconductors N.V.
Model / equipmentFRDM-MCXW72
Certification date2026-05-12
Certifying organizationIIA Lab Services, LLC
Pages43

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