Q Compact — Test report 1

219-258075_02_001.pdf · Giteki 219-258075

Shenzhen Neewer Technology Co., Ltd

This test report 1 is listed by MIC under Giteki 219-258075 for Q Compact. Original filename: 219-258075_02_001.pdf.

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Document details

Giteki certificate219-258075
Document219-258075_02_001.pdf
Document typeTest report 1
ApplicantShenzhen Neewer Technology Co., Ltd
Model / equipmentQ Compact
Certification date2025-04-11
Certifying organizationKL-Certification GmbH

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